Re: Negative Uiso in GSAS

2010-03-03 Thread Goutenoire

As mentioned recently,

Their is no physical meaning to have negative thermal agitation factor.
It means that at high angle the observed data at upon the calculated.

It means that you should put more electron (if you are doing X-Ray 
diffraction) or more electron or nuclear density in your 
crystallographic model.


One of the usual problem could be:
- You have used some automatic variable slit !! and you try to refined 
such data without correction.

- Check your crystallographic model

But if you have done such last things it should come from some 
absorption problem : if you are using X-ray with high absorption 
compound in reflection geometry this problem come quite often.


For example the simple crystallographic compound metal Platinum simple 
cubic Fm-3m (N°225) Pt in 0,0,0


The absorption is big for copper radiation 4300cm-1.

I find -0.6ang2 with X'Pert HighScore Plus.

Normally we can make some correction for such absorption see :


 /Référence/

/*20.- W. Pitschke, N. Mattern and H. Hermann, Powder Diffraction 8(4),*/

/* 223-228 (1993).*/

/ (In this paper the authors refine simultaneously all occupation/

/ numbers. This practice should be avoided. If the calculation were/

/ exact that gives rise to a singular matrix when the scale factor/

/ is also refined)/

/ See also/

/* W. Pitschke, H. Hermann and N. Mattern, Powder Diffraction 8(2),*/

/* **74-83 (1993).*/

/ /

/ Dans HighScore on trouve la reference :/

//H. HERMAN & M. ERMRICH///, Microabsorption of X-ray intensity in 
randomly packed powder specimens, Acta Cryst. (1987), *A43*, 401 -- 405./


But I did not find so easy to apply such correction at least with 
HighScore or Fullprof.


The data of the platinum or the molybdenum could be found in :



http://perso.univ-lemans.fr/~fgouten/RX_data

Best Whishes
François Goutenoire


Le 03/03/2010 17:08, carolina.zip...@fi.isc.cnr.it a écrit :

Dear all,

could someone explain to me the meaning of obtaining a negative Uiso 
in GSAS?

I thought it was always positive...(p. 123 manual)

thanks

Carolina


_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-_-


 Dr. Carolina Ziparo

  Istituto dei Sistemi Complessi - sezione di Firenze,
  C.N.R. - Consiglio Nazionale delle Ricerche

  via Madonna del Piano, 10
  I-50019 Sesto Fiorentino Italy


  tel.:   +39 055 5226693
  fax:+39 055 5226683
  e-mail: carolina.zip...@fi.isc.cnr.it





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Re: any good up to date review paper for Rietveld methods?

2010-03-23 Thread Goutenoire

Hello

Nearly with the same words but in a different way

"Structure Determination From Powder Diffraction Data"
IUCr Monographs on Crystallography - 13
Edited by W.I.F. David, K. Shankland, L.B. MCCusker and Ch. Baerlocher
edited in 2002

A nice overview. But it is even quite old in consideration with new 
methods chage flipping for instance.


Best regards,
François



Le 23/03/2010 10:52, Francois Berenger a écrit :

Hello,

I have a review paper but it dates back to 1996: "Crystal Structure 
Determination from Powder Diffraction Data".


Please feel free to recommend me if you know something "fresher". :)

Best regards,
Francois.





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Thickness measurement

2010-01-26 Thread Francois Goutenoire

Dear Rietveld Users,

I am currently working on thin layers deposit by soft chemistry on 
different substrates (Al2O3, Copper, ….)


In order to analyse these samples, I am using a D8 (Bruker) with a 
collimator + point detector.


We do not have any mirror to produce an intense parallel beam. We just 
used some primary slit, in order to give a less divergent beam.


For the moment, I am making detector scan ( from 10° to 70° 2 theta) 
with omega fixed ( from 1 to 5°).


We can have identification of the thin layer + the substrate.

I would like to have a rough idea of the thickness of the layer. I would 
like to do such experiment with the decrease of the intensity of a 
substrate peak versus the omega angle, and make a calculation with the 
decrease of the intensity versus the omega angle. After, I will make an 
hypothesis of the composition and the compact density.


My first test give nothing !!!

Does anyone have an idea, or even some reference text on such device 
(powder diffractometer + collimator + point detection) and applications.


Best Whishes, François Goutenoire.

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Re: information

2010-01-27 Thread Francois Goutenoire

Dear Davide,

This is obtain from the help of X'Pert HighScore Plus, I have write the 
formula due to image mode.



 Lorentz-Polarization correction:

The Lorentz-Polarization factor LP is:

*LP= [1 + POL Cos(2theta).Cos(2theta)]/[Sintheta.Sintheta.Costheta]*

POL describes the additional polarization factor when a monochromator is 
used:


POL=Cos(2theta_m).Cos(2theta_m)

where 2/θ/_m *(2theta_m)* is the diffraction angle of the monochromator. 
This formula is valid for mosaic monochromators, like pyrolytic graphite.


The incident-beam monochromators have less mosaicity, they are between a 
mosaic and a perfect single crystal. A value close to that of a mosaic 
crystal is most likely.


