smartctl does not recognize this drive: | $ smartctl -a /dev/sdb | smartctl 5.41 2011-06-09 r3365 [x86_64-linux-2.6.38.4] (local build) | Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net | | /dev/sdb: Unknown USB bridge [0x07ab:0xfc88 (0x101)] | Smartctl: please specify device type with the -d option. | | Use smartctl -h to get a usage summary
It does, mostly though, when told to use usbjmicron: | $ smartctl -d usbjmicron -a /dev/sdb | smartctl 5.41 2011-06-09 r3365 [x86_64-linux-2.6.38.4] (local build) | Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net | | === START OF INFORMATION SECTION === | Device Model: SAMSUNG HM252HX | Serial Number: C1042F121A031I | LU WWN Device Id: 5 0000f0 01afb1003 | Firmware Version: 2AC101C4 | User Capacity: 250,059,350,016 bytes [250 GB] | Sector Size: 512 bytes logical/physical | Device is: Not in smartctl database [for details use: -P showall] | ATA Version is: 8 | ATA Standard is: ATA-8-ACS revision 6 | Local Time is: Sat Jul 23 16:46:19 2011 CEST | SMART support is: Available - device has SMART capability. | SMART support is: Enabled | | === START OF READ SMART DATA SECTION === | SMART overall-health self-assessment test result: PASSED | | General SMART Values: | Offline data collection status: (0x00) Offline data collection activity | was never started. | Auto Offline Data Collection: Disabled. | Self-test execution status: ( 0) The previous self-test routine completed | without error or no self-test has ever | been run. | Total time to complete Offline | data collection: ( 4200) seconds. | Offline data collection | capabilities: (0x5b) SMART execute Offline immediate. | Auto Offline data collection on/off support. | Suspend Offline collection upon new | command. | Offline surface scan supported. | Self-test supported. | No Conveyance Self-test supported. | Selective Self-test supported. | SMART capabilities: (0x0003) Saves SMART data before entering | power-saving mode. | Supports SMART auto save timer. | Error logging capability: (0x01) Error logging supported. | General Purpose Logging supported. | Short self-test routine | recommended polling time: ( 2) minutes. | Extended self-test routine | recommended polling time: ( 70) minutes. | SCT capabilities: (0x003f) SCT Status supported. | SCT Error Recovery Control supported. | SCT Feature Control supported. | SCT Data Table supported. | | SMART Attributes Data Structure revision number: 16 | Vendor Specific SMART Attributes with Thresholds: | ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE | 1 Raw_Read_Error_Rate 0x002f 100 100 051 Pre-fail Always - 0 | 2 Throughput_Performance 0x0026 252 252 000 Old_age Always - 0 | 3 Spin_Up_Time 0x0023 091 091 025 Pre-fail Always - 2850 | 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 147 | 5 Reallocated_Sector_Ct 0x0033 252 252 010 Pre-fail Always - 0 | 7 Seek_Error_Rate 0x002e 252 252 051 Old_age Always - 0 | 8 Seek_Time_Performance 0x0024 252 252 015 Old_age Offline - 0 | 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 74 | 10 Spin_Retry_Count 0x0032 252 252 051 Old_age Always - 0 | 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 13 | 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 79 | 191 G-Sense_Error_Rate 0x0022 100 100 000 Old_age Always - 38 | 192 Power-Off_Retract_Count 0x0022 252 252 000 Old_age Always - 0 | 194 Temperature_Celsius 0x0002 064 064 000 Old_age Always - 28 (Min/Max 14/42) | 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 0 | 196 Reallocated_Event_Count 0x0032 252 252 000 Old_age Always - 0 | 197 Current_Pending_Sector 0x0032 252 252 000 Old_age Always - 0 | 198 Offline_Uncorrectable 0x0030 252 252 000 Old_age Offline - 0 | 199 UDMA_CRC_Error_Count 0x0036 200 200 000 Old_age Always - 0 | 200 Multi_Zone_Error_Rate 0x002a 100 100 000 Old_age Always - 3 | 223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 13 | 225 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 2013 | | SMART Error Log Version: 1 | No Errors Logged | | SMART Self-test log structure revision number 1 | No self-tests have been logged. [To run self-tests, use: smartctl -t] | | | Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run | SMART Selective self-test log data structure revision number 0 | Note: revision number not 1 implies that no selective self-test has ever been run | SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS | 1 0 0 Completed [00% left] (0-65535) | 2 0 0 Not_testing | 3 0 0 Not_testing | 4 0 0 Not_testing | 5 0 0 Not_testing | Selective self-test flags (0x0): | After scanning selected spans, do NOT read-scan remainder of disk. | If Selective self-test is pending on power-up, resume after 0 minute delay. ------------------------------------------------------------------------------ Storage Efficiency Calculator This modeling tool is based on patent-pending intellectual property that has been used successfully in hundreds of IBM storage optimization engage- ments, worldwide. Store less, Store more with what you own, Move data to the right place. 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