On Thursday, August 18, 2011 01:00:21 PM Valentin Longchamp wrote:
> On 08/18/2011 12:39 PM, Marek Vasut wrote:
> > On Wednesday, August 03, 2011 02:37:01 PM Valentin Longchamp wrote:
> >> The current post_log_word in global data is currently split into 2x
> >> 16 bits: half for the test start, half for the test success.
> >> Since we alredy have more than 16 POST tests defined and more could
> >> be defined, this may result in an overflow and the post_output_backlog
> >> would not work for the tests defined further of these 16 positions.
> >>
> >> An additional field is added to global data so that we can now support
> >> up to 32 (depending of architecture) tests. The post_log_word is only
> >> used to record the start of the test and the new field post_log_res for
> >> the test success (or failure). The post_output_backlog is for this
> >> change also adapted.
> >>
> >> Signed-off-by: Valentin Longchamp <valentin.longch...@keymile.com>
> >
> > [...]
> >
> >> @@ -144,12 +145,12 @@ int post_bootmode_get (unsigned int *last_test)
> >>
> >> /* POST tests run before relocation only mark status bits .... */
> >> static void post_log_mark_start ( unsigned long testid )
> >> {
> >>
> >> - gd->post_log_word |= (testid)<<16;
> >> + gd->post_log_word |= testid;
> >
> > I think you can just assign it if you changed the meaning. Still, what if
> > we will have more than 32 tests?
>
> Yes, this will not work anymore when we have more than 32 tests. But we
> already have more than 16 tests so there was already a flaw. This at least
> corrects this flaw.
>
> The problem is that this has to stay in the global_data that has to remain
> small, so a u32 for bit setting has the great advantage of being small.
I'd love to see a more competent test framework which would run in later stages
of boot. That'll remove the huge load of tests that's on the POST framework.
Detlev, any suggestions ? ;-)
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