For a perfect single crystal the following formula applies:

POL=Cos(2theta_m)

For the *X'Celerator monochromator* the formula:

POL = 1/cos² 2/θ/ _XCmon


is used, where 2/θ/ _XCmon is the diffraction angle of the X'Celerator 
monochromator.


Table of *POL* values for powder diffraction *monochromators* according 
to the formulas above:


Monochromator 	Wavelength [Å] 	Material 	Reflection 	/d/-spacing [Å] 
2/θ/_m [°] 	POL

Cu diffr. beam  1.54184 C   (002)   3.3570  26.55   0.800
Cu X'Celerator  1.54184 C   (002)   3.3570  26.55   1.25
Co diffr. beam  1.78897 C   (002)   3.3570  30.91   0.736
Co X'Celerator  1.78897 C   (002)   3.3570  30.91   1.359
Cr diffr. beam  2.29100 C   (002)   3.3570  39.90   0.588
Mo diffr. beam
old *(< 2002)*   0.71073 C   (004)   1.6785  24.45   0.829
Mo diffr. beam
new *(≥ 2002)*  0.71073 C   (002)   3.3570  12.13   0.956
Fe diffr. beam  1.93735 C   (002)   3.3570  33.54   0.695
Cu hybride 2-bounce 1.54184 Ge  (220)   2.0002  45.30   0.494
Co hybride 2-bounce 1.78897 Ge  (220)   2.0002  53.13   0.359
Cu incid. beam (K-Alpha1 only) 	1.54056 	Ge 	(111) 	3.2660 	27.28 	0.790 
- 0.888
Co incid. beam (K-Alpha1 only) 	1.78897 	Ge 	(111) 	3.2660 	31.79 	0.722 
- 0.850

All K-beta filters  All wavelengths -   -   -   -   
1.000
All mirrors All wavelengths -   -   -   -   0.999

The */PANalytical/* diffracted beam monochromators (flat and curved) are 
all made of pyrolytic graphite. The reflection used is C(002) for Cu, 
Co, Cr and Fe. For Mo the C(004) reflection was used, a newer design 
changed to the (002) for more intensity. The incident beam monochromator 
(Johansson type) is made of germanium. The reflection used for CuK/α/1 
and CoK/α/1 is Ge(111).



In our case, we use a Nickel Filter, then the polarization is equal to 1.000


Davide Levy wrote:
Dear all, 
which is the best value for the polarization in GSAS when you have a data
collected on 'XPERT diffractometer with a Xcellerator detector? 
Thank you 
Davide 




  



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Standard in transmission geometry

2013-10-24 Thread François Goutenoire

Dear Rietveld Users,

 I would like to find a standard in transmission geometry in order to 
test the resolution of our futur laboratory diffractometer.


I would like to find a simple coumpound with a relative low absorption 
from 10 to 20 cm-1 with copper radiation.


I have asked the same question 10 years ago, the answer was some diamond 
and LiF.


Now I would like to found some organic compound easy to find and cheap 
with the lowest FWHM.


From the paper involved in the structural determination from powder 
diffraction data : Solving molecular structure from laboratory X-ray 
powder diffraction with DASH, the minimum FWHM was 0.080°.


In comparison in reflection mode the lowest FWHM is approximatively 
0.040°with LaB6 or a good alumina with any laboratory high resolution 
diffractometer.


If anyone has an idea.

Thanks in advance,

Best Whishes


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Toshiba distributor

2013-11-05 Thread François Goutenoire

Dear Rietveld users,

I am looking for a distributor of Toshiba X-ray tube for a Miniflex 
(Rigaku) system in France or in Europe


The model is A20, 21 or 41

Thanks in advance

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Bond valence calculation of mixed site

2015-05-21 Thread François Goutenoire

Dear Rietveld users,

I am currently using Bond_str from the fullprof suite to calculate the 
valence of my different atoms. I would like to calculate the bond 
valence in the case of mixed sites with different oxidation state. Does 
anyone have found a solution to do this calculation of the mixed site in 
the CLF file.


Or is there another nice program to calculate Bond Valence , distortion, 
global instability, ...


Best regards!

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Strength of spherical harmonic preferential orientation correction

2016-11-02 Thread François Goutenoire

Dear Rietveld users,

I am currently testing the Spherical Harmonic Preferential Orientation 
(SH-OP) correction implemented in the last version of HighScorePlus.


It is working nicely, nevertheless I would like to compare the old 
March-Dollase correction parameter with the new SH-OP parameters.


Is there a way to calculate the strength of the correction in the case 
of SH-OP ?.


I have read the archive on the subject, but I did not find a right 
answer. Or may be a F2 coefficient mentioned by Lucas Lutterotti, but I 
did not find any formula in order to calculate this value.



I am currently working with two compounds which present high 
preferential orientation K2SO4 and


NaHCO3 on different diffractometer setting and sample preparation: 
reflection/transmission, back loading preparation, spread on grease, 
capillary …..



If any one can help me ? Thank in advance.

François Goutenoire


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Tricks for transmission sample preparation between foils

2017-02-08 Thread François Goutenoire

Dear Rietveld users,

We are currently using transmission flat sample on our diffractometer. 
To prepare the transmission flat sample we are using mylar 15microns or 
kapton. We put the sample between 2 mylar foils.


