Dear all,
I am currently trying to perform a simple refinement of Corundum in the
hexagonal setting, namely the unit cell parameters (a=b=4.7589 A, c=12.991
A, alpha=beta=90 deg., gamma=120 deg): Refining the cell parameters a and c
works without problems, and putting limits to the refinement o
Dear Rietvelders,
Maybe this is not the right place to put this question. Please excuse me if
so.
I am using an old TUR-M 62 generator and recently I lost my last X-tube.
Does anybody have an idea where can I find some old standard fine focus Cu
tube, for this device. These tubes were manufactured
http://sites.google.com/site/solovyovleonid
***
From: Angel Luis Ortiz Seco
To: rietveld_l@ill.fr
Sent: Thursday, October 2, 2014 4:42 PM
Subject: question on stacking faults
Dear colleages,
I would like to calculate the stacking
Dear colleages,
I would like to calculate the stacking fault probability in an O3 structure (a
layered compound of the type ABO2 (A=alkali element, B=transition metal
element, O=oxygen) crystallizing in the trigonal R-3m space group (hexagonal
axes)) from the broadening of the XRD peaks. I have
On 13/08/2013 12:53, Maxim V. Lobanov (MSU) wrote:
Dear colleagues,
I apologize for a basic question.
Could anybody advice a freeware which would convert Cartesian
coordinates (ideally, from a simple xyz list) into crystal ones, using
user-supplied lattice basis vectors?
Itis
Dear colleagues,
I apologize for a basic question.
Could anybody advice a freeware which would convert Cartesian
coordinates (ideally, from a simple xyz list) into crystal ones, using
user-supplied lattice basis vectors?
Itisclearthat formulae are simple and available
question I have related to preferred
orientation?
I have collected some spectra of a sample, on a D4 using flat plate
geometry, that I suspect is showing preferred orientation effects. I was
under the impression that a way of testing for this is to re-pack the
sample, re-run and compare the spectra
Dear All,
Could anybody help me with a question I have related to preferred
orientation?
I have collected some spectra of a sample, on a D4 using flat plate
geometry, that I suspect is showing preferred orientation effects. I was
under the impression that a way of testing for this is to re-pack
Hi all,
I just remembered the answer: if you use an instrument resolution file
then the program automatically generates the desired output.
Sorry for taking up space in your mailbox with the original question -
should have gone for a swim earlier...
Alex Y
Hi everyone,
Does anyone remember offhand how to turn on the output that includes
calculated "particle size" when refining with a symmetry specific size
model in Fullprof? I haven't looked at the program in a few years and
am afraid I can't quite remember...
Alex Y
_
Dear GSAS users,
I have recently changed operating system from Windows XP to Windows
Vista and have hit a slight annoyance. I used to be able to drag and
drop files into the GSAS command window, which would write the full path
of the file, useful for data files and instrument parameter files.
that there has to be some anisotropy in
crystallite sizes, right? The uppermost image in the pdf depicts the
isotropic situation. The middle one is refined with Popa anisotropic
rules and the result is slighly better. However, the best fit is
achieved with some exponential harmonics describing sligh
tension or use the
'xye_format' switch to indicate XYE format, for example:
xdd FILE xye_format
cheers
alan
-Original Message-
From: [EMAIL PROTECTED] [mailto:[EMAIL PROTECTED]
Sent: Thursday, 11 December 2008 1:53 AM
To: Rietveld_l@ill.fr
Subject: [Fwd: Question on
--
I have a question for the list...
I have some ToF data from GEM ISIS as both a .gss and a .asc file. I have
managed to import and refine this using GSAS but am having some
difficulties importing into TOPAS. Does anyone have some advice please on
maybe file exchange or getting this file
wrote:
I have a question for the list...
I have some ToF data from GEM ISIS as both a .gss and a .asc file.
I have managed to import and refine this using GSAS but am having
some difficulties importing into TOPAS. Does anyone have some
advice please on maybe file exchange or getting this
I have a question for the list...
