Dear Reitvelders I am overwhelmed with your insightful responses. I am grateful for that.
Indeed I have Ni filter and the adsorption added is indeed a good possible explanation since we get similar step-like profiles with completely different materials and samples. With the understanding that this step contains no special information that I might lose by using Spilne as the baseline subtraction. I just need to make sure I am not affecting peak positions and creating artificial peaks and humps Any comments? Thanks Shay <https://www.avast.com/sig-email?utm_medium=email&utm_source=link&utm_campaign=sig-email&utm_content=webmail> Virus-free.www.avast.com <https://www.avast.com/sig-email?utm_medium=email&utm_source=link&utm_campaign=sig-email&utm_content=webmail> <#DAB4FAD8-2DD7-40BB-A1B8-4E2AA1F9FDF2> On Wed, Sep 6, 2023 at 9:35 AM Reinhard Kleeberg < kleeb...@mineral.tu-freiberg.de> wrote: > Dear Radovan, > may be you are right, but this great development will unfortunately > not help the big number of lab diffractionists to puzzle the patterns > to be analyzed in their daily business ;-) > Best regards > > Reinhard > > Zitat von Radovan Cerny <radovan.ce...@unige.ch>: > > > Dear Reinhard, > > > > I wouldn't say "solely from the detector side". The biggest > > improvement is synchrotron radiation (+2D detectors🤓). > > > > Best greetings from Lac Leman > > > > Radovan Cerny > > > > Envoyé à partir de Outlook pour Android<https://aka.ms/AAb9ysg> > > ________________________________ > > From: rietveld_l-requ...@ill.fr <rietveld_l-requ...@ill.fr> on > > behalf of Reinhard Kleeberg <kleeb...@mineral.tu-freiberg.de> > > Sent: Tuesday, September 5, 2023 1:49:57 PM > > To: rietveld_l@ill.fr <rietveld_l@ill.fr> > > Subject: [EXTERNAL] Re: [EXT] [External] Re: Step-like basline > > > > Dear Luca, > > I completely agree and will be very happy to have a 1D detector with > > sufficient energy resolution to resolve a "pure" Cu Kalpha1/2 doublet > > from W Lalpha1. This would make routine work much easier. IMHO, the > > biggest improvements in XRPD instrumentation within the last decades > > came solely from the detector side, should be continued. > > > > Regarding search-match by Rietveld: Your FSPM method is a very > > inspiring idea. Nicola Doebelin has incorporated a simplified approach > > in PROFEX, too: > > https://www.youtube.com/watch?v=Oqj71TiifeI > > > > I'm routinely applying a run of ~500 structures/minerals what we are > > commonly using (+- the former QPA database of Seifert AUTOQUAN or from > > the BGMN webpage) for a phase screening of unknown samples, needs ~ 5 > > min without interaction. Than running QPA refinement with the best > > matching structures, clicking on remaining peaks in the difference > > plot for getting a proposal of best matching main line positions in > > the database, and adding these structure(s) to the refinement, running > > again... This is a typical workflow in our lab, no need for peak > > search, background treatment, thinking about artifact peaks... > > > > Best regards > > > > Reinhard > > > > Zitat von Luca Lutterotti <luca.luttero...