I would like to know if there is some tricks in order to nicely put the 
powder in the center of the circular sample older and if there is also 
some tricks in order to avoid electrostatic problems.


Thank you very much in advance,

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Re: Tricks for transmission sample preparation between foils

2017-02-10 Thread François Goutenoire

Thank every one for the propositions.

Find here after the result of a test (vaseline + n-heptane)

http://perso.univ-lemans.fr/~fgouten/Transmission_Tricks

Best Regards, François

Le 08/02/2017 13:35, François Goutenoire a écrit :

Dear Rietveld users,

We are currently using transmission flat sample on our diffractometer. 
To prepare the transmission flat sample we are using mylar 15microns 
or kapton. We put the sample between 2 mylar foils.


I would like to know if there is some tricks in order to nicely put 
the powder in the center of the circular sample older and if there is 
also some tricks in order to avoid electrostatic problems.


Thank you very much in advance,


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heater system in transmission

2017-03-01 Thread François Goutenoire

Dear Rietveld users,

We would like to buy or to built an heater system for our laboratory 
system (Empyrean equipped in transmission with capillary). The aim is to 
reach 200-300°C, this is mainly for organic compounds. I have few 
questions : if we use an air blower is there any problem for the 
goniometer ? In comparison with air blower found in large instrument 
(ESRF, …..)


Does anyone has constructed is own system (infrared heating system ? 
External Kapton shield ?...)


Thank in advance for the answers and discussions

François

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Asymmetry peak shape difference between (pellet/powder)

2017-12-08 Thread François Goutenoire

Dear Rietveld users,

We observe an unusual asymmetric peak shape on pellet and not when the 
sample has been crushed in powder.


This asymmetry is observed even at high 2theta angle. I would like to 
known if someone has an explanation ?


I have put the data in the link here after

http://perso.univ-lemans.fr/~fgouten/Asymmetry

Best Whishes, François Goutenoire

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Re: Asymmetry peak shape difference between (pellet/powder)

2017-12-11 Thread François Goutenoire

Thank everyone for all the answers (on and off)

If I can resumed all the ideas :

Question about the darkness of the pellets (could it be reduction 
process ?) I should asked the student about the sintering. The ZnO is 
doped with Ti/Al and Mg.


Question about the peak shift : it is true than even some nice 
preparation to put the sample in the plane the peak shift could be due 
to height difference.


Question about other geometrical aberration : I will try to do more 
measurements with smaller Soller (0.01rad), a smaller mask 10mm and I 
will fixed the sample irradiated length with the Automatic Divergent 
Slit system.


Question about strain : If I am making the hypothesis that the all 
sample is one phase without problem of reduction then the strain 
possibility seems interesting for me.


I will give you more informations after new measurements.

Cheers, François


Le 09/12/2017 21:52, hd yahoo a écrit :

Le 12/9/2017 à 7:49 PM, N. Dragoe a écrit :

Hi

ZnO can also have a darker colour if it is obtained by thermal 
treatment in low pressure of oxygen.
In my opinion, if all else is correct -I mean normal Soller slits, 
correct height,… etc- there might be sample strain.

Regards
N


Le 9 déc. 2017 à 16:25, Nilesh Kulkarni <mailto:nil...@tifr.res.in>> a écrit :


yes that is surprising. pellet is black while powder is white. ZnO 
pellet should also have been white.

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On Sat, Dec 9, 2017 at 1:31 AM, Joachim Breternitz 
<mailto:joachim.bretern...@helmholtz-berlin.de>> wrote:


Hi,

Given the fact that the peaks are shifted between the powder and
the pellet measurement, could it maybe be due to a height error
of the pellet during the measurement?

Best,
Joachim.

Am 8. Dezember 2017 20:48:35 MEZ schrieb Jon Wright
mailto:wri...@esrf.fr>>:

Hello,

In the photo, the pellet is black and the powder is white.
Why is that?

Best

Jon

On December 8, 2017 3:35:20 PM GMT+01:00, "François
Goutenoire" mailto:francois.gouteno...@univ-lemans.fr>> wrote:

Dear Rietveld users,

We observe an unusual asymmetric peak shape on pellet and
not when the sample has been crushed in powder.

This asymmetry is observed even at high 2theta angle. I
would like to known if someone has an explanation ?

I have put the data in the link here after

http://perso.univ-lemans.fr/~fgouten/Asymmetry
<http://perso.univ-lemans.fr/%7Efgouten/Asymmetry>

Best Whishes, François Goutenoire

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Mixed refinement Topas example

2018-11-02 Thread François Goutenoire

Dear Rietveld users,

I am starting with Topas5.0 commercial, and I would like to do a mixed 
X-Ray-Neutron refinement directly on GUI mode.


Does anyone can send me an example of *.PRO file or even an *.INP file 
to to the refinement in launch mode.


The neutron data are with constant wavelength.

Thanks in advance.

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Jana2006 example TOF_HRPD_ISIS

2019-02-14 Thread François Goutenoire

Dear Rietveld users,

I am currently working on neutron data (HRPD_ISIS) with Jana_2006.

