To all:
I have electronic grade silicon wafers (6-9s pure) which I'm willing to share.
They are not certified by NIST. They are from silicon single crystal
production and are many years old. You can grind and mix with your material of
interest and use the line positions to ascertain peak shi
Dear Nelson,
you probably could use LaB6 or you could buy an alpha-corundum fron Alfa
Aesar, it's very cheap and will give you good results.
At the end, you should select an internal standad with x-ray absorption
coefficient similar to your sample, but you can correct this effect with
any soft
Dear colleagues,
could anybody suggest a standard (and where i can buy), not very
expensive, like quartz or zirconia to doping a power sample to control
the position of xrd lines and probably later help in quantification.
we use Nist standard LaB6 to instrument performance characterization
>
A good chemist is able to destroy any SDPD future.
Unrestrained future can't be destroyed. Being restrained, however, it destroys
itself.
The low-temperature single-crystal refinement doesn't eliminate the necessity
for accurate room-temperature structural data that may be required for QPA, e
Dear Armel,
>From the comparison of your distances and angles with the single-crystal ones,
>two obvious conclusions can be drawn:
1) Applying a simplified refinement model one can't expect accurate results
2) Uncertainty estimations in Rietveld programs are inadequately optimistic
Here you may
