To the best of my knowledge there is nothing in Peter Stephen's model for anisotropic strain broadening that is tied to a data collection geometry. It should be appropriate for all types of diffraction data.

Brian

On Oct 23, 2006, at 5:12 AM, Franz Werner wrote:

Is it justified to use GSAS' profile function no. 4 (CW X-ray) in the case of data obtained from a conventional laboratory diffractometer? I.e. is Stephens' approach for aniso. microstrain broadening applicable here?

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