I have some ToF data from GEM ISIS as both a .gss and a .asc file. I have
managed to import and refine this using GSAS but am having some difficulties
importing into TOPAS. Does anyone have some advice please on maybe file
exchange or getting this file into
Hi All,
I was wondering if there are any prohibited values which can be obtained by
refining a profile type in GSAS. i.e. any values which are unrealistic for
L11 L12 etc?
Kind regartds
Stu
Dr. Stuart Miller
Wright Research Group
School of Chemistry
Puride Building
University o
Dear Maxim,
Actually, there are no standard notations for these parameters of TCH pV. In
different programs they are designated differently.
Regards,
Leonid
--- On Thu, 11/13/08, Maxim V. Lobanov <[EMAIL PROTECTED]> wrote:
> From: Maxim V. Lobanov <[EMAIL PROTECTED]>
> Sub
Dear Leonid,
thank you very much. Indeed it is not "really simple": averaging procedure is
not straightforward...
Now a question to Fullprof users:
it seems that Fullprof is using non-standard designation for TCH PV parameters.
I mean by standard the one which is adopted e.g. in D.Ba
described in Page 12 of the DDMguide.
Note, however, that these estimations are valid only for simple crystal size
distributions.
Best regards,
Leonid
--- On Thu, 11/13/08, Maxim V. Lobanov <[EMAIL PROTECTED]> wrote:
> From: Maxim V. Lobanov <[EMAIL PROTECTED]>
> Subject: RE
Dear colleagues,
I would like first to thank everybody who responded to my question on
Gaussian size broadening.
And now would like to ask another closely related (but "more practical")
question:
I think the easiest way to do particle size estimate in case when one has
mixed alpha1/a
- Original Message -
From: "Leonid Solovyov" <[EMAIL PROTECTED]>
To:
Sent: Tuesday, October 21, 2008 3:23 PM
Subject: Re: question on size-strain analysis
Hi Nicolae,
Nice to hear from you!
I couldn't help noting that in reality your emergence in the Rietveld list
is si
ROTECTED]> wrote:
> From: Nicolae Popa <[EMAIL PROTECTED]>
> Subject: Re: question on size-strain analysis
> To: [EMAIL PROTECTED], rietveld_l@ill.fr
> Date: Tuesday, October 21, 2008, 11:39 AM
> Hi,
>
> Besides strain and instrument also size broadening can be
> close
citation) and other ref. cited there (Langford, Louer, Scardi (2000))
Best,
Nicolae Popa
- Original Message -
From: "Maxim V. Lobanov" <[EMAIL PROTECTED]>
To:
Cc: "Дмитрий А. Павлов" <[EMAIL PROTECTED]>
Sent: Tuesday, October 21, 2008 9:20 AM
(self
citation) and other ref. cited there (Langford, Louer, Scardi (2000))
Best,
Nicolae Popa
- Original Message -
From: "Leonid Solovyov" <[EMAIL PROTECTED]>
To:
Sent: Tuesday, October 21, 2008 10:04 AM
Subject: Re: question on size-strain analysis
Dear Maxim,
Gau
, Krasnoyarsk Russia
Phone: +7 3912 495663
Fax:+7 3912 238658
www.icct.ru/eng/content/persons/Sol_LA
***
--- On Tue, 10/21/08, Maxim V. Lobanov <[EMAIL PROTECTED]> wrote:
> From: Maxim V. Lobanov <[EMAIL PROTECTED]>
> Subject
Dear colleagues,
I have a probably very basic question related to size-strain analysis:
we have a pattern of a nanocrystalline oxide, which shows (from
Williamson-Hall plot) almost purely size broadening, and shape of
reflections is to good accuracy Gaussian.
I am curious what type of
Dear Lee,
Your calculations are correct provided the allowances for microabsorption and
other effects were made properly.