I have some difficulties to start my refinement (unexpected error : 
correction for singularities too large)


Does anyone can send me example file on simple compounds (LaB6, Y2O3, …)

Thank in advance, François Goutenoire

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Occupancy factors for mixed site in TOPAS

2019-02-19 Thread François Goutenoire

Dear Rietveld users,

One more question ! I am unable to find the way to constraint occupancy 
factor for mixed sites in Topas in GUI mode.


Sorry for this basic question, but I did not find any examples in 
Archives Mailing List / Topas Wiki / or even in the Topas examples


Best whishes, François

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Re: Occupancy factors for mixed site in TOPAS

2019-02-20 Thread François Goutenoire

Thanks to every one.

It was not so difficult in fact .

Best whishes, François

Le 19/02/2019 à 11:02, François Goutenoire a écrit :

Dear Rietveld users,

One more question ! I am unable to find the way to constraint 
occupancy factor for mixed sites in Topas in GUI mode.


Sorry for this basic question, but I did not find any examples in 
Archives Mailing List / Topas Wiki / or even in the Topas examples


Best whishes, François


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FRANCE
*
Formation Rietveld CNRS 2019
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Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
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Bibliographie
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Fullprof multi pattern (TOF + RX)

2019-02-22 Thread François Goutenoire

Dear Rietveld users,

One more question !

Does any one has performed a mixed (TOF+RX) refinement with Fullprof ?

I would like to have an *.pcr file for model.

Best Whishes, Francois

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Bond Valence Restraints in Topas

2019-03-07 Thread François Goutenoire

Dear Rietveld users, especially Topas users,

I am now exploring the TOPAS in launch mode with some possibilities

I am trying to use the Bond Valence Restraints on the ZrW2O8 (Tutorial 
17 from John Evans)


I am difficulties to run the Bond Valence Restraints see files on the link

http://perso.univ-lemans.fr/~fgouten/Topas

If some one have used such restraint ?

Best whishes François Goutenoire

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FRANCE
*
Formation Rietveld CNRS 2019
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Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/stage.php?stage=19093
Bibliographie
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Re: Bond Valence Restraints in Topas

2019-03-07 Thread François Goutenoire

Dear all,

At least I have the beginning of my question :

The labeling of the atoms are not needed !!!

'---Bond valence 
Penalty-


' this is valence penalty for a W site

'

prm !val_weight 1.0 'this weights the valence penalties relative to 
other penalties


atomic_interaction W1_0_val = (Exp((1.917-R)/0.37));

ai_radius 2.5 ai_sites_1 W1 ai_sites_2 "O4 O1 O1 O1 O3" penalty = 
val_weight ( W1_0_val-6)^2;


' instead of : ai_radius 3.5 ai_sites_1 W1 ai_sites_2 "O4_0 O1_8 O1_0 
O1_6 O3_0" penalty = val_weight ( W1_0_val-6)^2; WRONG !


prm W1_0_num = W1_0_val/4;:4.25724` ! Divided by the site symmetry 4


It gives the same solution as BondStr

---

=> Bond-valence and coordination of atom: W1 occupancy: 1.000( 0)

---

(W1 )-(O1 ) : 1.9408( 0) 0.938( 0)

(W1 )-(O1 ) : 1.9408( 0) 0.938( 0)

(W1 )-(O1 ) : 1.9408( 0) 0.938( 0)

(W1 )-(O3 ) : 2.4695( 0) 0.225( 0)

(W1 )-(O4 ) : 1.8435( 0) 1.220( 0)

Coordination number: 5 Eff.Coor. number: 5.00 for atom: W1

Average distance : 2.0271( 0) Distortion: 122.539 xE-04

Predicted distance: 1.8495 Single bond-valence S= 1.200

Valence: 6.000

Sums: 4.257( 0)

Deviation from the Valence Sum Rule (r1,%dev): -1.743 29.045

{r1=Sumj(sij)-Vi, %dev=100abs(r1)/Vi}

Deviation from the Equal Valence Rule (r2): 0.332

{r2=>rms}


I need now to see the penalties !! need also some help !

Best whishes, François


Le 07/03/2019 à 16:03, François Goutenoire a écrit :

Dear Rietveld users, especially Topas users,

I am now exploring the TOPAS in launch mode with some possibilities

I am trying to use the Bond Valence Restraints on the ZrW2O8 (Tutorial 
17 from John Evans)


I am difficulties to run the Bond Valence Restraints see files on the 
link


http://perso.univ-lemans.fr/~fgouten/Topas

If some one have used such restraint ?

Best whishes François Goutenoire


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IMMM - UMR CNRS 6283
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F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS 2019
https://cnrsformation.cnrs.fr/stage.php?stage=19089
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/stage.php?stage=19093
Bibliographie
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Helping system for heavy load

2019-04-18 Thread François Goutenoire

Hello everyone,

Far away from the pure Rietveld question...

We have a beautiful XRK900 (furnace) system associated with our latest 
powder diffractometer.


However, the temperature chamber associated with Z-Stage is relatively 
heavy (15-20Kg ?)


and the tie is on the back panel and the arm stretched.

This poses us problems because we are not very strong ! and we do not 
want to hurt our backs !


Do you known some system to help us ? Small electric hoist ? .