@unitn.it>: > > > >> Dear Reinhard and Rietvelders, > >> > >> It is always a compromise. Ideally we would like the fastest > >> instrument with a lot of intensity (so, 1D or 2D detectors) but no > >> lines outside the Kalpha or even just the Kapha1 like the one of > >> James Cline. But this means a monochromator on the incident beam and > >> you get fluorescence background. Now I like your solution of the Si > >> Drift detector, so you just cut the fluorescence and you don’t need > >> the monochromator in the first place. > >> So we are working and we are testing some lab prototypes of a 1D Si > >> Drift like detector to get the best of both world. It is only a lot > >> of electronic, but one day we will have wonderful instrument with > >> only the lines we need and no fluorescence for the background. > >> Actually we use fluorescence for the chemical analysis (quantitative). > >> > >> About the search-match problem. Have a look on our FPSM method ( > >> http://fpsm.radiographema.com/) where we don’t care about extra > >> lines as it is a Rietveld search-match. We don’t need to identify or > >> search peaks. We don’t use peak positions, we just fit with the > >> Rietveld. It is slower indeed, but every day is becoming faster and > >> in a few years it will run quickly on our cellphones (I have a > >> prototype running there). > >> > >> Best regards, > >> > >> Luca > >> > >> <http://www.unitn.it/> > >> > >> Luca Lutterotti > >> Dipartimento di Ingegneria Industriale > >> Università di Trento > >> via Sommarive, 9 - 38123 Trento (Italy) > >> tel. +39 0461 2824-14 (Office), -34 (X-Ray lab) > >> > >> > >>  > >> > >> Maud: http://maud.radiographema.com <http://maud.radiographema/> > >> > >> > >>> Begin forwarded message: > >>> > >>> From: Reinhard Kleeberg <kleeb...@mineral.tu-freiberg.de> > >>> Subject: Re: [EXT] [External] Re: Step-like basline > >>> Date: 5 September 2023 at 08:56:15 CEST > >>> To: rietveld_l@ill.fr > >>> Reply-To: Reinhard Kleeberg <kleeb...@mineral.tu-freiberg.de> > >>> > >>> Dear Luca, > >>> I completely agree with your opinion, and want to add that even for > >>> "trivial" tasks in XRPD like phase analysis and standard Rietveld > >>> refinements the satellites/spectral impurities do cause significant > >>> trouble: > >>> > >>> - The K beta and W L satellites of strong peaks of major phases > >>> like quartz, carbonates or cubic structures in geomaterials are > >>> typically not automatically recognized in the standard peak search > >>> procedures and therefore misinterpreted to be K alpha peaks and > >>> added to the peak list. I can't tell you how often I was asked from > >>> colleagues for explanation of such "unidentified peaks", and how > >>> much time people have spent for searching for explanation of such > >>> artefact lines. > >>> - In Rietveld analysis our software must generate the peaks at > >>> least for the measured angular range. Depending on the method how > >>> the software is doing this, we run into problems with the > >>> satellites. If the software generates the reflections from the > >>> positions of K alpha peaks from the start lattice parameters and > >>> the (extended) upper measured angle, K beta satellites of K alpha > >>> peaks outside this angular range will maybe not generated and > >>> remain unfitted in the pattern. If the software generates the peaks > >>> depending on the shortest wavelength in the wavelength profile > >>> (more intelligent approach), the software must generate much more > >>> reflections (with maxima outside the measured angular range) and > >>> all these peaks must be calculated over an extremely broad angular > >>> range. In the case of low symmetry structures with big cells or > >>> disordered structures described by partial structure factors and > >>> the resulting extreme high numbers of peaks, the "extension effect" > >>> will cause significantly prolonged time for calculations, without > >>> any positive effect. > >>> > >>> That's why I prefer to use instrumentation with better > >>> monochromatic radiation (monochromators, high energy resolution > >>> detectors) even in the daily business of phase analysis. We do use > >>> our 1D detector Mythen2 with Fe filter (Co radiation) only for > >>> "quick and dirty" measurements. > >>> > >>> Best regards > >>> > >>> Reinhard > >>> > >>> > >>> Zitat von Luca Lutterotti <luca.luttero...