Dear Ross,

 We are working in the preparation of standard materials for XPD
equipment alignment / calibration and also for obtaining instrumental
breadth for line profile analysis (Rietveld, Warren-Averbach etc.).

 In our opinion a simple and good choice is high purity ytria (Y2O3)
treated at 1200º C for 72 h followed by grinding and sieving (<= 5
micron ?m).

 Regards,

 Luis

 -- Dr. Luis Gallego Martinez
Comissão Nacional de Energia Nuclear
Instituto de Pesquisas Energéticas e Nucleares
Centro de Ciência e Tecnologia de Materiais
Av. Prof. Lineu Prestes 2242 Cidade Universitária - USP
São Paulo - SP - Brasil - CEP:05508-000
Tel: + 55 11 3133-9222 Fax: 3133-9276
[EMAIL PROTECTED]  www.ipen.br

 Quoting Ross Williams <[EMAIL PROTECTED]>:

Hi All,

Does anyone know an appropriate source of standard reference
materials for a
line profile standard, like NIST SRM 660a (LaB6) - other than NIST,
as they
are out of stock and "...is expected to become available by
November 2009."

Thanks,

Ross


Reply via email to