Thank you in advance for your return


Sincerely, François


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Bibliographie
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IRF file in Jana

2020-11-25 Thread François Goutenoire

Dear Rietveld Users

I would like to use IRF file in Jana in order to do Size-Strain analysis.

But in the Tools/Powder/Export IRF File is not active ?

Thanks in advance, François


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Hyper-Lorentzian effect on quantitative analysis

2021-03-03 Thread François Goutenoire

Dear Rietveld users,

I have some industrial compound presenting a strong hyper-Lorentzian peak shape 
(eta=1.1 with HighScore). When we calculate the amorphous content after an 
internal standard addition, the result is 40%. The micro-absorption effect has 
been minimized (mu of the internal standard is closed to the compound).

But with some electronic transmission analysis no amorphous is observed.

The question is : Does a strong hyper-Lorentzian peak shape could influence 
quantitative analysis ?

François

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Re: Hyper-Lorentzian effect on quantitative analysis

2021-03-04 Thread François Goutenoire

 Dear Rietveld users,

Thank you very much for all your responses, it will help us move forward 
on the subject.

Unfortunately, I cannot say more because of an NDA.
But it still looks very interesting from a fundamental point of view.

Best whishes, françois Goutenoire

Le 03/03/2021 à 18:47, Mendenhall, Marcus H. (Fed) a écrit :

Is it really amorphous content, or is there a whole bunch of very fine 
nanocrystalline stuff or material with a very high defect density that is 
widening the peak?  If the fitter is having trouble matching the peak shape, it 
may be ascribing a fairly arbitrary portion between amorphous and crystalline.

Marcus Mendenhall

Materials Measurement Science Division
National Institute of Science and Technology
100 Bureau Dr. stop 8370 (217/B115)
Gaithersburg, MD 20899 USA
Phone: +1-301-975-8631
during COVID-19 response period:
Home phone: 301-916-5486
Cell: 615-293-3120


On Mar 3, 2021, at 7:34 AM, François Goutenoire 
 wrote:

Dear Rietveld users,

I have some industrial compound presenting a strong hyper-Lorentzian peak shape 
(eta=1.1 with HighScore). When we calculate the amorphous content after an 
internal standard addition, the result is 40%. The micro-absorption effect has 
been minimized (mu of the internal standard is closed to the compound).

But with some electronic transmission analysis no amorphous is observed.

The question is : Does a strong hyper-Lorentzian peak shape could influence 
quantitative analysis ?

François

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e-mail: francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
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C60 orthorhombic structure

2021-09-24 Thread francois Goutenoire

Dear Rietveld users,

We are currently looking for the atomic structure (cif file) of the C60 
Orthorhombic cell


The previous paper : "Structure and superconductivity of single 
crystalline C60" from Koichi Kikuchi et al.


Physica C in 1975

The cell parameters are given  a=25.011 Ang, b=25.582 Ang. c=10.003 Ang. 
Space group Pbnm


but there is not atomic position in the paper.

Best regards, françois Goutenoire

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Re: C60 orthorhombic structure

2021-09-24 Thread francois Goutenoire

Dear Rietveld users,

Sorry for the mistake, the paper was published in 1991.

I put the paper in the link

http:\\perso.univ-lemans.fr\~fgouten\C60

From the previous answer it seems that it is not really realiable.

Best wishes françois Goutenoire


Le 24/09/2021 à 12:05, francois Goutenoire a écrit :

Dear Rietveld users,

We are currently looking for the atomic structure (cif file) of the 
C60 Orthorhombic cell


The previous paper : "Structure and superconductivity of single 
crystalline C60" from Koichi Kikuchi et al.


Physica C in 1975

The cell parameters are given  a=25.011 Ang, b=25.582 Ang. c=10.003 
Ang. Space group Pbnm


but there is not atomic position in the paper.

Best regards, françois Goutenoire


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Département des Oxydes et Fluorures
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IMMM - UMR CNRS 6283
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS 2020
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS 2020
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002

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Commercial contact GE for X-ray tube

2021-12-02 Thread francois Goutenoire

Dear Rietveld users,

I have lost my commercial contact to buy an X-ray tube from GE.

Does any one can help me ?

Best wishes François

--
*
Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Skype Entreprise visio conférence
Département des Oxydes et Fluorures
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS 2020
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS 2020
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002
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Variable Step Size reference

2022-04-04 Thread francois Goutenoire

Dear Rietveld users,

I am currently looking for a reference for the strategy of collecting 
XRD data on lab diffractometer.


With the help of new diffractometers we can collect the data in the VCT 
(Variable Counting Time).


This last method has been studied by IC Madsen and RJ Hill (1994).

Now we can also collect the data with different step size for a long two 
theta range (example : from 5 to 150 two theta) with some different 
steps size depending of the FWHM evolution (example 0.013 / 0.026 and 
0.039).


After the data can be easily modified to get the 0.013 step 
(HighScorePlus).


Is there any good paper about this VCT -VSS (Variable Step Size) 
methodology ?


Best wishes, Francois


--
*
Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002
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Sealing capillary in a glove box

2023-01-30 Thread francois Goutenoire

Dear Rietveld users,

We are currently working with some very hygroscopic compounds in 
capillaries.


These capillaries are fill in a glove box (N2).

