Dear Ross, We are working in the preparation of standard materials for XPD equipment alignment / calibration and also for obtaining instrumental breadth for line profile analysis (Rietveld, Warren-Averbach etc.). In our opinion a simple and good choice is high purity ytria (Y2O3) treated at 1200º C for 72 h followed by grinding and sieving (<= 5 micron ?m). Regards, Luis -- Dr. Luis Gallego Martinez Comissão Nacional de Energia Nuclear Instituto de Pesquisas Energéticas e Nucleares Centro de Ciência e Tecnologia de Materiais Av. Prof. Lineu Prestes 2242 Cidade Universitária - USP São Paulo - SP - Brasil - CEP:05508-000 Tel: + 55 11 3133-9222 Fax: 3133-9276 [EMAIL PROTECTED] www.ipen.br Quoting Ross Williams <[EMAIL PROTECTED]>:
Hi All, Does anyone know an appropriate source of standard reference
materials for a
line profile standard, like NIST SRM 660a (LaB6) - other than NIST,
as they
are out of stock and "...is expected to become available by
November 2009."
Thanks, Ross
