Hello,
Attached is smartctl -a output (following smartctl -t short) for a Samsung
PM810 128GB SSD.
The marketing name for this appears to be "470 Series".
http://www.samsung.com/us/computer/memory-storage/MZ-5PA128/US
smartctl 5.40 2011-01-12 r3242 [x86_64-unknown-linux-gnu] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SSD PM810 2.5" 128GB
Serial Number: S0MYNEAZB00925
Firmware Version: AXM06D1Q
User Capacity: 128,035,676,160 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1
Local Time is: Sun Jan 16 22:18:35 2011 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 840) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 14) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 --- Pre-fail Always
- 0
9 Power_On_Hours 0x0032 099 099 --- Old_age Always
- 165
12 Power_Cycle_Count 0x0032 099 099 --- Old_age Always
- 31
175 Program_Fail_Count_Chip 0x0032 100 100 --- Old_age Always
- 0
176 Erase_Fail_Count_Chip 0x0032 100 100 --- Old_age Always
- 0
177 Wear_Leveling_Count 0x0013 099 099 --- Pre-fail Always
- 1
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 075 075 --- Pre-fail Always
- 496
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 077 077 --- Pre-fail Always
- 906
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 077 077 --- Pre-fail Always
- 3126
181 Program_Fail_Cnt_Total 0x0032 100 100 --- Old_age Always
- 0
182 Erase_Fail_Count_Total 0x0032 100 100 --- Old_age Always
- 0
183 Runtime_Bad_Block 0x0013 100 100 --- Pre-fail Always
- 0
187 Reported_Uncorrect 0x0032 100 100 --- Old_age Always
- 0
195 Hardware_ECC_Recovered 0x001a 200 200 --- Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 100 100 --- Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x003e 253 253 --- Old_age Always
- 0
232 Available_Reservd_Space 0x0013 075 075 --- Pre-fail Always
- 1520
241 Total_LBAs_Written 0x0032 096 096 --- Old_age Always
- 158966869
242 Total_LBAs_Read 0x0032 095 095 --- Old_age Always
- 174040708
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 165 -
# 2 Short offline Completed without error 00% 1 -
# 3 Short offline Completed without error 00% 0 -
# 4 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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