> -Original Message-
> From: Jain, Deepak K
> Sent: Friday, October 14, 2016 1:14 AM
> To: Kusztal, ArkadiuszX; dev at dpdk.org
> Cc: Trahe, Fiona; De Lara Guarch, Pablo; Griffin, John
> Subject: RE: [PATCH] app/test: add tests with corrupted data for QAT test
> suite
>
>
>
> > -Or
> -Original Message-
> From: Kusztal, ArkadiuszX
> Sent: Thursday, October 13, 2016 11:04 AM
> To: dev at dpdk.org
> Cc: Trahe, Fiona ; Jain, Deepak K
> ; De Lara Guarch, Pablo
> ; Griffin, John intel.com>;
> Kusztal, ArkadiuszX
> Subject: [PATCH] app/test: add tests with corrupted data
This commit adds tests with corrupted data to the Intel QuickAssist
Technology tests suite in test_cryptodev.c
Signed-off-by: Arek Kusztal
---
app/test/test_cryptodev.c | 14 ++
1 file changed, 14 insertions(+)
diff --git a/app/test/test_cryptodev.c b/app/test/test_cryptodev.c
index
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