Hi Nute,

The 800 Volt pulse can be increased in amplitude easily to 3,000 Volts by a 
resonance in the EMI filter possibly involving characteristics of the 
transformer. Only need a “Q” of 4 to do it. That is my worry that the safety 
community missed this effect which is easy to recreate in the lab. A breakdown 
is happening, the only question is can it cause a permanent problem.

Doug Smith
Sent from my iPhone
IPhone: 408-858-4528
Office: 702-570-6108
Email: d...@dsmith.org
Website: http://dsmith.org
________________________________
From: Richard Nute <ri...@ieee.org>
Sent: Tuesday, March 4, 2025 4:21:30 PM
To: doug emcesd.com <d...@emcesd.com>; EMC-PSTC@LISTSERV.IEEE.ORG 
<EMC-PSTC@LISTSERV.IEEE.ORG>
Subject: RE: [PSES] major safety issue possibly affecting 20% of the electronic 
devices in use

Hi Doug: In a two-wire product, the Y-caps (if any, pri-sec connected) and xfmr 
pri-sec insulation are rated and tested for 3,000 volts rms. (The solid 
insulation in the xfmr is probably about 8,000 volts.) I doubt that either 
would be damaged
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Hi Doug:



In a two-wire product, the Y-caps (if any, pri-sec connected) and xfmr pri-sec 
insulation are rated and tested for 3,000 volts rms.  (The solid insulation in 
the xfmr is probably about 8,000 volts.)  I doubt that either would be damaged 
by an 800-volt pulse applied between the output and the primary.



Best regards,

Rich



From: doug emcesd.com <d...@emcesd.com>
Sent: Tuesday, March 4, 2025 2:51 PM
To: ri...@ieee.org; EMC-PSTC@LISTSERV.IEEE.ORG
Subject: RE: [PSES] major safety issue possibly affecting 20% of the electronic 
devices in use



Hi Rich,



Just had a thought, if the EMI filter is doing the breakdown, there is a chance 
it will eventually become a short circuit on the power leads. I have never seen 
this happen before so that may point to a different mechanism.



Doug

[https://lh4.googleusercontent.com/_HuR3Ky2TF_XhFHyxnYRmiq7nHQldnMsPNYFaLG6kb5T4y8MeCe-BDC_BscJtSFgszSSjssihHS-pjM3-jwNP8S0CwE-gN8fsRsPkojiAlmpBwb20vIVizS-siCUywW_jqrefbVr]

From: Richard Nute <ri...@ieee.org<mailto:ri...@ieee.org>>
Sent: Monday, March 3, 2025 14:56
To: EMC-PSTC@LISTSERV.IEEE.ORG<mailto:EMC-PSTC@LISTSERV.IEEE.ORG>
Subject: Re: [PSES] major safety issue possibly affecting 20% of the electronic 
devices in use





Wrong attachment.  Correct attachment here.

Rich







From: Richard Nute <ri...@ieee.org<mailto:ri...@ieee.org>>
Sent: Sunday, March 2, 2025 3:35 PM
To: EMC-PSTC@LISTSERV.IEEE.ORG<mailto:EMC-PSTC@LISTSERV.IEEE.ORG>
Subject: Re: [PSES] major safety issue possibly affecting 20% of the electronic 
devices in use





Hi Doug:



Thinking about your findings, one of the specific explanations or accountings 
for the change in power supply response may be something like this.  Consider 
the attached “schematic” of a typical two-wire direct plug-in power supply.  
Your test set-up is to apply an 800-volt pulse to one pole of the output while 
connecting one or both poles of the primary to ground.  The pulse then appears 
(divides) across the secondary circuit, the transformer, and the primary 
circuit.  You monitor the current waveform from the pulse generator to the 
power supply.  (The 138 k resistances in my schematic represent the worst-case 
-- lowest impedance at 60 Hertz -- Y-capacitors.)  The pulses after the initial 
pulse are from the power supply.  (What is the output impedance of the pulse 
generator after it outputs the pulse?)