@unitn.it>: > >>> > >>>> Dear Habib, > >>>> > >>>> Reinhard is right, and what he explained is exactly what you > >>>> observed. Now I would add that I may not define your Bruker clean > >>>> and optimised, because for this kind of samples, wafers and > >>>> extremely textured thin films, it would be better to have a > >>>> monochromator in the incident beam and not a Ni filtered (I would > >>>> more say it is a requirement). It was already showed many times in > >>>> the past as a monochromator in the incident beam is a necessity > >>>> for this materials to avoid all the "physical artifacts" created > >>>> by the strong intensity and not clean Kalpha radiation. > >>>> > >>>> Best regards, > >>>> > >>>> Luca > >>>> > >>>> <http://www.unitn.it/> > >>>> > >>>> Luca Lutterotti > >>>> Dipartimento di Ingegneria Industriale > >>>> Università di Trento > >>>> via Sommarive, 9 - 38123 Trento (Italy) > >>>> tel. +39 0461 2824-14 (Office), -34 (X-Ray lab) > >>>> > >>>> > >>>>  > >>>> > >>>> Maud: http://maud.radiographema.com <http://maud.radiographema/> > >>>> > >>>> > >>>>> On 4 Sep 2023, at 12:20, Habib Boughzala > >>>>> <habib.boughz...@ipein.rnu.tn> wrote: > >>>>> > >>>>> Many thanks Reinhard, > >>>>> > >>>>> That's exactly what I wanted to say by "I can assure that our > >>>>> Bruker D8 is clean and optimized!" > >>>>> Otherwise, in some other cases of well conditioned thin film no > >>>>> similar phenomenon is observed! > >>>>> So, yes, it's obviously possible that your point of view is right. > >>>>> > >>>>> Regards > >>>>> Habib > >>>>> > >>>>> > >>>>> ------ Message d'origine ------ > >>>>> De "Reinhard Kleeberg" <kleeb...@mineral.tu-freiberg.de > >>>>> <mailto:kleeb...@mineral.tu-freiberg.de>> > >>>>> À "Habib Boughzala" <boughz...@yahoo.com <mailto:boughz...@yahoo.com > >> > >>>>> Cc rietveld_l@ill.fr <mailto:rietveld_l@ill.fr> > >>>>> Date 04/09/2023 11:07:50 > >>>>> Objet Re: Re[2]: [EXT] Re: [External] Re: Step-like basline > >>>>> > >>>>>> Dear Habib, > >>>>>> the phenomenom "satellites or edges" originates from the > >>>>>> diffraction process. The critical parameters are: > >>>>>> - spectral pureness of the primary beam (primary beam > >>>>>> monochromator, tube spectral contamination like W...) > >>>>>> - the use of K beta absorbtion filter (and its thickness) > >>>>>> - the energy resolution ("window") of the detector system. > >>>>>> Even a D8 system may be equipped with different types of > >>>>>> detectors, slits and energy limits can be set differently for an > >>>>>> identical configuration, and quite often satellite peaks may > >>>>>> appear later in the time of use (aging of the tube produces more > >>>>>> W L, Fe filters may corrode and get perforated...). So it is > >>>>>> strictly recommended to check the instrument peridically, by > >>>>>> measuring a full pattern of a profile standard (LaB6 or Si or > >>>>>> similar). > >>>>>> Greetings > >>>>>> Reinhard > >>>>>> > >>>>>> Zitat von Habib Boughzala <boughz...@yahoo.com > >>>>>> <mailto:boughz...