06/11/2018 16:46, Zhang, Qi Z: > From: Thomas Monjalon [mailto:tho...@monjalon.net] > > > > Hi, > > > > 06/11/2018 01:31, Qi Zhang: > > > When probe the same device at second time > > > > Sorry I stop on this first sentence. > > How and why do you probe a vdev twice? > > if we do rte_dev_hotplug_add or rte_dev_proble on a probed device. (yes, this > is not usually what an application want, but it can happen by miss-operation, > and this is covered by our test case, it make sense to me that hotplug API > should be robust enough to handle that situation.)
Yes I agree we must handle this situation. > we will failed at the second time as expected, > but will not able to detach the device any more, since during the second > scan, original vdev->device.devargs is corrupted. The root cause is we remove a devargs which was referenced. Could we overwrite the first devargs instead of removing it?