Regards,
Leonid
--- On Tue, 10/14/08, Lee Gerrard <[EMAIL PROTECTED]> wrote:
> From: Lee Gerrard <[EMAIL PROTECTED]>
> Subject: Question on QPA - Amorpho
-augsburg.de/exp5
- Original Message -
From: "Lee Gerrard" <[EMAIL PROTECTED]>
To:
Sent: Tuesday, October 14, 2008 2:20 PM
Subject: Question on QPA - Amorphous/crystalline mix
>I have a question for the list as I know there are a number of people
> working on QPA.
rd [mailto:[EMAIL PROTECTED]
Sent: Tuesday, October 14, 2008 8:21 AM
To: rietveld_l@ill.fr
Subject: Question on QPA - Amorphous/crystalline mix
I have a question for the list as I know there are a number of people
working on QPA. Ok the question is as follows:-
We have a mixture of a number of c
I have a question for the list as I know there are a number of people
working on QPA. Ok the question is as follows:-
We have a mixture of a number of crystalline phases (A and B) and an
amorphous (glassy) phase. We can do Rietveld refinement on this and get
weight percentage (wt.%) values for
ore like symbols) mean
anything? Or is something corrupted or not set correctly on my installation?
Thanks for your help on my last question by the way --- I greatly appreciate
this forum!
Kindest regards,
Blaise
* * * * * * * * * * * * *
Blaise Mibeck
Research Scientist
Energy
Thanks!!!
-Original Message-
From: Davide Levy [mailto:[EMAIL PROTECTED]
Sent: Tuesday, September 09, 2008 12:51 PM
To: Mibeck, Blaise
Subject: R: Question about Genles...
Dear Blaise,
that means that your parameters are not appropriate (generally too big) for
format
question by the way --- I greatly appreciate
this forum!
Kindest regards,
Blaise
* * * * * * * * * * * * *
Blaise Mibeck
Research Scientist
Energy & Environmental Research Center
University of North Dakota
15 North 23rd Street, Stop 9018
Grand Forks, ND 58202-
riginal Message-
From: Peter Y. Zavalij [mailto:[EMAIL PROTECTED]
Sent: Thursday, April 10, 2008 1:33 AM
To: rietveld_l@ill.fr
Subject: RIETICA question
Does anyone know how to tell Rietica to account for background (from sample
holder, film, etc.) stored in separate file?
Rietica can do it but t
Does anyone know how to tell Rietica to account for background (from sample
holder, film, etc.) stored in separate file?
Rietica can do it but there is no much about how to set it up in the manual.
Thanks,
Peter Zavalij
Dear All,
Thanks for your helpful suggestion.
Best regards,
Wenduo
--
>
> Wenduo Zhou
> Department of Physics and Astronomy
> 4251 Biomed. Phys. Science Building
> Michigan State University
> Phone: (517)355-9200 ext 2344
> Fax: (517)353-4500
Dear All,
I have a question about how to refine the multiple phases model with
FullProf. According to the manual, the phase weight fraction is calculated
from scale factor, unit cell and etc. It seems to me that the most
important parameters affecting the phase wight fraction are the scaler
On jeudi 3 avril 2008, May, Frank wrote:
> The mathematical description of "crystals" is valid for the bulk of the
> volume. However, the description suffers from a physical "termination of
> series" effect at the surface of the crystal. For very large crystals, the
> amount of surface is much gr
Louis
One University Boulevard
St. Louis, Missouri 63121-4499
U.S.A
314-516-5098 - office
314-623-4524 - cell
From: Larry Finger [mailto:[EMAIL PROTECTED]
Sent: Wed 4/2/2008 9:47 AM
To: Jae-Ho Chung
Cc: Rietveld_L@ill.fr
Subject: Re: Question on Rietveld with x
Jae-Ho Chung wrote:
Dear experts on Rietveld with x-ray,
When it comes to Rietveld, I have exclusively been working with
neutrons. Now I am just trying Rietveld with x-rays, and immediately
came up with a question. Since x-ray scatters from electrons, it seems
to me that we always have to
Dear experts on Rietveld with x-ray,
When it comes to Rietveld, I have exclusively been working with neutrons.
