Requesting the addition of the Samsung 840 EVO series SSD to be added to the
database.
For what its worth, attribute ID 235 is (according to Samsung’s official
Magician Suite): POR Recovery Count (which is listed as Unknown by smartctl).
smartctl 6.2 2013-07-26 r3841 [x86_64-apple-darwin13.0.0] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Samsung SSD 840 EVO 250GB
Firmware Version: EXT0BB6Q
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Sun Dec 15 00:50:02 2013 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
ATA Security is: Disabled, frozen [SEC2]
Unexpected SCT status 0x0001 (action_code=4, function_code=2)
Wt Cache Reorder: N/A
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0
9 Power_On_Hours -O--CK 099 099 000 - 110
12 Power_Cycle_Count -O--CK 099 099 000 - 19
177 Wear_Leveling_Count PO--C- 100 100 000 - 0
179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0
181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0
182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0
183 Runtime_Bad_Block PO--C- 100 100 010 - 0
187 Reported_Uncorrect -O--CK 100 100 000 - 0
190 Airflow_Temperature_Cel -O--CK 063 057 000 - 37
195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0
199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 0
235 Unknown_Attribute -O--C- 099 099 000 - 13
241 Total_LBAs_Written -O--CK 099 099 000 - 167587989
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not
implemented
Read GP Log Directory failed
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 1 Comprehensive SMART error log
0x06 SL R/O 1 SMART self-test log
0x09 SL R/W 1 Selective self-test log
0x30 SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f SL R/W 16 Host vendor specific log
0xa1 SL VS 16 Device vendor specific log
0xce SL VS 16 Device vendor specific log
0xe0 SL R/W 1 SCT Command/Status
0xe1 SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log (GP Log 0x03) not supported
SMART Error Log Version: 1
No Errors Logged
SMART Extended Self-test Log (GP Log 0x07) not supported
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
SCT Support Level: 1
Device State: Active (0)
Current Temperature: 37 Celsius
Power Cycle Min/Max Temperature: ?/ ? Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/669
SCT Temperature History Version: 2
Temperature Sampling Period: 10 minutes
Temperature Logging Interval: 10 minutes
Min/Max recommended Temperature: ?/ ? Celsius
Min/Max Temperature Limit: ?/ ? Celsius
Temperature History Size (Index): 128 (1)
Index Estimated Time Temperature Celsius
2 2013-12-14 03:40 ? -
... ..(125 skipped). .. -
0 2013-12-15 00:40 ? -
1 2013-12-15 00:50 35 ****************
SMART WRITE LOG does not return COUNT and LBA_LOW register
SCT (Get) Error Recovery Control command failed
Device Statistics (GP Log 0x04) not supported
ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not
implemented
Read SATA Phy Event Counters failed------------------------------------------------------------------------------
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