@yahoo.com>>: > >>>>>> > >>>>>>> Dear all, > >>>>>>> I would like to send you my witness related to this kind of > >>>>>>> observation. > >>>>>>> I can assure that our Bruker D8 is clean and optimized! > >>>>>>> > >>>>>>> In many cases of well conditioned thin film (spin coating or > >>>>>>> controlled diffusion) material this kind of phenomenon is > >>>>>>> visible around the highest reflection, especially when the > >>>>>>> preferred orientation is drastically present. > >>>>>>> > >>>>>>> So, in my opinion, Reinhard and Alan are right, and what is > >>>>>>> observed is just like reflections broadening, asymmetry, > >>>>>>> shifting ...etc ... and can be related to the material behavior. > >>>>>>> Now, what is the physical (crystallographic!) property > >>>>>>> responsible of this phenomenon? let's open the floor for a > >>>>>>> large discussion. > >>>>>>> > >>>>>>> > >>>>>>> Habib > >>>>>>> > >>>>>>> > >>>>>>> ------ Message d'origine ------ > >>>>>>> De "Alan W Hewat" <alan.he...@neutronoptics.com > >>>>>>> <mailto:alan.he...@neutronoptics.com>> > >>>>>>> À "Reinhard Kleeberg" <kleeb...@mineral.tu-freiberg.de > >>>>>>> <mailto:kleeb...@mineral.tu-freiberg.de>> > >>>>>>> Cc rietveld_l@ill.fr <mailto:rietveld_l@ill.fr> > >>>>>>> Date 04/09/2023 09:29:08 > >>>>>>> Objet Re: [EXT] Re: [External] Re: Step-like basline > >>>>>>> > >>>>>>>> Reinhard is right that it is best to improve the instrument to > >>>>>>>> produce cleaner data. I'm concerned about the advice to model > >>>>>>>> all kinds of features whose origin is not fully understood, > >>>>>>>> simply to obtain a better fit. Shay has told us nothing about > >>>>>>>> his instrument or his conditions of data collection. He asks > >>>>>>>> "Is it a sample preparation problem", to which the obvious > >>>>>>>> reply is "Do you see this with other samples or different > >>>>>>>> materials" ? Only he can answer that. If the answer is yes, he > >>>>>>>> might try modifying his instrument (remove filters etc) to see > >>>>>>>> what effect that has on the pattern from a simple well > >>>>>>>> characterised material. Again only he can do that. Data > >>>>>>>> collection is an experimental science, and data refinement > >>>>>>>> should not be reduced to a "black box" computer program where > >>>>>>>> extra parameters can be added to reduce the R-factor. > >>>>>>>> Alan. > >>>>>>>> > >>>>>>>> On Mon, 4 Sept 2023 at 08:18, Reinhard Kleeberg > >>>>>>>> <kleeb...@mineral.tu-freiberg.de > >>>>>>>> <mailto:kleeb...@mineral.tu-freiberg.de>> wrote: > >>>>>>>>> Can be modeled in the BGMN peak profile model as well, by > modifying > >>>>>>>>> the *.lam file by a series of additional Lorentzians on the > 1/lambda > >>>>>>>>> scale, see figure. > >>>>>>>>> The same can be done for other spectral impurities, e.g. W L > >>>>>>>>> satellites. Also "electronic effects" on the wavelength > distribution > >>>>>>>>> profile like the "edges" from the ROI settings of Si drift > detectors > >>>>>>>>> can be modelled in such a convolution based approach. > >>>>>>>>> However, better to have a pure/simple wavelength distribution > (clear > >>>>>>>>> alpha1/2 doublet) by a monochromator or high energy resolution > >>>>>>>>> detector, as any satellites make trouble in trace phase analysis > and > >>>>>>>>> do cause prolonged calculation time in complicated Rietveld > >>>>>>>>> refinements. > >>>>>>>>> > >>>>>>>>> Reinhard > >>>>>>>>> > >>>>>>>>> > >>>>>>>>> > >>>>>>>>> Zitat von Matthew Rowles <rowle...@gmail.com > >>>>>>>>> <mailto:rowle...