Now I am just trying Rietveld with x-rays, and immediately came up with a
question. Since x-ray scatters from electrons, it seems to me that we always
have to use, for instance, O-2
Hi Brian,
As you are a Mac user - there is a program called LaTeXiT which allows you to
simply write out equations in Latex and then you can drag and drop the output
into a program such as powerpoint. There will be no need to play around with
fonts.
http://ktd.club.fr/programmation/latexit_en.ph
On Jan 14, 2008, at 4:36 AM, Holger Kohlmann wrote:
try the font Arial Overlined, but make sure to install it on any
computer you use. I once gave a talk with the title "1 bar",
written in Arial Overlined. Of course, the computer in the lecture
hall did not have that font, which turned the
Brian,
try the font Arial Overlined, but make sure to install it on any
computer you use. I once gave a talk with the title "1 bar", written
in Arial Overlined. Of course, the computer in the lecture hall did
not have that font, which turned the title into "1". Not very clever,
if you wan
touche- there is a font.
-Jennifer
Adrian Hill wrote:
I use a free crystallography font from Len Barbour
http://www.x-seed.net/freestuff.html
Adrian Hill
doebbler wrote:
I still maintain ditching the evil empire for latex is the best ;-),
but in all seriousness equation editor is the only
: Brian H. Toby [mailto:[EMAIL PROTECTED]
Sent: Friday, January 11, 2008 12:54 PM
To: rietveld_l@ill.fr
Subject: Crystallography/MS Word Question: 3 bar
I have heard that there are several ways to create a 3 with an over- bar
symbol (as would be used for space group R -3 c, for example) in Micro$oft
Wor
Brian
Goto http://www.x-seed.net/freestuff.html
and download Len Barbour's free crystallographic font, which includes 3 bar.
Joe
Brian H. Toby wrote:
I have heard that there are several ways to create a 3 with an
over-bar symbol (as would be used for space group R -3 c, for example)
in M
Hi Brian,
try Insert -> Field
EQ \s \up 6 (\f (,3))
Using Alt-F9 you can toggle between field view and "source code" for
modifications (e.g. when you use something else than 12 point font
size and need to change the parameter for \up). I then select the
resulting 3bar symbol and use Tools ->
I use a free crystallography font from Len Barbour
http://www.x-seed.net/freestuff.html
Adrian Hill
doebbler wrote:
I still maintain ditching the evil empire for latex is the best ;-),
but in all seriousness equation editor is the only way to go. See:
http://helpdesk.princeton.edu/kb/displa
I still maintain ditching the evil empire for latex is the best ;-), but
in all seriousness equation editor is the only way to go. See:
http://helpdesk.princeton.edu/kb/display.plx?id=4558
-Jennifer
Brian H. Toby wrote:
I have heard that there are several ways to create a 3 with an
over-bar s
I have heard that there are several ways to create a 3 with an over-
bar symbol (as would be used for space group R -3 c, for example) in
Micro$oft Word, but none are convenient. I know how to do this with
the equation editor. Can anyone contribute any better choices?
Brian
Choice of space group origin will affect the computation of
intensities but not which reflections are included in the pattern,
so that is not the problem. The fact that the 222 reflection shows
up in reflist makes it seem likely to me that you do not have the
space group input correctly.
Choice of space group origin will affect the computation of
intensities but not which reflections are included in the pattern, so
that is not the problem. The fact that the 222 reflection shows up in
reflist makes it seem likely to me that you do not have the space
group input correctly.
H
On Dec 16, 2007, at 11:20 AM, David Lee wrote:
I'm trying to fit an experimental Si pattern to refine the zero
offset for out instrument. The
calculated spectrum has 2 extra lines, and three missing lines.
