Wojciech pointed out an important issue regarding ADS measurements:
Wojciech Paszkowicz schrieb:
Dear All,
Additional comment concerning the usefulness of variable slits for structure
refinement: The angular distribution of the radiation from an X-ray tube is
not necessarily uniform, so using
Dear All,
Additional comment concerning the usefulness of variable slits for structure
refinement: The angular distribution of the radiation from an X-ray tube is
not necessarily uniform, so using variable slits for collection of
Rietveld-refined (Bragg-Brentano geometry) data may imply the need f
Dear Rietvelders,
As an addition to the remarks made already, I would like to mention a few
other cases where variable slits can be useful:
- when performing diffraction measurements at elevated temperatures using
non-ambient chambers with heating strips: the use of a constant irradiated
area
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-Original Message-
From: Reinhard Kleeberg [mailto:[EMAIL PROTECTED]
Sent: Wednesday, 8 August 2007 2:01 AM
To: rietveld_l@ill.fr
Subject: Re: fixed slits
Hi,
as William Bisson stated, the main purpose of automatic divergence slits
is to enhance the intensities at higher angles. But, the changes in
intensity and profile shape compared to fixed slit systems are no
mysterium. They can calulated and introduced into the refinement.
However, some (?)
s
Therefore, it is explicitely recommended to use automatic divergence slits in
structure refinement and phase analysis."
- Original Message -
From: [EMAIL PROTECTED]
To: rietveld_l@ill.fr
Date: Tue, 07 Aug 2007 16:15:59 +0100
Subject: Re: fixed slits or fixed radiated length B
Dear Silvina,
The purpose of divergence slits is to increase the intensities of
reflections at
high angle, the flip side is an increase in background and peak
broadening (that
will extenuate peak overlap) at high angle.
For structural work it is best to stay with fixed slits, no
modification
Hi,
I have a question regarding the use of fixed radiated length data in a
laboratory powder diffractometer, with Bragg-Brentano geometry and programmable
divergence and antiscatter/receiving slits, which can also be used in the
"fixed slit" mode (in which the irradiated length on the sample var