@gmail.com>>: > >>>>>>>>> > >>>>>>>>>> Topas can model them quite well. The functionality was > introduced in > >>>>>>>>>> version 5. > >>>>>>>>>> > >>>>>>>>>> On Mon, 4 Sep 2023, 00:54 Kurt Leinenweber, <ku...@asu.edu > >>>>>>>>>> <mailto:ku...@asu.edu>> wrote: > >>>>>>>>>> > >>>>>>>>>>> Hi, Are these things modeled in Rietveld programs, by > >>>>>>>>>>> chance? It seems > >>>>>>>>>>> like a lot of baggage to put in a refinement but if it > >>>>>>>>>>> makes the results > >>>>>>>>>>> better… > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> - Kurt > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> *From:* rietveld_l-requ...@ill.fr > >>>>>>>>>>> <mailto:rietveld_l-requ...@ill.fr> > >>>>>>>>>>> <rietveld_l-requ...@ill.fr > >>>>>>>>>>> <mailto:rietveld_l-requ...@ill.fr>> *On Behalf > >>>>>>>>>>> Of *Thomas Gegan > >>>>>>>>>>> *Sent:* Sunday, September 3, 2023 9:16 AM > >>>>>>>>>>> *To:* Bish, David L <b...@indiana.edu > >>>>>>>>>>> <mailto:b...@indiana.edu>>; Shay Tirosh <stiro...@gmail.com > >>>>>>>>>>> <mailto:stiro...@gmail.com>>; > >>>>>>>>>>> Fernando Igoa <fer.igoa.1...@gmail.com > >>>>>>>>>>> <mailto:fer.igoa.1...@gmail.com>> > >>>>>>>>>>> *Cc:* Rietveld List (rietveld_l@ill.fr > >>>>>>>>>>> <mailto:rietveld_l@ill.fr>) <rietveld_l@ill.fr > >>>>>>>>>>> <mailto:rietveld_l@ill.fr>> > >>>>>>>>>>> *Subject:* RE: [EXT] Re: [External] Re: Step-like basline > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> I agree with a Ni absorption edge, possibly with a Kβ peak > >>>>>>>>>>> around 38° 2θ. > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> *Tom Gegan* > >>>>>>>>>>> Chemist III > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> Phone: +1 732 205-5111, Email: tom.ge...@basf.com > >>>>>>>>>>> <mailto:tom.ge...@basf.com> > >>>>>>>>>>> Postal Address: BASF Corporation, , 25 Middlesex Essex > >>>>>>>>>>> Turnpike, 08830 > >>>>>>>>>>> Iselin, United States > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> *From:* rietveld_l-requ...@ill.fr > >>>>>>>>>>> <mailto:rietveld_l-requ...@ill.fr> > >>>>>>>>>>> <rietveld_l-requ...@ill.fr > >>>>>>>>>>> <mailto:rietveld_l-requ...@ill.fr>> *On Behalf > >>>>>>>>>>> Of *Bish, David L > >>>>>>>>>>> *Sent:* Sunday, September 3, 2023 7:08 AM > >>>>>>>>>>> *To:* Shay Tirosh <stiro...@gmail.com > >>>>>>>>>>> <mailto:stiro...@gmail.com>>; Fernando Igoa < > >>>>>>>>>>> fer.igoa.1...@gmail.com <mailto:fer.igoa.1...@gmail.com>> > >>>>>>>>>>> *Cc:* Rietveld List (rietveld_l@ill.fr > >>>>>>>>>>> <mailto:rietveld_l@ill.fr>) <rietveld_l@ill.fr > >>>>>>>>>>> <mailto:rietveld_l@ill.fr>> > >>>>>>>>>>> *Subject:* [EXT] Re: [External] Re: Step-like basline > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> Some people who received this message don't often get email > from > >>>>>>>>>>> b...@indiana.edu <mailto:b...@indiana.edu>. Learn why this > >>>>>>>>>>> is important > >>>>>>>>>>> < > https://urldefense.com/v3/__https:/aka.ms/LearnAboutSenderIdentification__;!!IKRxdwAv5BmarQ!fFhSHn4S5iEzkW-O9lvWG-OzoqK_2SKhRniGa71nxuOL3GcxiyD83i2mnNN0Z48HPkn4zjKqH-aqqA$ > > > >>>>>>>>>>> > >>>>>>>>>>> Hello Shay, > >>>>>>>>>>> > >>>>>>>>>>> I think it is probably related to "tube tails". You can > >>>>>>>>>>> read about this in > >>>>>>>>>>> the literature (e.g., on the BGMN web site) and you can > >>>>>>>>>>> model it in some > >>>>>>>>>>> Rietveld software such as Topas. You don't normally notice > >>>>>>>>>>> this but it > >>>>>>>>>>> becomes apparent with higher-intensity peaks. > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> Regards, > >>>>>>>>>>> > >>>>>>>>>>> Dave > >>>>>>>>>>> ------------------------------ > >>>>>>>>>>> > >>>>>>>>>>> *From:* rietveld_l-requ...