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Dear Jing Wu,
You may not be aware of a software called SImPA (distributed by us for a
reasonnable cost) to transform a 2d X-ray diffraction image to intensity
versus 2theta data ready for Rietveld analysis.
More details at the following URL:
http://www.physics.uottawa.ca
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J. A. Gavira Gallardo
Laboratorio de Estudios Cristalograficos
I.A.C.T CSIC-UGRA.
Facultad de Ciencias. Granada 18002. Spain
Fax: +34-958-243384; Phone: +34-958-243360
email: [EMAIL PROTECTED]
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> The data I collected are in the form of binary images, any of you may
> familiar with .img or .gel file. I intend to use Rietveld method to
> analyze my patterns to solve the crystalline structure, separate
> crystalline and amorphous (both oriented and unoriented ).
Dear Rietvellers
