Dear Ross,
We are working in the preparation of standard materials for XPD
equipment alignment / calibration and also for obtaining instrumental
breadth for line profile analysis (Rietveld, Warren-Averbach etc.).
In our opinion a simple and good choice is high purity ytria (Y2O3)
treated at
Hi!
You can try with ZnO, annealed at 950ºC, 72 h h, ( from works of Langford
and Louêr)
best wishes
Miguel Hesiquio
> Hi All,
>
> Does anyone know an appropriate source of standard reference materials for
> a
> line profile standard, like NIST SRM 660a (LaB6) - other than NIST, as
> they
> are
Hi all,
We expect to have SRMs 640d & 660b available by no later then November 2008.
SRM 676a will available in a ~month.
I regret the difficulty that is being caused by this lapse; we are
taking measures to prevent them from recurring.
Regards,
Jim
At 09:50 PM 11/15/2007, you wrote:
Hi A
I bought some LaB6 from gem dugout. thegemdugout.com
There datasheet references calibration against NIST SRM-640C.
I'm still looking for a source of corundum, though.
David Lee, Ph.D.
SMRL, The Ohio State University
Dept. of Materials Science and Engineering
2041 College Rd
Columbus, OH 43210
Ross,
The link to The Gem Dugout X-ray Diffraction Products is
http://www.thegemdugout.com/products.html.
The provide several reference specimens for affordable price, e.g. LaB6 -
$10/g.
And other diffraction products.
Peter
Dr. Peter Y. Zavalij
Director, X-ray Crystallographic Laboratory
Depar
Hello Ross
For this purpose you can use annealed (1573K, 3h, in air) CeO2 (D. Balzar et
al., J. Appl. Cryst. 37 (2004), 911-924), which is by far cheaper than the NIST
standard, I suppose.
Regards
Franz
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