Dear Jing Wu,
You may not be aware of a software called SImPA (distributed by us for a
reasonnable cost) to transform a 2d X-ray diffraction image to intensity
versus 2theta data ready for Rietveld analysis.
More details at the following URL:
http://www.physics.uottawa.ca/~lpsd/simpa/simpa.htm
Best regards,
Serge Desgreniers
At 06:02 PM 2/25/99 -0500, you wrote:
>Hi, all
>
>This is Jing Wu from Univ. of Delaware. I am a graduate student working
>on X-ray scattering on polymer fibers. I am very excited to join this
>mail list.
>
>The data I collected are in the form of binary images, any of you may
>familiar with .img or .gel file. I intend to use Rietveld method to
>analyze my patterns to solve the crystalline structure, separate
>crystalline and amorphous (both oriented and unoriented ).
>
>Do you have any idea of available freeware (both exec and source code)
>that is capable of doing Rietveld two dimensional regression ?
>
>If not, is there 1-D source code available so that I can further modify to
>make it 2D ?
>
>Thank you very much for your information.
>
>Jing Wu
>
>
>
>
>
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Dr. Serge Desgreniers
Université d'Ottawa
Département de physique
150 Louis Pasteur
Ottawa, Ontario, CANADA
K1N 6N5
(613)562-5800 (poste/ext. 6757)
(613)562-5190 (Télecopieur/FAX)
mailto:[EMAIL PROTECTED]
http://www.physics.uottawa.ca/profs/desgreniers
Logiciels/software
XRDA - http://www.physics.uottawa.ca/~lpsd/xrda/xrda.htm
SImPA - http://www.physics.uottawa.ca/~lpsd/simpa/simpa.htm
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