RE: Intrumental broadening of 2D detector

Hi all, The certification of SRM 660b has been completed and the paperwork is in the final stages of review, etc. This process typically takes no longer than a couple of months. The new SRM has been prepared with a dedicated processing run to synthesize LaB6 with the 11boron isotope enriched

RE: X-ray diffraction laboratory manager position

Here is a position that looks a lot like what could be described as a lab technician (no science anyway) and yet they require a PhD??? How could anyone recommend a specialization in the powder diffraction technique if this is all that is available? I find this very disconcerting. Jim

RE: X-ray diffraction laboratory manager position

? The second point says: > > "Develop new experimental approaches and measurement routines as > required by a growing user base." > > It doesn't sound so bad, unless the candidate can't think of any novel > experimental techniques to invent. > > Jon > >

RE: microstructure analysis

Let's start a riot... James P. Cline Materials Measurement Science Division   National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523    USA jcl...@nist.gov (301) 975 5793 FAX (301) 975 5334 -Original Message

RE: corundum internal standard alternative?

Please be sure to let me know of what you find on this issue! Best, Jim James P. Cline Materials Measurement Science Division   National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523    USA jcl...@nist.gov (301) 97

RE: Powder Diffraction Discussion Group on Facebook

Facebook is a commercial operation that is out to mine data from its users. I’ll stick with the Rietveld listserv. Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523

RE: Powder Diffraction Discussion Group on Facebook

This is the first pro-Facebook post that has resonated with me to any extent. However, with all the discussion of government surveillance: If my wife sends me an email to the effect that my son has exhausted his supply of clean underwear and would I please do a laundry, no government entity coul

RE: Powder Diffraction Discussion Group on Facebook

Not a great deal of difference between these entities, IMHO. Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523USA jcl...@nist.gov (301) 975

RE: Powder Diffraction Discussion Group on Facebook

5334 -Original Message- From: Lubomir Smrcok [mailto:uachs...@savba.sk] Sent: Thursday, June 11, 2015 1:30 PM To: Cline, James Dr. Cc: rietveld_l@ill.fr Subject: RE: Powder Diffraction Discussion Group on Facebook Well, Strictly speaking, you are wasting your time in (formally) two different

RE: Obtaining a silicon standard wafer

Lindsay, I've seen pressed discs of silicon powder that were supplied with older Philips diffractometers, and I understand that PANalytical will presently supply them with their new machines. NIST offers no such standard of silicon in a disc format. But I can suggest that you consider SRM 640

RE: Obtaining a silicon standard wafer

-8523USA jcl...@nist.gov<mailto:jcl...@nist.gov> (301) 975 5793 FAX (301) 975 5334 From: Fabrizio Guzzetta [mailto:fabrizio.guzze...@gmail.com] Sent: Tuesday, July 14, 2015 3:24 AM To: Cline, James Dr. Cc: Young, Lindsay Kay; rietveld_l@ill.fr Subject: Re: Obtaining a silicon standard

RE: Obtaining a silicon standard wafer

g 217 ] Gaithersburg, MD 20899-8523USA jcl...@nist.gov<mailto:jcl...@nist.gov> (301) 975 5793 FAX (301) 975 5334 From: alan.he...@gmail.com [mailto:alan.he...@gmail.com] On Behalf Of Alan Hewat Sent: Tuesday, July 14, 2015 10:50 AM To: David Elbert Cc: Cline, James Dr.; Fabrizio Guzzetta; Young,

RE: Obtaining a silicon standard wafer

Hi, Why don't you put these plots on your sales site... The SRM people would never do this as they would have to explain the plot in a technical manner to inquiring customers. Well, the documents on the NIST site are already quite technical, and contain plots, just not the nice comparative plots

FWHM Plot of 3 SRMs

Hi all, Last July I posted a plot of FWHM values vs. Two Theta for SRMs 640e, 660c and 1976b that prompted a bit of an exchange. The paper containing the plot has been published in the Journal of Research at NIST and is available at: http://nvlpubs.nist.gov/nistpubs/jres/120/jres.120.013.pdf

RE: Quantitative internal standards

Jools, If you want any pointers on how to get the benefits of a NIST SRM without the cost, you might want to have a look at: Acta Cryst. (2011). A67, 357-367 Regards, Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau Dr. stop

Automated XRD Date

Hi all, Anyone know when/where the first automated powder diffractometer was commissioned? I'm going to presume it was used with a non-laboratory source: 2nd, when/where was the first lab diffractometer commissioned? Regards, Jim James P. Cline Materials Measurement Science Division National

RE: Automated XRD Date

Hewat Sent: Sunday, January 31, 2016 2:27 PM To: Cline, James Dr. Cc: rietveld_l@ill.fr Subject: Re: Automated XRD Date Neutron diffractometers were automatic well before x-ray diffractometers, and were also first for position sensitive detectors (PSDs) and of course Rietveld refinement. Pape

