dear all,
I am doing the size-strain analysis on the XRD whole pattern profile
from zircaloy sample using bruker axs diffractometer with Lynx-Eye detector.
The XRD profile we got is very good with a maximum of 78000 counts on the main
peak(101 plain). the profiel fits well in gsas. but
ject: RE: question on size-strain analysis - question for Fullprof users
> To: rietveld_l@ill.fr
> Date: Thursday, November 13, 2008, 1:00 PM
> Dear Leonid,
> thank you very much. Indeed it is not "really
> simple": averaging procedure is not straightforward...
>
>
TECTED]>
> Subject: RE: question on size-strain analysis
> To: rietveld_l@ill.fr
> Date: Thursday, November 13, 2008, 6:47 AM
> Dear colleagues,
>
> I would like first to thank everybody who responded to my
> question on
> Gaussian size broadening.
>
> And now would lik
ofile
> parameters (e.g. P and X in TCH PV).
> But once you have refined values for both P and X, you
> easily calculate
> "Lorentzian size" and "Gaussian size" -
> but (citing Woodward's lecture on
> size-strain analysis),
> "it is not immediatel
(citing Woodward's lecture on
size-strain analysis),
"it is not immediately clear to me how to combine these results and get an
accurate estimate of the crystallite size (though perhaps there may be a
good way to do this)"
Can anybody suggest such "good way"? Th
- Original Message -
From: "Leonid Solovyov" <[EMAIL PROTECTED]>
To:
Sent: Tuesday, October 21, 2008 3:23 PM
Subject: Re: question on size-strain analysis
Hi Nicolae,
Nice to hear from you!
I couldn't help noting that in reality your emergence in the Rietveld list
is si
ROTECTED]> wrote:
> From: Nicolae Popa <[EMAIL PROTECTED]>
> Subject: Re: question on size-strain analysis
> To: [EMAIL PROTECTED], rietveld_l@ill.fr
> Date: Tuesday, October 21, 2008, 11:39 AM
> Hi,
>
> Besides strain and instrument also size broadening can be
> close
Subject: question on size-strain analysis
Dear colleagues,
I have a probably very basic question related to size-strain analysis:
we have a pattern of a nanocrystalline oxide, which shows (from
Williamson-Hall plot) almost purely size broadening, and shape of
reflections is to good accuracy Gau
(self
citation) and other ref. cited there (Langford, Louer, Scardi (2000))
Best,
Nicolae Popa
- Original Message -
From: "Leonid Solovyov" <[EMAIL PROTECTED]>
To:
Sent: Tuesday, October 21, 2008 10:04 AM
Subject: Re: question on size-strain analysis
Dear Maxim,
Gau
: question on size-strain analysis
> To: rietveld_l@ill.fr
> Cc: "Дмитрий А. Павлов" <[EMAIL PROTECTED]>
> Date: Tuesday, October 21, 2008, 7:20 AM
> Dear colleagues,
>
> I have a probably very basic question related to
> size-strain analysis:
>
> we h
Dear colleagues,
I have a probably very basic question related to size-strain analysis:
we have a pattern of a nanocrystalline oxide, which shows (from
Williamson-Hall plot) almost purely size broadening, and shape of
reflections is to good accuracy Gaussian.
I am curious what type of
In a message dated 05/19/2000 12:53:29 PM Pacific Daylight Time,
[EMAIL PROTECTED] writes:
<< Can anyone recommend literature references for
size/strain analysis on "organic" (C, H, O, N)
phases? >>
Do you include polymers which are organic? Then the treatments by H
Can anyone recommend literature references for
size/strain analysis on "organic" (C, H, O, N)
phases?
(this is for Crystallite size/strain - not
particle size determination)
Plus are there any suggestions on information on
sample presentation methods if using Bragg Brentano
i
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