How can we sealed these capillaries (borosilicate) in the glove box ?

Best wishes, François

--
*
Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002
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How to publish structure determination from powder easily !

2023-06-02 Thread francois Goutenoire

Dear Rietveld users,

Quite a strange question : what is the best journal to publish structure 
determination from powder ?


I/We are publishing structure determination from now more than 25 years 
(see our work below).


But I have the feeling that it is more and more difficult to publish 
these articles, in fact I think that the editor and the reviewers do not 
have the knowledge of the difficulty to solve structure from powder.


In some recent case, we had a huge difficulty to publish the paper on 
La34Mo8O75.


See below our response to an editor after the reject of our manuscript :

https://perso.univ-lemans.fr/~fgouten/Structure_Determination_Powder

I will be pleased to ear a comment to this feeling.

Best wishes, François

--
*
Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002
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++



How to publish structure determination from powder easily ! (with the good link !!)

2023-06-02 Thread francois Goutenoire

Dear Rietveld users,

Quite a strange question : what is the best journal to publish structure 
determination from powder ?


I/We are publishing structure determination from now more than 25 years 
(see our work below).


But I have the feeling that it is more and more difficult to publish 
these articles, in fact I think that the editor and the reviewers do not 
have the knowledge of the difficulty to solve structure from powder.


In some recent case, we had a huge difficulty to publish the paper on 
La34Mo8O75.


See below our response to an editor after the reject of our manuscript :

https://perso.univ-lemans.fr/~fgouten/Structure_Determination_Powder

I will be pleased to ear a comment to this feeling.

Best wishes, François

--
*
Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002
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++



Re: [EXT] [External] Re: Step-like basline

2023-09-05 Thread francois Goutenoire
ten get email from
b...@indiana.edu <mailto:b...@indiana.edu>. Learn why this is 
important
<https://urldefense.com/v3/__https:/aka.ms/LearnAboutSenderIdentification__;!!IKRxdwAv5BmarQ!fFhSHn4S5iEzkW-O9lvWG-OzoqK_2SKhRniGa71nxuOL3GcxiyD83i2mnNN0Z48HPkn4zjKqH-aqqA$> 



Hello Shay,

I think it is probably related to "tube tails". You can read 
about this in
the literature (e.g., on the BGMN web site) and you can model 
it in some
Rietveld software such as Topas. You don't normally notice 
this but it

becomes apparent with higher-intensity peaks.



Regards,

Dave
--

*From:* rietveld_l-requ...@ill.fr 
<mailto:rietveld_l-requ...@ill.fr> <mailto:rietveld_l-requ...@ill.fr>> on behalf
of Fernando Igoa <mailto:fer.igoa.1...@gmail.com>>

*Sent:* Sunday, September 3, 2023 3:06 AM
*To:* Shay Tirosh <mailto:stiro...@gmail.com>>
*Cc:* Rietveld List (rietveld_l@ill.fr 
<mailto:rietveld_l@ill.fr>) <mailto:rietveld_l@ill.fr>>

*Subject:* [External] Re: Step-like basline



This message was sent from a non-IU address. Please exercise 
caution when

clicking links or opening attachments from external sources.



Hey Shay,



Are you using a motorized slit during the measurement? These 
may open up
abruptly to compensate for the angular dependence of the 
footprint and thus

generate an abrupt increase in the intensity.



Hope it helps :)



On Sun, Sep 3, 2023, 8:50 AM Shay Tirosh <mailto:stiro...@gmail.com>> wrote:


Dear Rietvelders

I am attaching a zoom-in on a diffraction profile.

My question is what is the origin of the step-like profile 
next to a very

large reflection peak?

Is it a sample preparation problem?

Is it part of the baseline?

Thanks

Shay

--











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TU Bergakademie Freiberg
Dr. R. Kleeberg
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Brennhausgasse 14
D-09596 Freiberg

Tel. ++49 (0) 3731-39-3244
Fax. ++49 (0) 3731-39-3129
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<mailto:alan.he...@neutronoptics.com>> +33.476.98.41.68
http://www.NeutronOptics.com/hewat 
<http://www.neutronoptics.com/hewat> 
<http://www.neutronoptics.com/hewat>

__



-- TU Bergakademie Freiberg
Dr. R. Kleeberg
Mineralogisches Labor
Brennhausgasse 14
D-09596 Freiberg

Tel. ++49 (0) 3731-39-3244
Fax. ++49 (0) 3731-39-3129


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--
*
Pr. Francois GOUTENOIRE
e-mail: francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE

Legendre polynomial coefficient

2024-03-27 Thread francois Goutenoire

Dear Rietveld users

I have some data collected on a synchrotron line on reflection mode.

The sample is an ancient steel (Fe alpha + Fe3C). The aim is to analyzed 
Fe/Fe3C in order to get the carbon content.


The total scattering volume is obviously not constant with 2 theta.

We can observe an increase of the background and the Rietveld refinement 
is not possible, but the Le Bail fit is good (see on the link).


In order to get a good Rietveld refinement, I would like to modified the 
data (Sorry !! I known is not acceptable ! Joke).


The idea is to use the background to modified the intensities, in order 
to get a flat background.