RE: Automated XRD Date

Sunday, January 31, 2016 3:30 PM To: Cline, James Dr. Cc: rietveld_l@ill.fr Subject: Re: Automated XRD Date By automated I mean simply producing digital data, in x y pairs I assumed you meant automated stepping. If you mean just digital data, then its Shull and Wollan in the late 1940's. Ne

RE: Rietveld refinement in TOPAS with parallel beam geometry

Patrick, From: Patrick Price [patrickpric...@gmail.com] Sent: Friday, December 04, 2009 6:30 AM To: Rietveld_l@ill.fr Subject: Rietveld refinement in TOPAS with parallel beam geometry Since this is my first post I will start with a brief introduction. My n

RE: Automated slits for Panalytical MPD

Hi, I would only add one thing to Reinhard's articulate statement: Another advantage to the variable slits is complete freedom the set them to a fixed value that would maximize intensities (from the sample) for a given starting 2-theta angle. Regards, Jim James P. Cline Ceramics Division  

RE: Aking for Advice - reduce the current to X-ray tube to avoid director saturation at low angels

We built an automated anti-scatter slit into which you program the divergence slit angle and it adjusts the slit height (over the specimen) with respect to Two-Theta during the scan. Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bu

RE: Parafocussing definition?

Bob Cheary and I developed and presented a workshop several times in the 1990’s that included a discussion of this issue. I can send you the notes for it if you would like them. Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau

RE: Parafocussing definition?

g methods", page 222 ff. Cheers, Arnt From: rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr> [mailto:rietveld_l-requ...@ill.fr<mailto:rietveld_l-requ...@ill.fr>] On Behalf Of Eduard E. Levin Sent: Montag, 2. Mai 2016 13:21 To: Cline, James Dr. (Fed); Matthew Rowles Cc

RE: CrySize error in TOPAS

By what metric are you determining that the CrySize value is in error? James P. Cline Materials Measurement Science Division   National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523    USA jcl...@nist.gov (301) 975 5

RE: CrySize error in TOPAS

esday, July 27, 2016 1:08 PM To: Cline, James Dr. (Fed) Cc: rietveld_l@ill.fr; "Łukasz Kruszewski" Subject: RE: CrySize error in TOPAS Hello James. I just read the error that is reported for each refined parameter in TOPAS. I obtain value like, e.g., 9000 nm, and the error is, e.g.,

RE: U,V,W cagliotti peak width parameters

As Alan states, the U, V, and W terms are often employed in situations where their physical meaning is minimal: http://nvlpubs.nist.gov/nistpubs/jres/120/jres.120.013.pdf Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau Dr. sto

SRM 1979 now available

Hi all, The new NIST SRM for analysis of crystallite size that I have spoken about on a number of occasions over the years is now available. SRM 1979 - Powder Diffraction Line Profile Standard for Crystallite Size Analysis (Nano-Crystalline ZnO Powder) https://www-s.nist.gov/srmors/view_detail.c

RE: Stoichiometry and occupancy fractions of solid solutions

Your data is from where? I wouldn't trust numbers from refinements as these from lab data. Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523USA jcl...@nist.gov

RE: Stoichiometry and occupancy fractions of solid solutions

Luca, I'd be interested to read your article, but I'm not about to join researchgate to do so. Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523USA jcl...@nist.go

RE: How much COD and PDF database gives the complete known structures?

This should be fun to watch… James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523USA jcl...@nist.gov (301) 975 5793 FAX (301) 975 5334 From: rietve

RE: order of Spherical Harmonics for correction of PO

OK, can you list the citations for the papers in question? Jim James P. Cline Materials Measurement Science Division National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523USA jcl...@nist.gov (301) 975 57

RE: using Zero

Hi, Seems everyone has beaten on this matter quite well. I humbly offer this paper: http://nvlpubs.nist.gov/nistpubs/jres/120/jres.120.013.pdf which discusses how you can experimentally determine (eliminate) the zero error with considerable certainly. You should consider what you know the most

RE: using Zero

s. Best regards from Bremen, Johannes Am 29.03.2017 um 15:54 schrieb Cline, James Dr. (Fed): Hi, Seems everyone has beaten on this matter quite well. I humbly offer this paper: http://nvlpubs.nist.gov/nistpubs/jres/120/jres.120.013.pdf which discusses how you can experimentally determine (eli

Cu K alpha Spectrum

Hi all, We now have a paper concerning the NIST opinion as to the nature of the Cu K* emission spectrum. Please see: http://iopscience.iop.org/article/10.1088/1361-6455/aa6c4a/meta;jsessionid=0F01A1609C56F9C09F01B4DBA2B997A8.ip-10-40-1-105 Regards, Jim James P. Cline Materials Measurement S

RE: Mixed refinement Topas example

François, Somewhat more than slightly curious: Why do you want to use Topas in GUI mode? Jim James P. Cline Materials Measurement Science Division   National Institute of Standards and Technology 100 Bureau Dr. stop 8520 [ B113 / Bldg 217 ] Gaithersburg, MD 20899-8523    USA jam