Dear All,

Just to be sure on two of the Q&As:

Le 07/11/2024 à 05:03, Matthew Rowles a écrit :
Great questions!


> Is it worthy to use the parameter known as "Sample Thickness", associated with the Absorption Correction in TOPAS?

Generally, no. You only need to worry about it if the penetration depth of your incident beam is larger than the thickness (t) of the specimen. If that is the case, then "Sample Thickness" and "Scale Intensity" is necessary to correct for the change in peak shape due to the finite depth, and the change in diffracting volume.

- Seems from your answer Matthew, that diffracting volume changes (Vd) through the scan in BB geometry gives rise to some peak shape variations (I assume here that "shape" includes "width"). I agree that the diffracting volume changes with theta, and with the sample thickness, but these two effects should not contribute the same on the peak shape:

-- For a given sample thickness, the diffracting volume varies with Theta, but to me the main contribution to the peak shape is due to the irradiated surface (beam track on the sample surface). Since deeper dVd will be more absorbed than the ones closer to the surface. You can picture this measuring a 2Theta scan at fixed incident angle, up to 2Theta=90°, the peak width increases notably with 2Theta because of this.

-- For the same theta on the diffraction diagram, varying the sample thickness will probably not modify this much the shape of the peaks, but intensities. For the same reasons on dVd. For instance, if measuring 2 samples with a 100 nm and 200 nm thickness respectively, the peak shape variation will probably not be visible using lab instruments, while the intensities will differ significantly.

- I do not like much the term "penetration depth" (p), since the depth reached by x-rays is always infinite. For instance, if as usual p is defined as 1/mu (mu = absorption coefficient of the sample, the one we never fully know exactly), using a Theta-2Theta scan in BB on a t=infinity sample, the measured diffracted intensity is larger than the one coming from p only. And, on a thin specimen, both absorption and Vd are varying during the scans, each of them bringing a contribution to the intensity. On the contrary, for t=infinite specimen, they compensate each-other and their contribution is the same on the diffracted intensity throughout the diagram (but the intensity does not come from the same irradiated volume). I was then wondering if Topas was simply corrected from volume variations or also including the absorption variations in the case of "thin enough" samples ?




> Is the negative intensity in the difference curve...

It is showing that there is some mismatch between your model and the data. The intensities could be off because the peaks positions are wrong, the peak-shape is wrong, the atomic displacement parameters are wrong (don't refine these from normal QPA data), the LP factor correction is wrong, the site occupancies are wrong, the atomic scattering factors are wrong. Could also be that you have forgotten to refine a parameter that you should be.

What about preferred orientations ? Anisotropic crystallite shapes and microstrains ? Improperly defined film thickness can give rise to variations of the ADPs also.


My 2€cts !

Daniel











On Wed, 6 Nov 2024 at 19:12, Łukasz Kruszewski <lkruszew...@twarda.pan.pl> wrote:

    Dear Rietvelders,

    after some years of being a happy user of TOPAS & Rietveld method
    (after
    working-out a good approach, thanks to a great help from users of
    this
    mailing list for which I am really thanful, and having it checked by
    attendance in Reynolds Cup) I was recently confronted with few
    questions
    I couldn't answer. I thus have a kind request of a help here:

    - does the Absorption correction also influences microabsorption?
    This
    question arose due to somewhat lowered expected wt.% of pyrite (19
    instead of 25), FeS2, even though all the used parameters
    (Absorption,
    CrySize, Strain - for all the sample components) were checked and
    proven
    to give value > error, i.e., being physically meaningful for the
    refinement model. I was wondering how this supposed non-precision for
    pyrite could be addressed...

    - Is it worthy to use the parameter known as "Sample Thickness",
    associated with the Absorption Correction in TOPAS? I was taught in a
    5-day course of TOPAS that it's not a good idea, especially with the
    Bragg-Brentano geometry, but I'm not sure...

    - Is there any difference, to be expected, in the calculated unit
    cell
    parameters, between approximating a phase using (1) a chemically pure
    STRUCTURE model (i.e., taken directly from a database / CIF file),
    and
    (2) a STRUCTURE with Occupancy information updated with the known
    content of impurities? I always thought that it shouldn't matter,
    as the
    software simply "iteratively" compares the sample' reflections
    with the
    structural information contained in STRUCTURE models (?). I have
    compared these two situations, and option "2" actually gave me worse
    fit. I thus wondered: does it really matter that much which model
    (approximation) of the structure - chemically pure or with added
    impurity info - is used? For most substances, the reflection
    positions
    vary even for different standards found in databases like PDF or
    COD...

    - Is the negative intensity in the difference curve only informing
    us of
    underestimation of the content of a particular phase, suggesting to
    replace the Structure model used with another one?

    We have been working using few computers with, supposedly the very
    same
    version of the software. However, even though we've been using
    exactly
    the same Structure models, results were varying depending on the
    computer stand used. I was wondering if this could have to do with
    some
    errors in the JAVA script, or maybe a non-identical installation
    conditions, or something about the Windows system?

    I would be thankful for any tips.

    Best regards,

-- Łukasz Kruszewski, Ph.D., Associate Professor
    Polish Academy of Sciences
    Institute of Geological Sciences
    Twarda 51/55 str.
    00-818 Warsaw
    Poland
    ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
    Please do NOT attach files to the whole list
    <alan.he...@neutronoptics.com>
    Send commands to <lists...@ill.fr> eg: HELP as the subject with no
    body text
    The Rietveld_L list archive is on
    http://www.mail-archive.com/rietveld_l@ill.fr/
    ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++


++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
Please do NOT attach files to the whole list<alan.he...@neutronoptics.com>
Send commands to<lists...@ill.fr>  eg: HELP as the subject with no body text
The Rietveld_L list archive is onhttp://www.mail-archive.com/rietveld_l@ill.fr/
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

--

----------------------------------------------------------------------
Daniel Chateigner
Professeur Normandie Universite
chateigner.ensicaen.fr/
----------------------------------------------------------------------
Editor: "Combined Analysis", 
Wiley-ISTE:http://eu.wiley.com/WileyCDA/WileyTitle/productCd-1848211988.html
Workshops on Combined Analysis: chateigner.ensicaen.fr/formation/
----------------------------------------------------------------------
Address:
CRISMAT-ENSICAEN and IUT-Caen,
Universite de Caen Normandie, campus 2
6, Bd. M. Juin 14050 Caen, France
tel: 33 (0)2 31 45 26 11
daniel.chateig...@ensicaen.fr
----------------------------------------------------------------------
Open Databases:
Material Properties Open Database (MPOD): mpod.cimav.edu.mx
Crystallography Open Database     (COD):www.crystallography.net/cod/
                  Theoretical     (TCOD):www.crystallography.net/tcod/
                  Predicted       (PCOD):www.crystallography.net/pcod/
Raman Open Database (ROD): solsa.crystallography.net/rod/
Full-Profile Search-Match (FPSM): cod.iutcaen.unicaen.fr/
----------------------------------------------------------------------
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++
Please do NOT attach files to the whole list <alan.he...@neutronoptics.com>
Send commands to <lists...@ill.fr> eg: HELP as the subject with no body text
The Rietveld_L list archive is on http://www.mail-archive.com/rietveld_l@ill.fr/
++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++

Reply via email to