I would like to use the Legendre polynomials coefficients to do this 
correction.


Does someone know how to to that ?

Link for the images https://perso.univ-lemans.fr/~fgouten/Legendre

Best wishes, francois

--
*
Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002
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++



Re: Legendre polynomial coefficient

2024-05-28 Thread francois Goutenoire

Dear Rietveld Users,

The correction of the data with the Legendre polynomials coefficients 
was too difficult.


I have used HighScore to extract the background and to correct the data 
with the relation :


I corrected = I obs / I background done with Excel

The final result is not too bad !!

All the informations are in the link

Link for data + the Jana refinement 
https://perso.univ-lemans.fr/~fgouten/Legendre


Best wishes, francois


Le 27/03/2024 à 15:23, francois Goutenoire a écrit :


Dear Rietveld users

I have some data collected on a synchrotron line on reflection mode.

The sample is an ancient steel (Fe alpha + Fe3C). The aim is to 
analyzed Fe/Fe3C in order to get the carbon content.


The total scattering volume is obviously not constant with 2 theta.

We can observe an increase of the background and the Rietveld 
refinement is not possible, but the Le Bail fit is good (see on the link).


In order to get a good Rietveld refinement, I would like to modified 
the data (Sorry !! I known is not acceptable ! Joke).


The idea is to use the background to modified the intensities, in 
order to get a flat background.


I would like to use the Legendre polynomials coefficients to do this 
correction.


Does someone know how to to that ?

Link for the images https://perso.univ-lemans.fr/~fgouten/Legendre

Best wishes, francois

--
*
Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002

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--
*****
Pr. Francois GOUTENOIRE
e-mail:francois.gouteno...@univ-lemans.fr
Tel: 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caracterisation des Composés Cristalisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Formation SAXS et Réflectivités pour couches minces et matériaux nanostructurés.
https://cnrsformation.cnrs.fr/caracterisation-des-materiaux-nanostructures-par-diffusion-des-rayons-x?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
https://orcid.org/-0001-5339-3002
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Structural refinement with variable divergence slit

1999-04-28 Thread Francois Goutenoire

Hi all rietveld users,

We would like to use the variable slit attached with our diffractometer for
Rietveld refinement. I have read the basic papers on the subject : Modern
Powder Diffraction  +  the paper by M.E.Bowden et al « Comparison of
intensities from fixed and variable divergence X-ray diffraction experiments
» in Powder Diffraction, Vol 6, No. 2, June 1991 + the few lines in the
Lebail site « low FWHM and Rp» found at
http://pcb4122.univ-lemans.fr/powdif/low_fwhm_and_rp.html.

my questions are : 

is there a large discrepancy to the theoretical expression :
IFDS/IVDS=1/sin(theta) ?
then could we simply applied this correction on the data, and then performed
a regular Rietveld refinement with Fullprof or GSAS ?
Is there any comparison beetwen structural data obtained by the both FDS
(Fixed Divergence Slit) and VDS (Variable Divergence Slit) ?

Thanks in advance,


/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Dr. François Goutenoire
Laboratoire des Fluorures  UPRES 6010
Av. Olivier Messiaen 72085 Le Mans Cedex
Tel : 02.43.83.33.53
Fax : 02.43.83.35.06
E-Mail : [EMAIL PROTECTED]
/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\



Postdoctoral Position (URGENT)

2000-05-09 Thread Francois Goutenoire

Postdoctoral Position 

Postdoc position funded by the « Region des pays de la Loire » could be
available at the « Laboratoire des Fluorures » of « Universite du Maine »
(Le Mans , France) for the following project :

We have recently discover a new class of fast oxide-ion conductor based on
La2Mo2O9 (Nature, vol 404, 856-858). These materials attract considerable
interest for both fundamental and technical reasons, due to their important
fields of application, among which solid oxide fuel cells, oxygen sensors,
or oxygen pumping devices. More work is needed in order to fully
characterise the structure and properties of this new class of material.
The candidate will work on synthesis (powder, single crystal) by solid state
reaction, on structural characterisation (X-ray powder and single crystal
diffraction, electron diffraction JEOL2010), on physical characterisation
(impedance spectroscopy). Candidate with different knowledge related to the
characterisation of fast oxide-ion conductor are also invited to postulated.

Information (in French) on our laboratory are available on our site 
http://www.univ-lemans.fr/sciences/fluorures/ldf.html


Our laboratory will submit a proposition (a candidate + a subject), closing
date 21 Mai 2000.
In case of acceptance, the position is available for 11 month with a
possible extension. The salary is about 12000FF per month. The applicant
should hold a PhD degree, be younger than 35. Application including a CV, a
list of publications (and references) should be adressed by E-Mail to me .

