On Mon, Nov 21, 2016 at 01:51:34PM -0600, Zach Brown wrote: > For ONFI-compliant NAND devices, the ONFI parameters report the maximum number > of bad blocks per LUN that will be encountered over the lifetime of the > device, > so we can use that information to get a more accurate (and smaller) value for > the UBI bad PEB limit. > > The ONFI parameter "maxiumum number of bad blocks per LUN" is the max number > of > bad blocks that each individual LUN will ever ecounter. It is not the number > of > bad blocks to reserve for the nand device per LUN in the device. > > This means that in the worst case a UBI device spanning X LUNs will encounter > "maximum number of bad blocks per LUN" * X bad blocks. The implementation in > this patch assumes this worst case and allocates bad block accordingly. > > These patches are ordered in terms of their dependencies, but ideally, all 5 > would need to be applied for this to work as intended.
Other than some small comments, the MTD parts look fine to me. For patches 1, 3, 4, and 5 with my comments fixed: Acked-by: Brian Norris <computersforpe...@gmail.com> For the UBI part, I wasn't quite sure about the precedence among the 3 possible ways to determine the appropriate value. I'll leave that up to Richard, et al, though. Brian
