Dear mailing list,
 
Would anyone be able to help me with a problem I am having refining some data 
using TOPAS on a lab X-ray pattern?
 
The diffraction patterns collected show a large amount of asymmetry in the 
first couple of (low angle) peaks.
 
The diffractometer contribution to the profile was determined from refinement 
of a quartz standard and the sample dependent broadening was then modelled 
using the PV-II function within TOPAS. Axial convergence parameters were used 
to model the angle-dependent asymmetry.
 
Unfortunately the asymmetry of the first, lowest angle peak is still being 
fitted very poorly. Are there any other parameters or tricks that will help to 
model this asymmetry?
 
Many thanks for any help you have,
Alex 
 
P.S. Additionally, the data was collected using a Bruker D8 Advantix 
diffractometer in capillary geometry, with a Cu source, a Ge(111) 
monochromator, secondary soller slits (2.5 degrees) and an linear PSD. 
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