Re: [dpdk-dev] [PATCH v1 0/2] add tests for RSA key type CRT

Sent from Workspace ONE Boxer On 12-Jul-2019 6:45 PM, "Kusztal, ArkadiuszX" mailto:arkadiuszx.kusz...@intel.com>> wrote: > > In future we could unify tests even more (i.e. passing padding type as a > param, or even information if it is encryption or signature generation) like > Fan once done

Re: [dpdk-dev] [PATCH v1 0/2] add tests for RSA key type CRT

Sent from Workspace ONE Boxer On 12-Jul-2019 6:45 PM, "Kusztal, ArkadiuszX" wrote: > > In future we could unify tests even more (i.e. passing padding type as a > param, or even information if it is encryption or signature generation) like > Fan once done with blockcipher. > > > -Original

Re: [dpdk-dev] [PATCH v1 0/2] add tests for RSA key type CRT

Thanks Arek. Response inline. Sent from Workspace ONE Boxer On 12-Jul-2019 6:45 PM, "Kusztal, ArkadiuszX" wrote: > > In future we could unify tests even more (i.e. passing padding type as a > param, or even information if it is encryption or signature generation) like > Fan once done with bloc

Re: [dpdk-dev] [PATCH v1 0/2] add tests for RSA key type CRT

In future we could unify tests even more (i.e. passing padding type as a param, or even information if it is encryption or signature generation) like Fan once done with blockcipher. > -Original Message- > From: Ayuj Verma [mailto:ayve...@marvell.com] > Sent: Thursday, July 11, 2019 3:23

[dpdk-dev] [PATCH v1 0/2] add tests for RSA key type CRT

This patch series add new RSA CRT key based test cases, improve code organization and also rebase it to latest changes. It covers following changes: * Add crt key based rsa sign/verify, enc/decrypt test cases * Move common code of enqueue/dequeue into separate function * Configure device with ff_d