@ill.fr > >>>>>>>>>>> <mailto:rietveld_l-requ...@ill.fr> > >>>>>>>>>>> <rietveld_l-requ...@ill.fr > >>>>>>>>>>> <mailto:rietveld_l-requ...@ill.fr>> on behalf > >>>>>>>>>>> of Fernando Igoa <fer.igoa.1...@gmail.com > >>>>>>>>>>> <mailto:fer.igoa.1...@gmail.com>> > >>>>>>>>>>> *Sent:* Sunday, September 3, 2023 3:06 AM > >>>>>>>>>>> *To:* Shay Tirosh <stiro...@gmail.com <mailto: > stiro...@gmail.com>> > >>>>>>>>>>> *Cc:* Rietveld List (rietveld_l@ill.fr > >>>>>>>>>>> <mailto:rietveld_l@ill.fr>) <rietveld_l@ill.fr > >>>>>>>>>>> <mailto:rietveld_l@ill.fr>> > >>>>>>>>>>> *Subject:* [External] Re: Step-like basline > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> This message was sent from a non-IU address. Please > >>>>>>>>>>> exercise caution when > >>>>>>>>>>> clicking links or opening attachments from external sources. > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> Hey Shay, > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> Are you using a motorized slit during the measurement? > >>>>>>>>>>> These may open up > >>>>>>>>>>> abruptly to compensate for the angular dependence of the > >>>>>>>>>>> footprint and thus > >>>>>>>>>>> generate an abrupt increase in the intensity. > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> Hope it helps :) > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> On Sun, Sep 3, 2023, 8:50 AM Shay Tirosh > >>>>>>>>>>> <stiro...@gmail.com <mailto:stiro...@gmail.com>> wrote: > >>>>>>>>>>> > >>>>>>>>>>> Dear Rietvelders > >>>>>>>>>>> > >>>>>>>>>>> I am attaching a zoom-in on a diffraction profile. > >>>>>>>>>>> > >>>>>>>>>>> My question is what is the origin of the step-like profile > >>>>>>>>>>> next to a very > >>>>>>>>>>> large reflection peak? > >>>>>>>>>>> > >>>>>>>>>>> Is it a sample preparation problem? > >>>>>>>>>>> > >>>>>>>>>>> Is it part of the baseline? > >>>>>>>>>>> > >>>>>>>>>>> Thanks > >>>>>>>>>>> > >>>>>>>>>>> Shay > >>>>>>>>>>> > >>>>>>>>>>> -- > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>>>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>>>>>>>>>> Please do NOT attach files to the whole list > >>>>>>>>>>> <alan.he...@neutronoptics.com > >>>>>>>>>>> <mailto:alan.he...@neutronoptics.com> > >>>>>>>>>>> > > >>>>>>>>>>> Send commands to <lists...@ill.fr <mailto:lists...@ill.fr>> > >>>>>>>>>>> eg: HELP as the subject with no body > >>>>>>>>>>> text > >>>>>>>>>>> The Rietveld_L list archive is on > >>>>>>>>>>> http://www.mail-archive.com/rietveld_l@ill.fr/ > >>>>>>>>>>> < > https://urldefense.com/v3/__http:/www.mail-archive.com/rietveld_l@ill.fr/__;!!IKRxdwAv5BmarQ!fFhSHn4S5iEzkW-O9lvWG-OzoqK_2SKhRniGa71nxuOL3GcxiyD83i2mnNN0Z48HPkn4zjJTf8rNHg$ > > > >>>>>>>>>>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>>>>>>>>>> > >>>>>>>>>>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>>>>>>>>>> Please do NOT attach files to the whole list > >>>>>>>>>>> <alan.he...@neutronoptics.com > >>>>>>>>>>> <mailto:alan.he...@neutronoptics.com> > >>>>>>>>>>> > > >>>>>>>>>>> Send commands to <lists...@ill.fr <mailto:lists...