> -----Original Message-----
> From: Thomas Monjalon [mailto:tho...@monjalon.net]
> Sent: Tuesday, November 6, 2018 2:01 AM
> To: Zhang, Qi Z <qi.z.zh...@intel.com>
> Cc: dev@dpdk.org; gaetan.ri...@6wind.com; Yigit, Ferruh
> <ferruh.yi...@intel.com>
> Subject: Re: [dpdk-dev] [PATCH] bus/vdev: fix probe same device twice
>
> Hi,
>
> 06/11/2018 01:31, Qi Zhang:
> > When probe the same device at second time
>
> Sorry I stop on this first sentence.
> How and why do you probe a vdev twice?
>
>
if we do rte_dev_hotplug_add or rte_dev_proble on a probed device. (yes, this
is not usually what an application want, but it can happen by miss-operation,
and this is covered by our test case, it make sense to me that hotplug API
should be robust enough to handle that situation.)
we will failed at the second time as expected,
but will not able to detach the device any more, since during the second scan,
original vdev->device.devargs is corrupted.
Btw as Gaetan mentioned below proposal
https://mails.dpdk.org/archives/dev/2018-November/118274.html
is that will be covered in 18.11, I think it's better to have a fix for this
issue in 18.11 anyway.
even the proposed idea is not able be covered in this release, we can roll back
the word around fix when its ready.
What do you think?
