On Wed, Jan 29, 2025 at 12:44 PM vignesh C <vignes...@gmail.com> wrote: > > On Tue, 28 Jan 2025 at 17:28, Nisha Moond <nisha.moond...@gmail.com> wrote: > > > > Please find the attached v64 patches. The changes in this version > > w.r.t. older patch v63 are as - > > - The changes from the v63-0001 patch have been moved to a separate thread > > [1]. > > - The v63-0002 patch has been split into two parts in v64: > > 1) 001 patch: Implements the main feature - inactive timeout-based > > slot invalidation. > > 2) 002 patch: Separates the TAP test "044_invalidate_inactive_slots" > > as suggested above. > > Currently the test takes around 220 seconds for me. We could do the > following changes to bring it down to around 70 to 80 seconds: >
Even then it is too long for a single test to be part of committed code. So, we can temporarily reduce its time but fixing comments on this is not a good use of time. We need to write this test in some other way if we want to see it committed. -- With Regards, Amit Kapila.
