Hi,
At 12:27 PM 11/9/98 +1100, you wrote:
>At 05:24 PM 03-11-98 -0500, you wrote:
>>At 08:26 PM 11/2/98 EST, you wrote:
>>>Hi,
>>>My questions pertain to refining the profile coefficients. What order do
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>>>Thanks
>>>MIZ
>>>
>> Dear MIZ,
>>
>>The question sounds borring, but is of great importans for everyone, using
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>>
>>Sr. Petrov
>>
>
>Are you suggesting that one tackle the profile fit BEFORE refining atom
>positions, site occupancies, and thermal parameters?
>Dr Sue Kesson
>
I have developed and written up a strategy addressing the refinement of
profile coefficients for Rietveld analysis of conventional X-ray powder
data using GSAS. Its basic premise is the separation of the instrumental
terms from the sample related ones and involves the use of SRMs for
verification of instrument performance (surprised?). The manuscript is
part of an update to the workshop notes distributed at "The Design,
Alignment, Calibration and Performance Characteristics of the Conventional
Laboratory Diffractometer" presented at Denver last year by myself and Bob
Cheary. The manuscript will also appear in a book "Industrial Applications
of X-ray Diffraction" edited by D. Smith and F. Chung. I can send the
manuscript as a Word97 attachment upon request. I can also sent out an
full updated a hardcopy of the workshop notes in about a month as we (Bob
and I) are working on an update at this time.
Regards,
Jim
James P. Cline [EMAIL PROTECTED]
Ceramics Division Voice (301) 975 5793
A256/223 FAX (301) 975 5334
National Institute of Standards and Technology
Gaithersburg, MD 20899 USA
