Dear Rietvelders,
Yesterday I was dealing with the refinement of silicon collected with
synchrotron radiation at the MS beamline at SLS. The intensity of many
reflections exceeds 10^6 counts, in some cases even reaching almost 10^7
counts. I noticed that the peaks exceeding 10^6 counts were kind
Dear all,
I warmly thank you for your many answers, anyway I noticed that I did not
explain correctly the issue in my previous mail, which was rather misleading. I
apologize for this.The original data is OK, there are no problems due to
detector saturation, the problem arises when I try to input
Another option could be to prepare the standard in-house. This paper: J. Appl.
Cryst. (2014). 47, 136–145 describes an annealing procedure to produce Al2O3
with a very low amorphous content (even lower than the NIST standard).
Marco
Da: rietveld_l-requ...@ill.fr
Dear all,
I have been following this conversation with a lot of interest over the last
few days, I did not know much about the early days of powder diffraction and
how profile refinement methods were born and evolved and I have learnt many
things.
I just want to thank everyone who contributed t