We don’t know what circuits and components are in the boxes, “rect & reg” and 
“smps.”  However, we can guess that the “rect & reg” box has a series 
transistor and several capacitors.  And, the 138 k resistors are in actuality 
capacitors.  Capacitors will be charged (over-charged?) to some extent by the 
pulse.  These will discharge, generating pulses back to the source.  The 
semiconductors in the circuit will probably be deteriorated by the 800-volt 
pulse such that subsequent applications of the 800-volt pulse will have 
different impedances.  And, it will take some time for the semiconductors to 
react to the pulse.  Resistors subject to overvoltage may also be damaged.  
However, the 238 k (minimum at 60 Hz) Y-capacitors will not be subject to a 
voltage exceeding their ratings (at least 1,500 volts rms).  Likewise, the 
transformer insulation will not be subjected to insulation damage voltage.  
(Note that the transformer doesn’t act as a transformer for the 800-volt pulse.)



My conjecture analysis (above) continues to be that the “protective separation” 
has not been damaged by the 800-volt pulse.  The secondary events are due to 
discharge of the components in the power supply.



Best regards,

Rich







From: doug emcesd.com <d...@emcesd.com<mailto:d...@emcesd.com>>
Sent: Saturday, March 1, 2025 11:38 AM
To: ri...@ieee.org<mailto:ri...@ieee.org>; 
EMC-PSTC@LISTSERV.IEEE.ORG<mailto:EMC-PSTC@LISTSERV.IEEE.ORG>
Subject: RE: [PSES] major safety issue possibly affecting 20% of the electronic 
devices in use



Hi Rich,



I forgot to adequately answer your question of why I tested the supply 
unpowered.



I always try to get at the simplest configuration that elicits the effect. In 
this case I made the first discovery of the effect on the power cable of a 
small router that I was debugging for ESD issues. The power supply of the 
router was a small AC plug variety.



After a few minutes I realized that I could get the effect with the power 
supply laying on the table not connected to anything, just the ESD gun 
connected across the mains and output of the supply. The removal of the AC 
power enabled much more control over the test setup and led to information 
about the issue than would not have been possible with the mains connected.



For instance, the total path on the table of the ESD gun and router connections 
was about two meters. The observed multiple ESD responses of the power supply 
from a single ESD event were mostly in the hundreds of nanoseconds in 
separation, too long for the path on the table but what I would expect for a 
resonant circuit to break over a barrier. BUT, close examination of the train 
of pulses generated by the power supply found some cable discharge events (I 
can tell they are cable discharge events by the waveshape) whose 
characteristics are just what I would expect from the discharge of a 2 meter 
cable!!! I would never have been able to make that observation with the power 
cable connected. So… the barrier was affected not only by internal resonances 
in the power supply but breakdowns appear to be happening via cable discharge 
as well!



I always whittle the test setup down the simplest one I can that exhibits the 
desired response.



My philosophy carries over as well to debugging high frequency immunity tests 
such as ESD, EFT, radiated immunity, and conducted immunity. In those tests, my 
approach is to make all the mechanisms at play in causing the problem (and 
there are often multiple mechanisms that interact with each other) orthogonal 
to each other, meaning independent, so I can fix one at a time and know how 
much of the problem was due to each mechanism. This is not done on the standard 
test setup but on an engineering bench using techniques I developed over the 
years. Some of these are described on my website and more are in my courses 
(like the one at the end of this month),  in more detail.



Debugging an immunity problem using the standards-based test, like applying ESD 
while trying to find the ESD problem, generally is very time consuming and 
usually does not lead to understanding of the mechanisms. People try to do this 
and often find something that works, but they rarely understand the total 
effect of what was done and that can lead to more problems in the field later 
on. This approach is like throwing darts at the wall with the target covered by 
a sheet.



Design of experiments is extremely important but sometimes ignored in the 
engineering world.



Doug

[https://lh4.googleusercontent.com/_HuR3Ky2TF_XhFHyxnYRmiq7nHQldnMsPNYFaLG6kb5T4y8MeCe-BDC_BscJtSFgszSSjssihHS-pjM3-jwNP8S0CwE-gN8fsRsPkojiAlmpBwb20vIVizS-siCUywW_jqrefbVr]

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