he board.
It is useful in Odroid XU3. Therefore this patchset also sets
max-expected-current in OdroidXU3 device tree to values from documentation.
Best Regards,
Maciej Purski
Maciej Purski (4):
iio: adc: ina2xx: Make max expected current configurable
hwmon: (ina2xx) Make max e
sheet Current LSB should
be calculated by dividing max expected current by 2^15, as values read
from device registers are in this case 16-bit integers. Power LSB
is calculated by multiplying Current LSB by a factor, which is defined
in ina documentation.
Signed-off-by: Maciej Purski
---
drivers/ii
sheet Current LSB should
be calculated by dividing max expected current by 2^15, as values read
from device registers are in this case 16-bit integers. Power LSB
is calculated by multiplying Current LSB by a factor, which is defined
in ina documentation.
Signed-off-by: Maciej Purski
---
drivers/
Set max-expected-current to values required by the documentation,
in order to achieve desired precision.
Signed-off-by: Maciej Purski
---
arch/arm/boot/dts/exynos5422-odroidxu3.dts | 4
1 file changed, 4 insertions(+)
diff --git a/arch/arm/boot/dts/exynos5422-odroidxu3.dts
b/arch/arm
Add optional max expected current property which allows calibrating
the ina sensor in order to achieve requested precision. Document
the changes in Documentation/hwmon/ina2xx.
Signed-off-by: Maciej Purski
---
Documentation/devicetree/bindings/hwmon/ina2xx.txt | 4 +++-
Documentation/hwmon
On 10/01/2017 12:29 PM, Jonathan Cameron wrote:
On Thu, 28 Sep 2017 14:50:12 +0200
Maciej Purski wrote:
Max expected current is used for calculating calibration register value,
Current LSB and Power LSB according to equations found in ina datasheet.
Max expected current is now implicitly set
On 10/01/2017 12:31 PM, Jonathan Cameron wrote:
On Thu, 28 Sep 2017 14:50:14 +0200
Maciej Purski wrote:
Add optional max expected current property which allows calibrating
the ina sensor in order to achieve requested precision. Document
the changes in Documentation/hwmon/ina2xx.
This is
On 10/08/2017 11:47 AM, Jonathan Cameron wrote:
On Wed, 04 Oct 2017 09:11:31 +0200
Maciej Purski wrote:
On 10/01/2017 12:29 PM, Jonathan Cameron wrote:
On Thu, 28 Sep 2017 14:50:12 +0200
Maciej Purski wrote:
Max expected current is used for calculating calibration register value
On 10/09/2017 03:35 PM, Jonathan Cameron wrote:
On Mon, 9 Oct 2017 10:08:42 +0200
Maciej Purski wrote:
On 10/08/2017 11:47 AM, Jonathan Cameron wrote:
On Wed, 04 Oct 2017 09:11:31 +0200
Maciej Purski wrote:
On 10/01/2017 12:29 PM, Jonathan Cameron wrote:
On Thu, 28 Sep 2017 14:50:12
y the board.
It is useful in Odroid XU3. Therefore this patchset also sets
max-expected-current in OdroidXU3 device tree to values from documentation.
Best Regards,
Maciej Purski
---
Changes in v2:
- make scale attribute for current iio channel writable as instead of
addin
max expected current configurable from device tree or platform_data.
Allow changing current_lsb from sysfs. It is exposed in sysfs as
scale attribute for IIO current channel. Update calibration register and
power_lsb value on each scale change.
Signed-off-by: Maciej Purski
---
drivers/iio/adc
Add optional max expected current property which allows calibrating
the ina sensor in order to achieve requested measure scale. Document
the changes in Documentation/hwmon/ina2xx.
Signed-off-by: Maciej Purski
---
Documentation/devicetree/bindings/hwmon/ina2xx.txt | 4 +++-
Documentation/hwmon
max expected current configurable from device tree or platform_data.
Allow changing it from sysfs as currX_max attribute. Update calibration
register and power_lsb value on each currX_max change.
Signed-off-by: Maciej Purski
---
drivers/hwmon/ina2xx.c | 107
Set max expected current to values required by the documentation,
in order to achieve desired precision.
Signed-off-by: Maciej Purski
---
arch/arm/boot/dts/exynos5422-odroidxu3.dts | 4
1 file changed, 4 insertions(+)
diff --git a/arch/arm/boot/dts/exynos5422-odroidxu3.dts
b/arch/arm
On 10/12/2017 02:39 PM, Krzysztof Kozlowski wrote:
On Thu, Oct 12, 2017 at 2:36 PM, Maciej Purski wrote:
Add optional max expected current property which allows calibrating
the ina sensor in order to achieve requested measure scale. Document
the changes in Documentation/hwmon/ina2xx.
Signed
y the board.
It is useful in Odroid XU3. Therefore this patchset also sets
max-expected-current in OdroidXU3 device tree to values from documentation.
Best Regards,
Maciej Purski
---
Changes in v3:
- fix units inconsistency
Changes in v2:
- make scale attribute for current iio chan
max expected current configurable from device tree or platform_data.
Allow changing current_lsb from sysfs. It is exposed in sysfs as
scale attribute for IIO current channel. Update calibration register and
power_lsb value on each scale change.
Signed-off-by: Maciej Purski
---
drivers/iio/adc
Add optional max expected current property which allows calibrating
the ina sensor in order to achieve requested measure scale. Document
the changes in Documentation/hwmon/ina2xx.
Signed-off-by: Maciej Purski
---
Documentation/devicetree/bindings/hwmon/ina2xx.txt | 4 +++-
Documentation/hwmon
Set max expected current to values required by the documentation,
in order to achieve desired precision.
Signed-off-by: Maciej Purski
---
arch/arm/boot/dts/exynos5422-odroidxu3.dts | 4
1 file changed, 4 insertions(+)
diff --git a/arch/arm/boot/dts/exynos5422-odroidxu3.dts
b/arch/arm
max expected current configurable from device tree or platform_data.
Allow changing it from sysfs as currX_max attribute. Update calibration
register and power_lsb value on each currX_max change.
Signed-off-by: Maciej Purski
---
drivers/hwmon/ina2xx.c | 107
On 10/12/2017 03:55 PM, Guenter Roeck wrote:
On 10/12/2017 06:00 AM, Maciej Purski wrote:
On 10/12/2017 02:39 PM, Krzysztof Kozlowski wrote:
On Thu, Oct 12, 2017 at 2:36 PM, Maciej Purski wrote:
Add optional max expected current property which allows calibrating
the ina sensor in order
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