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On 12-Jul-2019 6:45 PM, "Kusztal, ArkadiuszX" <arkadiuszx.kusz...@intel.com>
wrote:
>
> In future we could unify tests even more (i.e. passing padding type as a
> param, or even information if it is encryption or signature generation) like
> Fan once done with blockcipher.
>
> > -----Original Message-----
> > From: Ayuj Verma [mailto:ayve...@marvell.com]
> > Sent: Thursday, July 11, 2019 3:23 PM
> > To: akhil.go...@nxp.com
> > Cc: Kusztal, ArkadiuszX <arkadiuszx.kusz...@intel.com>; Trahe, Fiona
> > <fiona.tr...@intel.com>; shal...@marvell.com; ss...@marvell.com;
> > kkotamar...@marvell.com; ano...@marvell.com; dev@dpdk.org; Ayuj
> > Verma <ayve...@marvell.com>
> > Subject: [PATCH v1 0/2] add tests for RSA key type CRT
> >
> > This patch series add new RSA CRT key based test cases, improve code
> > organization and also rebase it to latest changes.
> > It covers following changes:
> >
> > * Add crt key based rsa sign/verify, enc/decrypt test cases
> > * Move common code of enqueue/dequeue into separate function
> > * Configure device with ff_disable set
> >
> > Ayuj Verma (2):
> > test/crypto: move rsa enqueue/dequeue into separate functions
> > test/crypto: add tests for RSA key type CRT
> >
> > app/test/test_cryptodev_asym.c | 460
> > +++++++++++++++++------------
> > app/test/test_cryptodev_rsa_test_vectors.h | 93 ++++++
> > 2 files changed, 363 insertions(+), 190 deletions(-)
> >
> > --
> > 1.8.3.1
>
> Series-acked-by: Arek Kusztal <arkadiuszx.kusz...@intel.com>
>
Series-acked-by: Shally Verma <shal...@marvell.com>
