Dear users of the Rietveld method:

 

I would like to launch a question regarding the use of the Scherrer method of line-broadening analysis. When estimating the crystallite size in a undistorted material (free of lattice microstrains) using Scherrer method, should I use the integral breadth of the pure profile or its full width at haft maximum (of course, both corrected by instrumental broadening)?. Why?.

 

Thanks in advance.

 

Angel Luis.  

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