Dear Rietvelders,
Yesterday I was dealing with the refinement of silicon collected with
synchrotron radiation at the MS beamline at SLS. The intensity of many
reflections exceeds 10^6 counts, in some cases even reaching almost 10^7
counts. I noticed that the peaks exceeding 10^6 counts were kind of truncated,
with the consequence that the pattern looked quite different from what it was
supposed to be.Since I always treated data from home diffractometers so far, I
never came across such an issue.My idea was to just divide all of the
intensities by 10, so as to preserve the relative intensities and the
signal/background ratio, is this a possible solution to the issue? Or there are
maybe some other ways to deal with it?
Thanks in advance.
Best,Marco
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