Miguel
I have seen low angle peaks that are void or have very little axial
divergence asymmetry. As an example, the low angle peak of Brucite in a
multiphase pattern often exhibits far less asymmetry that surrounding peaks
from different phases. This I am pretty sure is due to the preferred
orient
(Larry)
> Would it be possible for you to generate the data points for the same
> set of parameters with peaks at 5 and 10 degrees? That way the
> asymmetry will be really pronounced and the convolution method will be
> even more stressed. I don't expect it to make any difference, but I'd
> like
Title: Message
The saga
continues
It has been
brought to my attention that the fit.xy data I provided in a previous e-mail has
misfits in the tails as seen in the following (blue is ray tracing, red is
convolution):
These misfits are due to how the ray tracing program
calculate
e way I stopped using assembler at
least 5 years ago as compilers today do the
job.
All the
best
Alan Coelho
From: Zuev [mailto:[EMAIL PROTECTED]
Sent: Thursday, 1 June 2006 1:24 AMTo:
rietveld_l@ill.frSubject: RE: how to find out POLARISATION
Factor
Dear Dr. A.
Coelho,
d
are another story entirely! :-)
-Original Message-From: Zuev
[mailto:[EMAIL PROTECTED] Sent: May 31, 2006 11:24
AMTo: rietveld_l@ill.frSubject: RE: how to find out
POLARISATION Factor
Dear Dr. A.
Coelho,
dear Rietvelders
there are four points to
Dear Dr. A. Coelho,
dear Rietvelders
there are four points to be
considered.
1. Precision of the fit (using the
convolution approach).
2. Theoretical basis of the
convolution approach.
3. Calculation time with the method
in my paper.
4. “… some inaccuracies
of the above mentio
Hi Larry
Whilst we are here I have used the FCJ correction to fit to the ray tracing
0.5 degree equitorial divergence pattern. To do this I simply informed the
Full Axial Model that divergence in the primary beam is zero. Without
refining on any axial divergence parameters the fit is very poor as
How about even lower angles?
From: Larry Finger [mailto:[EMAIL PROTECTED]
Sent: Tue 5/30/2006 4:25 PM
To: rietveld_l@ill.fr
AlanCoelho wrote:
> I would like to conclude that to be critical of a method such as the
> convolution approach to describing instrument
AlanCoelho wrote:
I would like to conclude that to be critical of a method such as the
convolution approach to describing instrument line profiles it would serve
authors best to first investigate the approach rather than to be critical of
it without substance.
Amen!
I'm really impressed with
ld_l@ill.fr
cc
Subject
Re: how to find out POLARISATION
Factor
Dear Martijn
Thanks for our reply. I would llike to know 'Does any
body is using panalytical Xpert highscore plus for rietveld refinement?'
Iam using GSAS.
santosh babu
On 5/29/06, [EMAIL PROTECTED]
<[EMAIL PROTE
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