> -----Original Message----- > From: Jain, Deepak K > Sent: Friday, October 14, 2016 1:14 AM > To: Kusztal, ArkadiuszX; dev at dpdk.org > Cc: Trahe, Fiona; De Lara Guarch, Pablo; Griffin, John > Subject: RE: [PATCH] app/test: add tests with corrupted data for QAT test > suite > > > > > -----Original Message----- > > From: Kusztal, ArkadiuszX > > Sent: Thursday, October 13, 2016 11:04 AM > > To: dev at dpdk.org > > Cc: Trahe, Fiona <fiona.trahe at intel.com>; Jain, Deepak K > > <deepak.k.jain at intel.com>; De Lara Guarch, Pablo > > <pablo.de.lara.guarch at intel.com>; Griffin, John <john.griffin at > > intel.com>; > > Kusztal, ArkadiuszX <arkadiuszx.kusztal at intel.com> > > Subject: [PATCH] app/test: add tests with corrupted data for QAT test suite > > > > This commit adds tests with corrupted data to the Intel QuickAssist > > Technology tests suite in test_cryptodev.c > > > > Signed-off-by: Arek Kusztal <arkadiuszx.kusztal at intel.com> > > --- > > app/test/test_cryptodev.c | 14 ++++++++++++++ > > 1 file changed, 14 insertions(+) > > > > }; > > -- > > 2.1.0 > Acked-by: Deepak Kumar Jain <deepak.k.jain at intel.com>
Applied to dpdk-next-crypto. Thanks, Pablo
