Hi Alan-

Just a quick suggestion.  You might want to check your mail client behavior.  
Your reply telling Jim he is banned for sending an attachment contained the 
same attachment.  

I believe many clients default to include attachments when mails are forwarded 
or redirected, but strip the attachment when a user chooses "reply.”  Perhaps 
your email system doesn’t do that or needs to be configured to do that? 

(I’m sure several Rietveld List users will find the humor in this and wonder if 
you are now banned, but I think things got touchy enough a few weeks ago and so 
hope we can avoid too much back-and-forth about that.  After all, it can be 
very hard in an email to tell the subtleties of when someone is joking, poking 
fun, being puckish, reproachful, chiding, scolding, rebuking… and all with 
differences depending on language and culture.)

Regards-
David 

David Elbert
Earth and Planetary Sciences
Olin Hall
Johns Hopkins University
3400 N. Charles St
Baltimore, MD 21218

(410) 516-5049

elb...@jhu.edu








> On Jul 14, 2015, at 7:18 AM, Alan Hewat <alan.he...@neutronoptics.com> wrote:
> 
> Sorry Jim. Even if your attachment is tiny, if I make exceptions it's unfair 
> to those who have been banned for the same thing. It's only a week, and 
> nothing personal.
> 
> Why don't you put these plots on your sales site: 
> https://www-s.nist.gov/srmors/viewTableH.cfm?tableid=149 
> <https://www-s.nist.gov/srmors/viewTableH.cfm?tableid=149>
> 
> Alan.
> 
> On 14 July 2015 at 12:53, Cline, James Dr. <james.cl...@nist.gov 
> <mailto:james.cl...@nist.gov>> wrote:
> I hope I don’t get shot for this, only 64 kb:
> 
>  
> 
> FWHM values of various SRMs:
> 
> Regards,
> 
>  
> 
> Jim
> 
>  
> 
>  
> 
> James P. Cline
> Materials Measurement Science Division                  
> National Institute of Standards and Technology
> 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ]
> Gaithersburg, MD 20899-8523    USA
> jcl...@nist.gov <mailto:jcl...@nist.gov>
> (301) 975 5793
> FAX (301) 975 5334
> 
>  
> 
> From: Fabrizio Guzzetta [mailto:fabrizio.guzze...@gmail.com 
> <mailto:fabrizio.guzze...@gmail.com>] 
> Sent: Tuesday, July 14, 2015 3:24 AM
> To: Cline, James Dr.
> Cc: Young, Lindsay Kay; rietveld_l@ill.fr <mailto:rietveld_l@ill.fr>
> Subject: Re: Obtaining a silicon standard wafer
> 
>  
> 
> Thanks Jim for the useful info. I was not aware of this kind of silicon 
> standard until now. But can't be polycrystallinity of Silicon a drawback to 
> use it as standard? Or is there a way to "purify" a single phase suitable to 
> use as standard? I have always found more useful having LaB6 or corundum 
> (whenever LaB6 is expensive to find) to use it as standard to compare 
> instrumental peak broadening. In some of the Rietveld software I use or I 
> know, also yttria is used to determine peak broadening. Which criteria do you 
> use when choosing a suitable pxrd standard to compare your unknown? Why?
> 
>  
> 
> Thanks for the enlightening discussion.
> 
> 
> 
> Fabrizio Guzzetta
> 
> Ph.D. student, Dept. Quimica Inorganica y Organica, UJI
> 
> Castellon de la Plana
> 
> Spain
> 
>  
> 
> 2015-07-13 19:56 GMT+02:00 Cline, James Dr. <james.cl...@nist.gov 
> <mailto:james.cl...@nist.gov>>:
> 
> Lindsay,
> 
>  
> 
> I’ve seen pressed discs of silicon powder that were supplied with older 
> Philips diffractometers, and I understand that PANalytical will presently 
> supply them with their new machines.  NIST offers no such standard of silicon 
> in a disc format.  But I can suggest that you consider SRM 640e which is 
> supplied as powder.  One can mount a specimen of it carefully to obtain high 
> density and a flat specimen surface, and then infiltrate the powder bed with 
> silicone based liquid resin such as Vacseal.  See:
> 
>  
> 
> http://www.2spi.com/catalog/vac/vacleak.shtml 
> <http://www.2spi.com/catalog/vac/vacleak.shtml>
>  
> 
> The surface of the compact will darken to a uniform color when the 
> infiltration is complete.  This will result in a stable compact with the 
> diffraction properties of SRM 640e.
> 
>  
> 
> Regards,
> 
>  
> 
> Jim
> 
>  
> 
>  
> 
> James P. Cline
> Materials Measurement Science Division                  
> National Institute of Standards and Technology
> 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ]
> Gaithersburg, MD 20899-8523    USA
> jcl...@nist.gov <mailto:jcl...@nist.gov>
> (301) 975 5793
> FAX (301) 975 5334
> 
>  
> 
> From: rietveld_l-requ...@ill.fr <mailto:rietveld_l-requ...@ill.fr> 
> [mailto:rietveld_l-requ...@ill.fr <mailto:rietveld_l-requ...@ill.fr>] On 
> Behalf Of Young, Lindsay Kay
> Sent: Friday, July 10, 2015 1:28 PM
> To: rietveld_l@ill.fr <mailto:rietveld_l@ill.fr>
> Subject: Obtaining a silicon standard wafer
> 
>  
> 
> Hello Rietvelders - 
> 
>  
> 
> This is not exactly a data question, but I am sure someone here can help. I 
> am looking into purchasing a silicon powder standard wafer for PXRD 
> instrument alignment. However, I am not sure where to get one or how much I 
> might expect one to cost. My questions to all of you are: 
> 
>  
> 
> - Do you know where I could purchase this type of standard?
> 
> - How much would you expect to pay for one? 
> 
> - I have been told Gem Dugout makes these, but they may not be around any 
> more. Does anyone know what happened to them?
> 
>  
> 
> Thank you very much for your help, and I hope you all have a great weekend! 
> 
>  
> 
> - Lindsay Young
> 
> 
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> 
> 
> -- 
> ______________________________________________
>    Dr Alan Hewat, NeutronOptics, Grenoble, FRANCE 
> <alan.he...@neutronoptics.com> +33.476.98.41.68
>         http://www.NeutronOptics.com/hewat 
> <http://www.neutronoptics.com/hewat>
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