Hi all,
At 09:25 AM 11/9/98 -0500, I wrote:
>Hi,
>
----------------------snip------------------------
>
>I have developed and written up a strategy addressing the refinement of
>profile coefficients for Rietveld analysis of conventional X-ray powder
>data using GSAS. Its basic premise is the separation of the instrumental
>terms from the sample related ones and involves the use of SRMs for
>verification of instrument performance (surprised?). The manuscript is
>part of an update to the workshop notes distributed at "The Design,
>Alignment, Calibration and Performance Characteristics of the Conventional
>Laboratory Diffractometer" presented at Denver last year by myself and Bob
>Cheary. The manuscript will also appear in a book "Industrial Applications
>of X-ray Diffraction" edited by D. Smith and F. Chung. I can send the
>manuscript as a Word97 attachment upon request. I can also sent out an
>full updated a hardcopy of the workshop notes in about a month as we (Bob
>and I) are working on an update at this time.
>
I've gotten a bunch of requests. However, there seems to be some
confusion. I can only send out the manuscript, entitled "Use of NIST
Standard Reference Materials for Characterization of Instrument
Performance", which covers the Rietveld refinement strategy issue as a
Word97 file. The workshop notes are (will be) available in hardcopy only.
If you would like to receive both the manuscript and the workshop notes
please indicate this clearly in your request; otherwise I will just send
you the manuscript as a Word97 attachment.
Regards,
Jim
James P. Cline [EMAIL PROTECTED]
Ceramics Division Voice (301) 975 5793
A256/223 FAX (301) 975 5334
National Institute of Standards and Technology
Gaithersburg, MD 20899 USA
