Toshiba THNSNH128GBST SSD attached
smartctl 6.2 2013-07-26 r3841 [FreeBSD 9.2-RELEASE-p3 amd64] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA THNSNH128GBST
Firmware Version: HTRAN101
User Capacity: 128,035,676,160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 (minor revision not indicated)
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Sun Jan 19 19:25:06 2014 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM level is: 254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 8) minutes.
SCT capabilities: (0x0039) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
1 Raw_Read_Error_Rate -O-R-- 100 100 000 - 0
2 Throughput_Performance P-S--- 100 100 050 - 0
3 Spin_Up_Time POS--- 100 100 050 - 0
5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0
7 Unknown_SSD_Attribute PO-R-- 100 100 050 - 0
8 Unknown_SSD_Attribute P-S--- 100 100 050 - 0
9 Power_On_Hours -O--C- 100 100 000 - 2381
10 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
12 Power_Cycle_Count -O--C- 100 100 000 - 3
167 Unknown_Attribute -O---K 100 100 000 - 0
168 Unknown_Attribute -O--C- 100 100 000 - 0
169 Unknown_Attribute PO--C- 100 100 010 - 100
173 Unknown_Attribute -O--C- 200 200 000 - 0
175 Program_Fail_Count_Chip PO--C- 100 100 010 - 0
192 Power-Off_Retract_Count -O--C- 100 100 000 - 0
194 Temperature_Celsius PO---K 075 069 020 - 25 (Min/Max 22/31)
197 Current_Pending_Sector -O--C- 100 100 000 - 0
240 Unknown_SSD_Attribute PO--C- 100 100 050 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Extended offline Completed without error 00% 2373 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 3 (0x0003)
SCT Support Level: 0
Device State: Active (0)
Current Temperature: 25 Celsius
Power Cycle Min/Max Temperature: 22/28 Celsius
Lifetime Min/Max Temperature: 22/31 Celsius
Lifetime Average Temperature: 22 Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: 5/40 Celsius
Min/Max Temperature Limit: 0/80 Celsius
Temperature History Size (Index): 128 (36)
Index Estimated Time Temperature Celsius
37 2014-01-19 17:18 25 ******
... ..( 34 skipped). .. ******
72 2014-01-19 17:53 25 ******
73 2014-01-19 17:54 24 *****
74 2014-01-19 17:55 25 ******
... ..( 4 skipped). .. ******
79 2014-01-19 18:00 25 ******
80 2014-01-19 18:01 24 *****
... ..( 2 skipped). .. *****
83 2014-01-19 18:04 24 *****
84 2014-01-19 18:05 25 ******
85 2014-01-19 18:06 24 *****
86 2014-01-19 18:07 25 ******
87 2014-01-19 18:08 24 *****
... ..( 14 skipped). .. *****
102 2014-01-19 18:23 24 *****
103 2014-01-19 18:24 25 ******
104 2014-01-19 18:25 24 *****
... ..( 35 skipped). .. *****
12 2014-01-19 19:01 24 *****
13 2014-01-19 19:02 25 ******
... ..( 22 skipped). .. ******
36 2014-01-19 19:25 25 ******
SCT Error Recovery Control:
Read: 600 (60.0 seconds)
Write: 600 (60.0 seconds)
Device Statistics (GP Log 0x04)
Page Offset Size Value Description
1 ===== = = == General Statistics (rev 2) ==
1 0x008 4 3 Lifetime Power-On Resets
1 0x018 6 15823696 Logical Sectors Written
1 0x020 6 63920 Number of Write Commands
1 0x028 6 65076 Logical Sectors Read
1 0x030 6 2123 Number of Read Commands
4 ===== = = == General Errors Statistics (rev 1) ==
4 0x008 4 0 Number of Reported Uncorrectable Errors
4 0x010 4 0 Resets Between Cmd Acceptance and Completion
5 ===== = = == Temperature Statistics (rev 1) ==
5 0x008 1 25 Current Temperature
5 0x010 1 23 Average Short Term Temperature
5 0x018 1 24 Average Long Term Temperature
5 0x020 1 31 Highest Temperature
5 0x028 1 22 Lowest Temperature
5 0x030 1 29 Highest Average Short Term Temperature
5 0x038 1 22 Lowest Average Short Term Temperature
5 0x040 1 25 Highest Average Long Term Temperature
5 0x048 1 24 Lowest Average Long Term Temperature
5 0x050 4 0 Time in Over-Temperature
5 0x058 1 40 Specified Maximum Operating Temperature
5 0x060 4 0 Time in Under-Temperature
5 0x068 1 5 Specified Minimum Operating Temperature
6 ===== = = == Transport Statistics (rev 1) ==
6 0x008 4 31 Number of Hardware Resets
6 0x018 4 0 Number of Interface CRC Errors
7 ===== = = == Solid State Device Statistics (rev 1) ==
7 0x008 1 0~ Percentage Used Endurance Indicator
|_ ~ normalized value
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0002 4 0 R_ERR response for data FIS
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0005 4 0 R_ERR response for non-data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 5 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 6 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC
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