Dear Jim,
On Tue, 28 Mar 2000 10:47:51 -0500, Jim Cline wrote:
>This is interesting; I've not seen it (nor have I looked for it).
>
>I have been investigating the "Kalpha3" matter in the course of the
certification of SRMs 640c (silicon) and 660a (LaB6) using the FPA code Topas.
I'll reporting on this at EPDIC7.
>
We have had an oral presentation on ECRS 5 (Sep 1999, Netherlands) entitled
"Advanced fundamental parameters model for improved profile analysis".
There, we have certified SRM 660 (LaB6) by 4 different
diffractometer set-ups, all computations tube-tails corrected. The results
will appear in Material Science Forum, Trans Tech Publications (same series
as for EPDIC). Here, I cite from the results:
Goniometer | XRD 3000 TT | XRD 3000 TT | XRD 3000 TT | URD 6 |
| | | | |
Radiation | Cu Kalpha12 | Cu Kalpha12 | Cu Kalpha12 | Co Kalpha12 |
| | | | |
Tube Type | AEG | Siemens | Siemens | Philips |
| |(Rudolstadt) |(Rudolstadt) | |
| | | | |
equatorial | fixed | fixed | ADS | fixed |
divergence | | | | |
| | | | |
size | 884(31)nm | 793(23)nm | 824(21)nm | 944(34)nm |
| | | | |
micro | 0.000115(8) | 0.000105(8) | 0.000113(6) | 0.000096(10)|
strain | | | | |
All wavelength data are from
G. H"olzer, M. Fritsch, M. Deutsch, J. H"artwig, E. F"orster;
Phys. Rev. {56} (1997), 4554-4568
which, at our opinion, are the most advanced available data.
J"org Bergmann