@ill.fr>> > >>>>>>>>>>> eg: HELP as the subject with no body > >>>>>>>>>>> text > >>>>>>>>>>> The Rietveld_L list archive is on > >>>>>>>>>>> http://www.mail-archive.com/rietveld_l@ill.fr/ > >>>>>>>>>>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>>>>>>>>>> > >>>>>>>>>>> > >>>>>>>>> > >>>>>>>>> > >>>>>>>>> -- > >>>>>>>>> TU Bergakademie Freiberg > >>>>>>>>> Dr. R. Kleeberg > >>>>>>>>> Mineralogisches Labor > >>>>>>>>> Brennhausgasse 14 > >>>>>>>>> D-09596 Freiberg > >>>>>>>>> > >>>>>>>>> Tel. ++49 (0) 3731-39-3244 > >>>>>>>>> Fax. ++49 (0) 3731-39-3129 > >>>>>>>>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>>>>>>>> Please do NOT attach files to the whole list > >>>>>>>>> <alan.he...@neutronoptics.com > >>>>>>>>> <mailto:alan.he...@neutronoptics.com>> > >>>>>>>>> Send commands to <lists...@ill.fr <mailto:lists...@ill.fr>> > >>>>>>>>> eg: HELP as the subject with no body text > >>>>>>>>> The Rietveld_L list archive is on > >>>>>>>>> http://www.mail-archive.com/rietveld_l@ill.fr/ > >>>>>>>>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>>>>>>>> > >>>>>>>> > >>>>>>>> > >>>>>>>> -- > >>>>>>>> ______________________________________________ > >>>>>>>> Dr Alan Hewat, NeutronOptics, Grenoble, FRANCE > >>>>>>>> <alan.he...@neutronoptics.com > >>>>>>>> <mailto:alan.he...@neutronoptics.com>> +33.476.98.41.68 > >>>>>>>> http://www.NeutronOptics.com/hewat > >>>>>>>> <http://www.neutronoptics.com/hewat> > >>>>>>>> <http://www.neutronoptics.com/hewat> > >>>>>>>> ______________________________________________ > >>>>>> > >>>>>> > >>>>>> -- TU Bergakademie Freiberg > >>>>>> Dr. R. Kleeberg > >>>>>> Mineralogisches Labor > >>>>>> Brennhausgasse 14 > >>>>>> D-09596 Freiberg > >>>>>> > >>>>>> Tel. ++49 (0) 3731-39-3244 > >>>>>> Fax. ++49 (0) 3731-39-3129 > >>>>>> > >>>>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>>>> Please do NOT attach files to the whole list > >>>>> <alan.he...@neutronoptics.com > >>>>> <mailto:alan.he...@neutronoptics.com>> > >>>>> Send commands to <lists...@ill.fr <mailto:lists...@ill.fr>> eg: > >>>>> HELP as the subject with no body text > >>>>> The Rietveld_L list archive is on > >>>>> http://www.mail-archive.com/rietveld_l@ill.fr/ > >>>>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>> > >>> > >>> -- > >>> TU Bergakademie Freiberg > >>> Dr. R. Kleeberg > >>> Mineralogisches Labor > >>> Brennhausgasse 14 > >>> D-09596 Freiberg > >>> > >>> Tel. ++49 (0) 3731-39-3244 > >>> Fax. ++49 (0) 3731-39-3129 > >>> > >>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>> Please do NOT attach files to the whole list > <alan.he...@neutronoptics.com> > >>> Send commands to <lists...@ill.fr> eg: HELP as the subject with no > >>> body text > >>> The Rietveld_L list archive is on > >>> http://www.mail-archive.com/rietveld_l@ill.fr/ > >>> ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > >>> > > > > > > -- > > TU Bergakademie Freiberg > > Dr. R. Kleeberg > > Mineralogisches Labor > > Brennhausgasse 14 > > D-09596 Freiberg > > > > Tel. ++49 (0) 3731-39-3244 > > Fax. ++49 (0) 3731-39-3129 > > > -- > TU Bergakademie Freiberg > Dr. R. Kleeberg > Mineralogisches Labor > Brennhausgasse 14 > D-09596 Freiberg > > Tel. ++49 (0) 3731-39-3244 > Fax. ++49 (0) 3731-39-3129 > > ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > Please do NOT attach files to the whole list <alan.he...@neutronoptics.com > > > Send commands to <lists...@ill.fr> eg: HELP as the subject with no body > text > The Rietveld_L list archive is on > http://www.mail-archive.com/rietveld_l@ill.fr/ > ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > > -- Dr. Shay Tirosh Materials Scientist. With focusing on Photovoltaics, Electrochemistry, Thin film coatings, and nanotechnology. Mobile: +972-(0)54-8834533 Email: stiro...@gmail.com <stiro...@gmail.com>
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