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helo everybody,
I joined this mailing list recently. I am working on heteroepitaxial growth of InSb on Si substrates. I am in search of some software which could help to analyze our films for determining the 'epitaxial quality' (from the ratio of corresponding peaks, change in FWHM of the substrate peak, presence of peaks other than epitaxial, etc.) of the films. At present I am doing all these manually. The machine I am using is a RIGAKU DMAX-1000. your advise would be very helpful for me, with best regards Rao |
- <none> laurent Chapon
- <none> Leigh Nixon
- <none> Jose A. Gavira-Gallardo
- <none> Le Bail Armel
- <none> Leigh Nixon
- <none> Leigh Nixon
- <none> Jose A. Gavira-Gallardo
- <none> Hervé Brequel
- Re: <none> L. Cranswick
- <none> Mr. Digamber Porob
- <none> Venkateswara Rao
- <none> Quirina I. Roode-Gutzmer
- <none> Mr. Digamber Porob
- Re: <none> Jon Wright
- <none> Le Bail Armel
- <none> yves.Feutelais
- Re: Koalariet on WinNT L. Cranswick
- <none> jie shao cis stnt
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- ORFEE Andre Van Moer
- <none> alb
