On Mon, Nov 21, 2016 at 01:51:34PM -0600, Zach Brown wrote:
> For ONFI-compliant NAND devices, the ONFI parameters report the maximum number
> of bad blocks per LUN that will be encountered over the lifetime of the
> device,
> so we can use that information to get a more accurate (and smaller) val
Hi!
On 22.11.2016 10:37, Boris Brezillon wrote:
> Hi Zach,
>
> Please do not resend a patch series so quickly (a simple ping is
> enough).
> BTW, I already asked Richard and Brian to have a look, let's wait a bit.
It is on my TODO. Since I'm travelling I'm slow with reviewing.
Thanks,
//richard
Hi Zach,
Please do not resend a patch series so quickly (a simple ping is
enough).
BTW, I already asked Richard and Brian to have a look, let's wait a bit.
On Mon, 21 Nov 2016 13:51:34 -0600
Zach Brown wrote:
> For ONFI-compliant NAND devices, the ONFI parameters report the maximum number
> of
For ONFI-compliant NAND devices, the ONFI parameters report the maximum number
of bad blocks per LUN that will be encountered over the lifetime of the device,
so we can use that information to get a more accurate (and smaller) value for
the UBI bad PEB limit.
The ONFI parameter "maxiumum number of
4 matches
Mail list logo
