On Fri, 23 Jun 2023 20:00:12 GMT, Glavo <d...@openjdk.org> wrote:
> Using `ByteArrayLittleEndian` is simpler and faster.
>
> `make test TEST="micro:java.util.zip.ZipFileOpen"`:
>
>
> Benchmark (size) Mode Cnt Score Error Units
> - ZipFileOpen.openCloseZipFile 512 avgt 15 39052.832 ± 107.496 ns/op
> + ZipFileOpen.openCloseZipFile 512 avgt 15 36275.539 ± 663.193 ns/op
> - ZipFileOpen.openCloseZipFile 1024 avgt 15 77106.494 ± 4159.300 ns/op
> + ZipFileOpen.openCloseZipFile 1024 avgt 15 71955.013 ± 2296.050 ns/op
src/java.base/share/classes/jdk/internal/util/ByteArrayLittleEndian.java line
150:
> 148: public static long getUnsignedInt(byte[] array, int offset) {
> 149: return Integer.toUnsignedLong((int) INT.get(array, offset));
> 150: }
Hello Glavo, I was going to recommend adding a test method to existing jtreg
tests to test these new methods. But it looks like there's no jtreg test for
this `ByteArrayLittleEndian` class. Would you mind creating a new test class to
(at least) test these methods?
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PR Review Comment: https://git.openjdk.org/jdk/pull/14632#discussion_r1240603525