I've hand calculated the
expected location of lines in the experimental spectrum an
Hi,
> I'm trying to fit an experimental Si pattern to refine the zero offset for
> out instrument. The calculated spectrum has 2 extra lines, and three
> missing lines. I've hand calculated the expected location of lines in the
> experimental spectrum and account for all of the lines,
Hi All,
I'm trying to fit an experimental Si pattern to refine the zero
offset for out instrument. The
calculated spectrum has 2 extra lines, and three missing lines.
I've hand calculated the
expected location of lines in the experimental spectrum and account
for all of the lines,
so I
tement? I apply Rietveld quantitative analysis to assess the
mineralogy of contaminated media, and I want to support the statement
in a journal publication that this is the more statistically reliable
of the available techniques, if one needs to look at a bulk sample
(not focus on the nm scale).
I
techniques, if one needs to look at a bulk sample (not focus on the nm
scale).
I also have a question on the accuracy of the method. I follow the
discussions on the list and I would like to ask where you draw the line for
a "good" and a "bad" refinement. Do you make a distincti
> The initial model I used was a .cif file, exported from ICSD database. I
> believe this structure model is correct
> ...
> (With GSAS) the intensity of the third peak in my observed pattern is much
> lower than the calculated, and the other peaks' (60~130 degree) are much
> higher than the calcul
ailto:[EMAIL PROTECTED]
Sent: Tuesday, December 26, 2006 3:30 AM
To: rietveld_l@ill.fr
Subject: Question about GSAS
Dear all,
I am reading for my Doctor degree in Beijing, China now. I have some questions
about GSAS, which were found when I used this program to refine some
perovskites' structur
Dear all,
I am reading for my Doctor degree in Beijing, China now. I have some
questions about GSAS, which were found when I used this program to refine
some perovskites' structures.
The initial model I used was a .cif file, exported from ICSD database. I
believe this structure model is co
Dear all,
Does anybody know any dislocation model of the distortion Fourier transform
Ad(L) with finite derivatives for L = 0?
Best regards
Florentino Sánchez
To the best of my knowledge there is nothing in Peter Stephen's model
for anisotropic strain broadening that is tied to a data collection
geometry. It should be appropriate for all types of diffraction data.
Brian
On Oct 23, 2006, at 5:12 AM, Franz Werner wrote:
Is it justified to use GSAS'
Dear All
Is it justified to use GSAS' profile function no. 4 (CW X-ray) in the case of
data obtained from a conventional laboratory diffractometer? I.e. is Stephens'
approach for aniso. microstrain broadening applicable here?
Thank you four your advice.
Kind regards
Franz Werner
Technische Un
Hello everybody!
I have a question concerning the fullprof program. I am now
trying to see which wavelength fullprof uses. We use Cu radiation and I cannont
tell which wavelength fullprof uses nor if it is a ratio which is the final
value of the wavelength after ponderation. I
s are very hard to see though, even when they are there.
S
Original Message
Subject: [Fwd: Re: Question]
Date: Thu, 28 Sep 2006 11:14:00 -0400
From: Xiangyun Qiu <[EMAIL PROTECTED]>
Organization: Cornell University
To: Simon Billinge <[EMAIL PROTECTED]>
Hi Simon,
I
sourceforge.
On this topic, we will be releasing a new version of PDFfit a little
later in the year with a number of bug-fixes and better functionality,
so if you are using PDFfit, make sure you upgrade at that time.
S
Andy Fitch wrote:
Hi Simon,
We have a question about pfd analysis
for a
> mixture is the weighted sum of G(r) for the components.
>
> Brian
>
> On Sep 27, 2006, at 9:05 AM, Andy Fitch wrote:
>
>> We have a question about pdf analysis. If my sample is two
>> phase, so the diffraction pattern is the sum of two individual
>>
Another way of thinking about it is that PDF represents the pair
correlation function, and there can be no correlation between atom
positions in two different phases :-) Same thing for Rietveld refinement.
