Hi Tony
>My I ask is this re-bined data from the measurement software considered as "raw data" or "treated data"? I'm not sure what is meant by treated data. Almost all neutron data and synchrotron data with area detectors are "treated data". If the detector has a slit width in the equatorial plane that is 0.03 degrees 2Th then it makes little sense using a step size that is less than 0.03/2 degrees 2Th. If rebinning is done correctly (see rebin_with_dx_of in the Technical Reference) then rebinning is basically collecting redoing the experiment with a wider slit. In the case of your PSD then the resolution of the PSD would be the smallest slit width. If the data has broad features relative to the slit width then rebinning (or using a bigger slit width) should not change the results. You could simulate all this using TOPAS to see the difference. Correct rebinning should not affect parameter errors. This is a question that is not simple to answer and if there's concern then: 1. Simulating data with the small step size and performing a fit 2. And then rebinning with various slit widths and then fitting 3. And then comparing parameters errors and parameter values for all the refinements should shine light on the area. I don't know where but I feeling is that there should be papers on this. Cheers Alan From: rietveld_l-requ...@ill.fr <rietveld_l-requ...@ill.fr> On Behalf Of iangie Sent: Thursday, September 26, 2019 1:40 PM To: rietveld_l@ill.fr Subject: Software re-binned PD data Dear Rietvelder, I hope you are doing well. It is generally acknolwdged that Rietveld refinement should be performed on raw data, without any data processing. One of our diffractometer/PSD scans data at its minimal step size (users can see that the step size during scan is much smaller than what was set), and upon finishing, the measurement software re-bin the counts to the step size what users set (so the data also looks smoother, after re-bin). My I ask is this re-bined data from the measurement software considered as "raw data" or "treated data"? And can we apply Rietveld refinement on this data? Any comments are welcome. :) -- Dr. Xiaodong (Tony) Wang Research Infrastructure Specialist (XRD) Central Analytical Research Facility (CARF) | Institute for Future Environments Queensland University of Technology
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