Hi. You can do that, of course, but you have to choose: you can use Zero error OR sample displacement, but never use both (this induces some physical impossibilities). However, I assume your diffractometer is calibrated, and the zero position of the detector is fine; the sample displacement may (I suppose) be connected with preparation-derived errors, and I'd use the latter parameter instead of the zero error.
Hope this helps anyhow. Good luck! Luke Kruszewski > Dear all, > > I am using Si as internal standard to calibrate my pattern. Should I > refine > the "Zero error" of the diffractometer if I am using the calibrated > pattern? > > Thanks a lot, > > Ana > > > > Dra. Ana Isabel Becerro > > Instituto de Ciencia de Materiales de Sevilla > > CSIC-US > > > > > > > > --- > El software de antivirus Avast ha analizado este correo electrónico en > busca de virus. > https://www.avast.com/antivirus > ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > Please do NOT attach files to the whole list > <[email protected]> > Send commands to <[email protected]> eg: HELP as the subject with no body > text > The Rietveld_L list archive is on > http://www.mail-archive.com/[email protected]/ > ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > > -- Łukasz Kruszewski, Ph.D., adjunct Polish Academy of Sciences Institute of Geological Sciences Twarda 51/55 str. 00-818 Warsaw Poland
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