Alan.
Brian H. Toby said:
> I had to think for a bit: the Fourier transform of a sum is equa
I had to think for a bit: the Fourier transform of a sum is equal to the sum of the terms transformed individually, so the G(r) for a mixture is the weighted sum of G(r) for the components. BrianOn Sep 27, 2006, at 9:05 AM, Andy Fitch wrote: We have a question about pdf analysis. If my
Hi Simon,
We have a
question about pfd analysis. If my sample is two phase, so the
diffraction pattern is the sum of two individual patterns, what does the
G(r) show? Is it just the sum of two individual G(r)s or some mangled
convolution between the two?
Cheers
Andy
ards
> Francois Girod
>
>
>
>
> "Retief, Johannes
> \(JJ\)" Pour
> :
> <[EMAIL PROTECTED]cc :
> l.com>
Pour
:
<[EMAIL PROTECTED]cc :
l.com> Objet:RE: Question
on tem
complicated system.
Regards,
Johannes Retief
-Original Message-From: Maria
Chrysochoou [mailto:[EMAIL PROTECTED] Sent: 30 June 2005
21:55To: rietveld_l@ill.frSubject: Question on
temperature factors
Hi all,
I have a question on temperature
factors in
Hi all,
I have a question on temperature factors in Rietveld
refinement.
I am on working on a complicated system with over 12 phases
on average (it is cement-like in chemistry and mineralogy). I tend not to
refine temperature factors in order to reduce the number of refinable
Lachlan,
You refer to hard cover edition of the book (ISBN: 1-4020-7365-8) but soft
cover (ISBN: 0-387-24147-7) is priced at much lower price and is available
at www.springeronline.com and amazon.com.
Regards,
Peter
Peter Y. Zavalij
Director, X-ray Crystallographic Laboratory
Department of Chem
> I am a fresh Ph.D student and I wish to learn about XRD analysis and
> rietveld analysis. Can anyone help me in this regard. Please suggest
> me the books I have to follow for rietveld analysis.
The following book is a good start - and includes example data on a CD-ROM:
Fundamentals of Powder
Dear all,
I am a fresh Ph.D student and I wish to learn about XRD analysis and
rietveld analysis. Can anyone help me in this regard. Please suggest
me the books I have to follow for rietveld analysis.
smith
cattering power
> observed on the sites.
>
> Thus if the scattering power on a particular site changes with dopant
> concentration then you can be sure that that site is being affected -
> a simple enough deduction to make. If the site in question has a
> similar scattering
the sites.
Thus if the scattering power on a particular site changes with dopant
concentration then you can be sure that that site is being affected - a
simple enough deduction to make. If the site in question has a similar
scattering power as the dopant but different ionic radii then the change
in
dopant
concentration then you can be sure that that site is being affected - a
simple enough deduction to make. If the site in question has a similar
scattering power as the dopant but different ionic radii then the change
in the site occupancy should show up in the trend seen in the average
bond
rs of the Rietveld mailing list,
My name is Alexander Schmets and currently I work as a PhD student in
the
Neutron scattering department at the Delft University of Technology, The
Netherlands. I read this Rietveld already quite some time, but this is
my
first question.
1) I have a range of samples cont
,
My name is Alexander Schmets and currently I work as a PhD student in
the
Neutron scattering department at the Delft University of Technology, The
Netherlands. I read this Rietveld already quite some time, but this is
my
first question.
1) I have a range of samples containing Li, V , O and
ers of the Rietveld mailing list,
My name is Alexander Schmets and currently I work as a PhD student in
the
Neutron scattering department at the Delft University of Technology, The
Netherlands. I read this Rietveld already quite some time, but this is
my
first question.
1) I have a range o
ogy, The
Netherlands. I read this Rietveld already quite some time, but this is
my
first question.
