Here is output for this disk to be included in the database
smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: FUJITSU MHT2030AC
Serial Number: NN6ST4512JGK
Firmware Version: 909B
User Capacity: 30.005.821.440 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a
Local Time is: Sat Oct 9 17:44:30 2010 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 220) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 30) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail Always
- 176611
2 Throughput_Performance 0x0005 100 100 030 Pre-fail Offline
- 12386304
3 Spin_Up_Time 0x0003 100 100 025 Pre-fail Always
- 1
4 Start_Stop_Count 0x0032 091 091 000 Old_age Always
- 42736
5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail Always
- 8589934592000
7 Seek_Error_Rate 0x000f 100 100 047 Pre-fail Always
- 1705
8 Seek_Time_Performance 0x0005 100 100 019 Pre-fail Offline
- 0
9 Power_On_Hours 0x0032 019 019 000 Old_age Always
- 146395706
10 Spin_Retry_Count 0x0013 100 100 020 Pre-fail Always
- 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always
- 220
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always
- 194
193 Load_Cycle_Count 0x0032 096 096 000 Old_age Always
- 45569
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always
- 25 (Lifetime Min/Max 15/58)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always
- 259
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always
- 287506432
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always
- 457
200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail Always
- 14698
203 Run_Out_Cancel 0x0002 100 100 000 Old_age Always
- 433741955903
SMART Error Log Version: 1
ATA Error Count: 457 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 457 occurred at disk power-on lifetime: 39727 hours (1655 days + 7 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 df 95 11 e0 Error: ICRC, ABRT at LBA = 0x001195df = 1152479
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 d8 95 11 e0 00 00:04:48.291 READ DMA
c8 03 08 d0 95 11 e0 00 00:04:48.291 READ DMA
c8 03 08 c8 95 11 e0 00 00:04:48.290 READ DMA
c8 03 08 c0 95 11 e0 00 00:04:48.290 READ DMA
c8 03 08 b8 95 11 e0 00 00:04:48.289 READ DMA
Error 456 occurred at disk power-on lifetime: 39725 hours (1655 days + 5 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 5f 76 ce e1 Error: ICRC, ABRT at LBA = 0x01ce765f = 30307935
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 58 76 ce e1 00 00:52:50.023 READ DMA
c8 03 08 50 76 ce e1 00 00:52:50.022 READ DMA
c8 03 08 48 76 ce e1 00 00:52:50.021 READ DMA
c8 03 08 40 76 ce e1 00 00:52:50.021 READ DMA
c8 03 08 38 76 ce e1 00 00:52:50.020 READ DMA
Error 455 occurred at disk power-on lifetime: 39725 hours (1655 days + 5 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 f7 5b ce e1 Error: ICRC, ABRT at LBA = 0x01ce5bf7 = 30301175
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 f0 5b ce e1 00 00:52:49.092 READ DMA
c8 03 08 e8 5b ce e1 00 00:52:49.092 READ DMA
c8 03 08 e0 5b ce e1 00 00:52:49.091 READ DMA
c8 03 08 d8 5b ce e1 00 00:52:49.090 READ DMA
c8 03 08 d0 5b ce e1 00 00:52:49.089 READ DMA
Error 454 occurred at disk power-on lifetime: 39725 hours (1655 days + 5 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 0f 11 ce e1 Error: ICRC, ABRT at LBA = 0x01ce110f = 30281999
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 08 11 ce e1 00 00:52:47.046 READ DMA
c8 03 08 00 11 ce e1 00 00:52:47.045 READ DMA
c8 03 08 f8 10 ce e1 00 00:52:47.044 READ DMA
c8 03 08 f0 10 ce e1 00 00:52:47.044 READ DMA
c8 03 08 e8 10 ce e1 00 00:52:47.043 READ DMA
Error 453 occurred at disk power-on lifetime: 39724 hours (1655 days + 4 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 d7 9a c6 e1 Error: ICRC, ABRT at LBA = 0x01c69ad7 = 29792983
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 03 08 d0 9a c6 e1 00 00:45:36.781 READ DMA
c8 03 08 c8 9a c6 e1 00 00:45:36.781 READ DMA
c8 03 08 c0 9a c6 e1 00 00:45:36.780 READ DMA
c8 03 08 b8 9a c6 e1 00 00:45:36.779 READ DMA
c8 03 08 b0 9a c6 e1 00 00:45:36.756 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 40665 -
# 2 Short offline Completed without error 00% 16867 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.------------------------------------------------------------------------------
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