On 08/18/2011 12:39 PM, Marek Vasut wrote:
> On Wednesday, August 03, 2011 02:37:01 PM Valentin Longchamp wrote:
>> The current post_log_word in global data is currently split into 2x
>> 16 bits: half for the test start, half for the test success.
>> Since we alredy have more than 16 POST tests defined and more could
>> be defined, this may result in an overflow and the post_output_backlog
>> would not work for the tests defined further of these 16 positions.
>>
>> An additional field is added to global data so that we can now support up
>> to 32 (depending of architecture) tests. The post_log_word is only used
>> to record the start of the test and the new field post_log_res for the
>> test success (or failure). The post_output_backlog is for this change
>> also adapted.
>>
>> Signed-off-by: Valentin Longchamp <valentin.longch...@keymile.com>
>
> [...]
>
>> @@ -144,12 +145,12 @@ int post_bootmode_get (unsigned int *last_test)
>> /* POST tests run before relocation only mark status bits .... */
>> static void post_log_mark_start ( unsigned long testid )
>> {
>> - gd->post_log_word |= (testid)<<16;
>> + gd->post_log_word |= testid;
>
> I think you can just assign it if you changed the meaning. Still, what if we
> will have more than 32 tests?
>
Yes, this will not work anymore when we have more than 32 tests. But we already
have more than 16 tests so there was already a flaw. This at least corrects this
flaw.
The problem is that this has to stay in the global_data that has to remain
small, so a u32 for bit setting has the great advantage of being small.
--
Valentin Longchamp
Embedded Software Engineer
Hardware and Chip Integration
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KEYMILE AG
Schwarzenburgstr. 73
CH-3097 Liebefeld
Phone +41 31 377 1318
Fax +41 31 377 1212
valentin.longch...@keymile.com
www.keymile.com
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