1) I have a range of samples containing Li, V , O and one or more other
transition metal ions (Ni, Co, Mn, Fe). It seems beneficial to do a
combined experiment: neutrons for finding the Li (V hardly
t University of Technology, The
Netherlands. I read this Rietveld already quite some time, but this is
my
first question.
1) I have a range of samples containing Li, V , O and one or more other
transition metal ions (Ni, Co, Mn, Fe). It seems beneficial to do a
combined experiment: neutrons for fi
already quite some time, but this is
my
first question.
1) I have a range of samples containing Li, V , O and one or more other
transition metal ions (Ni, Co, Mn, Fe). It seems beneficial to do a
combined experiment: neutrons for finding the Li (V hardly visible), and
to distinguish between the tra
At 10:38 AM 5/4/2005, Alexander J.M. Schmets wrote:
Consider I know (from other experiments) that V5+ (partly) occupies a 16d
site ...should I attribute instead of V the element that is five places
backwards (Argon) to that site, in order to have the correct scattered
intensity? And then ... the bo
Dear users of the Rietveld mailing list,
My name is Alexander Schmets and currently I work as a PhD student in the
Neutron scattering department at the Delft University of Technology, The
Netherlands. I read this Rietveld already quite some time, but this is my
first question.
1) I have a range
Dear users of the Rietveld mailing list,
My name is Alexander Schmets and currently I work as a PhD student in the
Neutron scattering department at the Delft University of Technology, The
Netherlands. I read this Rietveld already quite some time, but this is my
first question.
1) I have a range
Dear friends
Lines from Fullprof manual
Square-ch= suamation {wi*square(Yi-yci)}
where wi- reciprocal of the square of variance of the observation Yi. I
did not understand the meaning of Wi and its relation with variance.
How we will calulate Wi then.
I know from basics of least sqaure refinement
Dear Rietveld's users,
I have a question about GSAS:
my TOF neutron diffraction profile exhibits a broadening of some low
intense superstructure peaks where the index l is =2n+1 (tetragonal I
cell). I'd like to do a refinement where this effect is taken in
account. The superstructure i
and I had to change the slits in order to reduce the
broadening.
Best regards
Miguel Hesiquio
- Original Message -
From:
Angel L. Ortiz
To: rietveld_l@ill.fr
Sent: Friday, April 01, 2005 5:44
AM
Subject: question about the Scherrer
method
Dear users of the
Dear users of the Rietveld method:
I would like to launch a question regarding the use
of the Scherrer method of line-broadening analysis. When estimating the crystallite
size in a undistorted material (free of lattice microstrains) using Scherrer
method, should I use the integral
Dear Rietvelders,
Does anybody encounter a problem stated "time out during data collection" in
using the APD program of a Philips XRD system? It is annoying because the XRD
will automatically stop the data collection. I checked through the manual but
does not know what this about.
Please advise m
Our library has Z. Phys. back to volume 1 so I should be able to order it.
Pam
Dr Pamela Whitfield CChem MRSC
Energy Materials Group
Institute for Chemical Process and Environmental Technology
Building M12
National Research Council Canada
1200 Montreal Road
Ottawa ON K1A 0R6
CANADA
Tel: (613)
Hi,
Is there anyone having a copy of the paper (or a clue where to get it) : D.
Coster et al, Z. Phys. 1930, 63, 345.
This should be a classic for resonant diffraction guys...
thank you,
Regards
--
this is an automatic message
--
please note
The theory of line broadening due to stacking faults as presented in
Warren's book has been improved recently further:
X-ray
diffraction analysis of stacking and twin faults in f.c.c. metals: a
revision and allowance for texture and non-uniform fault probabilities
VELTEROP L, DELHEZ R, DE KEIJ
I would suggest you look into the work of Mike Treacy et al. and in
particular his DIFFaX program (check ccp14 for links.) The effects of
stacking faults on diffraction patterns can be quite complex and are
not simulated through use of models that contain long range symmetry.
Brian
ling yang wr
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