Sorry Jim. Even if your attachment is tiny, if I make exceptions it's
unfair to those who have been banned for the same thing. It's only a week,
and nothing personal.

Why don't you put these plots on your sales site:
https://www-s.nist.gov/srmors/viewTableH.cfm?tableid=149

Alan.

On 14 July 2015 at 12:53, Cline, James Dr. <james.cl...@nist.gov> wrote:

>  I hope I don’t get shot for this, only 64 kb:
>
>
>
> FWHM values of various SRMs:
>
>  Regards,
>
>
>
> Jim
>
>
>
>
>
> James P. Cline
> Materials Measurement Science Division
> National Institute of Standards and Technology
> 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ]
> Gaithersburg, MD 20899-8523    USA
> jcl...@nist.gov
> (301) 975 5793
> FAX (301) 975 5334
>
>
>
> *From:* Fabrizio Guzzetta [mailto:fabrizio.guzze...@gmail.com]
> *Sent:* Tuesday, July 14, 2015 3:24 AM
> *To:* Cline, James Dr.
> *Cc:* Young, Lindsay Kay; rietveld_l@ill.fr
> *Subject:* Re: Obtaining a silicon standard wafer
>
>
>
> Thanks Jim for the useful info. I was not aware of this kind of silicon
> standard until now. But can't be polycrystallinity of Silicon a drawback to
> use it as standard? Or is there a way to "purify" a single phase suitable
> to use as standard? I have always found more useful having LaB6 or corundum
> (whenever LaB6 is expensive to find) to use it as standard to compare
> instrumental peak broadening. In some of the Rietveld software I use or I
> know, also yttria is used to determine peak broadening. Which criteria do
> you use when choosing a suitable pxrd standard to compare your unknown? Why?
>
>
>
> Thanks for the enlightening discussion.
>
>
>     Fabrizio Guzzetta
>
> Ph.D. student, Dept. Quimica Inorganica y Organica, UJI
>
> Castellon de la Plana
>
> Spain
>
>
>
> 2015-07-13 19:56 GMT+02:00 Cline, James Dr. <james.cl...@nist.gov>:
>
> Lindsay,
>
>
>
> I’ve seen pressed discs of silicon powder that were supplied with older
> Philips diffractometers, and I understand that PANalytical will presently
> supply them with their new machines.  NIST offers no such standard of
> silicon in a disc format.  But I can suggest that you consider SRM 640e
> which is supplied as powder.  One can mount a specimen of it carefully to
> obtain high density and a flat specimen surface, and then infiltrate the
> powder bed with silicone based liquid resin such as Vacseal.  See:
>
>
>
> http://www.2spi.com/catalog/vac/vacleak.shtml
>
>
>
> The surface of the compact will darken to a uniform color when the
> infiltration is complete.  This will result in a stable compact with the
> diffraction properties of SRM 640e.
>
>
>
> Regards,
>
>
>
> Jim
>
>
>
>
>
> James P. Cline
> Materials Measurement Science Division
> National Institute of Standards and Technology
> 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ]
> Gaithersburg, MD 20899-8523    USA
> jcl...@nist.gov
> (301) 975 5793
> FAX (301) 975 5334
>
>
>
> *From:* rietveld_l-requ...@ill.fr [mailto:rietveld_l-requ...@ill.fr] *On
> Behalf Of *Young, Lindsay Kay
> *Sent:* Friday, July 10, 2015 1:28 PM
> *To:* rietveld_l@ill.fr
> *Subject:* Obtaining a silicon standard wafer
>
>
>
> Hello Rietvelders -
>
>
>
> This is not exactly a data question, but I am sure someone here can help.
> I am looking into purchasing a silicon powder standard wafer for PXRD
> instrument alignment. However, I am not sure where to get one or how much I
> might expect one to cost. My questions to all of you are:
>
>
>
> - Do you know where I could purchase this type of standard?
>
> - How much would you expect to pay for one?
>
> - I have been told Gem Dugout makes these, but they may not be around any
> more. Does anyone know what happened to them?
>
>
>
> Thank you very much for your help, and I hope you all have a great
> weekend!
>
>
>
> - Lindsay Young
>
>
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-- 
______________________________________________
*   Dr Alan Hewat, NeutronOptics, Grenoble, FRANCE *
<alan.he...@neutronoptics.com> +33.476.98.41.68
        http://www.NeutronOptics.com/hewat
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