Hi again,

Am 04.03.2010 18:38, schrieb Frieder Ferlemann:
> Thanks!
>
> 198 Read_Sectors_Tot_Ct     0x0000   ---   ---   ---    Old_age   Offline     
>  -       63412716
> 199 Write_Sectors_Tot_Ct    0x0000   ---   ---   ---    Old_age   Offline     
>  -       93996899
> 200 Read_Commands_Tot_Ct    0x0000   ---   ---   ---    Old_age   Offline     
>  -       1352556
> 201 Write_Commands_Tot_Ct   0x0000   ---   ---   ---    Old_age   Offline     
>  -       1953112
>
> I'm surprised about this one:
>
> 208 Average_Erase_Count     0x0000   ---   ---   ---    Old_age   Offline     
>  -       50
>
> because to my reading (on the wrong assumption of only linear writes)
> this would translate to 50 * 64GByte drive capacity = 3 TByte
> having been written.
> (the ratio of about 60 between 3 TByte and 93996899 sectors *
> 512 bytes/sector = 48 GByte would seem very high to me)
>
> (write sectors being higher than read sectors could be plausible
> because I did two installs of linux. First one was just for
> fun a milestone version of openSUSE 11.3 which I a few hours
> later exchanged for 11.2)
>
> I bought the drive as a new device and I did no firmware update
> as it already had the latest firmware 1916.
> The first say 10 hours the disk was used with a 2.6.31 kernel
> since then a kernel of 2.6.33 series was installed.
>
> I intend to do a follow up posting if the drive has some more
> power on hours.



actually I did never expect to report back this early,
but I'm quite upset about the Average Erase Count
of 72 of the drive.

198 Read_Sectors_Tot_Ct     0x0000   ---   ---   ---    Old_age   Offline      
-       82208608
199 Write_Sectors_Tot_Ct    0x0000   ---   ---   ---    Old_age   Offline      
-       106676155
200 Read_Commands_Tot_Ct    0x0000   ---   ---   ---    Old_age   Offline      
-       1781513
201 Write_Commands_Tot_Ct   0x0000   ---   ---   ---    Old_age   Offline      
-       2275882

208 Average_Erase_Count     0x0000   ---   ---   ---    Old_age   Offline      
-       72

Meanwhile 6492 MByte have been written    (106676155 - 93996899) Sectors * 512 
Bytes /Sector
while  1408511 MByte have been erased!    (72 - 50) * 64.023.257.088 Bytes

This would mean that wear leaveling (or garbage collection/whatever)
causes an overhead of more than 200 in flash erase cycles!!!

Intolerable.

I hope there is a mistake in my calculations or somewhere else.


My configuration:
- The system has been in what I'd call "light desktop use"
- The SSD was shipped with the latest firmware 1916
- I did never mount swap on it (4GB Ram and Swap on
  a conventional disk, so no need to)
- The root partition was mounted noatime
- Using a kernel of 2.6.33 series

More detail:
/dev/sda2 on /     type ext4 (rw,noatime,acl,user_xattr)
/dev/sda1 on /home type ext4 (rw,acl,user_xattr)
Linux version 2.6.33-29-desktop (ge...@buildhost) (gcc version 4.4.1 
[gcc-4_4-branch revision 150839] (SUSE Linux) ) #1 SMP PREEMPT 2010-03-05 
10:49:02 +0100
Output of smartctl -a /dev/sda is attached


If my observations can be independently confirmed this
should probably escalate (LKML / LWN / Slashdot)

Can someone else have a look?

Greetings and thanks,
Frieder
smartctl 5.40 2010-03-04 r3072 [x86_64-suse-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SuperTalent UltraDrive GX SSD
Device Model:     STT_FTM64GX25H
Serial Number:    P612102-MIBY-208A052
Firmware Version: 1916
User Capacity:    64.023.257.088 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Tue Mar  9 20:16:21 2010 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever 
                                        been run.
Total time to complete Offline 
data collection:                 (   0) seconds.
Offline data collection
capabilities:                    (0x1d) SMART execute Offline immediate.
                                        No Auto Offline data collection support.
                                        Abort Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        No Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x00) Error logging NOT supported.
                                        General Purpose Logging supported.
Short self-test routine 
recommended polling time:        (   0) minutes.
Extended self-test routine
recommended polling time:        (   0) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  
WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x0000   006   000   000    Old_age   Offline      
-       0
  9 Power_On_Hours          0x0000   ---   ---   ---    Old_age   Offline      
-       105
 12 Power_Cycle_Count       0x0000   ---   ---   ---    Old_age   Offline      
-       27
184 Initial_Bad_Block_Count 0x0000   ---   ---   ---    Old_age   Offline      
-       93
195 Program_Failure_Blk_Ct  0x0000   ---   ---   ---    Old_age   Offline      
-       0
196 Erase_Failure_Blk_Ct    0x0000   ---   ---   ---    Old_age   Offline      
-       0
197 Read_Failure_Blk_Ct     0x0000   ---   ---   ---    Old_age   Offline      
-       0
198 Read_Sectors_Tot_Ct     0x0000   ---   ---   ---    Old_age   Offline      
-       82208608
199 Write_Sectors_Tot_Ct    0x0000   ---   ---   ---    Old_age   Offline      
-       106676155
200 Read_Commands_Tot_Ct    0x0000   ---   ---   ---    Old_age   Offline      
-       1781513
201 Write_Commands_Tot_Ct   0x0000   ---   ---   ---    Old_age   Offline      
-       2275882
202 Error_Bits_Flash_Tot_Ct 0x0000   ---   ---   ---    Old_age   Offline      
-       217999
203 Corr_Read_Errors_Tot_Ct 0x0000   ---   ---   ---    Old_age   Offline      
-       164788
204 Bad_Block_Full_Flag     0x0000   ---   ---   ---    Old_age   Offline      
-       0
205 Max_PE_Count_Spec       0x0000   ---   ---   ---    Old_age   Offline      
-       10000
206 Min_Erase_Count         0x0000   ---   ---   ---    Old_age   Offline      
-       1
207 Max_Erase_Count         0x0000   ---   ---   ---    Old_age   Offline      
-       465
208 Average_Erase_Count     0x0000   ---   ---   ---    Old_age   Offline      
-       72
209 Remaining_Lifetime_Perc 0x0000   ---   ---   ---    Old_age   Offline      
-       100
211 Unknown_Attribute       0x0000   000   000   000    Old_age   Offline      
-       0
212 Unknown_Attribute       0x0000   000   000   000    Old_age   Offline      
-       0
213 Unknown_Attribute       0x0000   000   000   000    Old_age   Offline      
-       0

Warning: device does not support Error Logging
Warning! SMART ATA Error Log Structure error: invalid SMART checksum.
SMART Error Log Version: 1
No Errors Logged

Warning! SMART Self-Test Log Structure error: invalid SMART checksum.
SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Device does not support Selective Self Tests/Logging
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