Address :
Laboratoire des Fluorures
Universite du Maine
Av. Olivier Messieaen
BP 535
72000 Le Mans France



/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Dr. François Goutenoire
Laboratoire des Fluorures  UPRES 6010
Av. Olivier Messiaen 72085 Le Mans Cedex
Tel : 02.43.83.33.53
Fax : 02.43.83.35.06
E-Mail : [EMAIL PROTECTED]
/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\




Pcr file for mixed Neutron+Xray for magnetic structure

2000-11-20 Thread Francois Goutenoire

Dear colleagues,


I used to work with the Rietvield 's program called Fullprof under many
conditions of refinement on powder (X-ray and/or neutron data at different
temperatures).
I know how to refine neutron data files with nuclear and magnetic
contributions. I am able to refine  the structure by coupling X-ray and
neutron data,  but the same procedure doesn't work if I try to refine the
magnetic structure. Is it possible to couple both neutron and X-ray data set
with the ultimate goal of refining the magnetic structure? My problem is
that I have the advantage of refining some atomic positions better by X-ray
and so I would like to retain that advantage by using both X-ray data along
with neutron data.

I'm just asking you to send me an example of a pcr's file to solve my problem.

Thanks in anticipation

Francois Goutenoire



/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Dr. François Goutenoire
Laboratoire des Fluorures  UPRES 6010
Av. Olivier Messiaen 72085 Le Mans Cedex
Tel : 02.43.83.33.53
Fax : 02.43.83.35.06
E-Mail : [EMAIL PROTECTED]
/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\




Correction for variable slit with Fullprof

2000-12-20 Thread Francois Goutenoire

Dear colleagues,

I have data collected in a Bruker diffractometer D8 in variable divergent
slits V6/V6, I would like to correct the data by using the ICORR variable
and the file COR.COR in the program FULLPROF. Does anyone have use this
option ? it seems that it does not work.

My file for the correction is below :
Fichier de correction V6/V6 I(FDS)=correction*I(VDS)
 5.00   2.063901
10.00   1.035891
15.00   0.695004
20.00   0.525933
25.00   0.425630
30.00   0.359757
35.00   0.313607
40.00   0.279838
45.00   0.254382
50.00   0.234809
55.00   0.219584
60.00   0.207697
65.00   0.198463

Thanks

Francois Goutenoire



/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\
Dr. François Goutenoire
Laboratoire des Fluorures  UPRES 6010
Av. Olivier Messiaen 72085 Le Mans Cedex
Tel : 02.43.83.33.53
Fax : 02.43.83.35.06
E-Mail : [EMAIL PROTECTED]
/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\/\




Evolution of the resolution versus diameter

2005-05-30 Thread François Goutenoire

Dear Rietveld users,

I would like to know if someone have test the evolution of the resolution
versus the diameter of the goniometer.

We have in the lab a D8 with the Bragg-Brentano geometry, sollers 2°,
Variable Slits (Divergent and Anti-Scattering), Sollers 2° with a
secondary monochromator.( see Armel Web site for more information).
The resolution measured on Nist 1976 is roughly 0.045° for the first peak
at 25° (K alpha copper) with the smallest diameter 430mm.
The goniometer diffractometer is ajustable to 430, 500 et 600mm.

Before testing this evolution by myself I would like to know if some one
have done such test, what can we obtained in term of increase of the
resolution, lost in counting, decrease of asymmetry at low angle….

François



 Dr. François Goutenoire
 Maître de Conférences
 Assistant Professor

Laboratoire des Oxydes et des Fluorures
    Av. Olivier Messiaen 
72000 Le Mans, France

  Tel:02.43.83.33.53
  Fax:02.43.83.35.06
 
http://www.univ-lemans.fr


Hyper Lorentzian peak shape

2007-11-21 Thread Francois Goutenoire

Dear Rietveld users,

I am currently working on Williamson-Hall graph in order to check strain 
effect on some new phase.


I have some hyper-lorentzian peaks eta>1 from a pseudo-Voigt 
decomposition , then I am not able to get BetaL and BetaG from Winplotr 
decomposition.


Does anyone have an idea ?


Francois Goutenoire
Laboratoire des Oxydes et des Fluorures, UMR6010.




X-ray data on organic compouds

2007-12-05 Thread Francois Goutenoire

Dear rietveld users,

I am looking for nice X-ray data on organic compounds in order to check 
: autoindexation , space group analysis and ab-initio resolution 
methodology.
I am interesting by the data published with the paper : Solving 
molecular crystal structures from laboratory X-ray powder diffraction 
data with DASH…..


The link http://www.powderdata.info
/Give this :
Data and metadata was due to be available here from 1st April 2005 to 
coincide with the paper publication of Florence et al., Journal of 
Applied Crystallography (2005) Volume 38 Pages 249-259.
We regret that there will be a delay in achieving this due to some 
contractual issues.
We are working to resolve these as quickly as possible; please check 
back in late De/


Does anyone have these data ?

Best Whishes, François Goutenoire
Laboratoire des Oxydes et Fluorures, UMR6010
France.




TOF profil problem

2008-09-04 Thread Francois Goutenoire

Dear Rietveld Users,

I am currently trying to work with TOF (HRPD – ISIS) data with Fullprof.

In order to learn more about the diffractometer and the profile I have
started with a standard : the CeO2 Sharp from the Round Robin (Balzar).
I have done a pattern matching refinement, but I fell that my profile is
not so great Rwp around 15%.
I have read the nice and pedagogical Chapter 4 from Neutron Rietveld
Refinement from R.B. Von Dreele in the Reviews in Mineralogy (n°64) and
the Fullprof manual but I am still lost.
The profile in TOF is really more complicated than a simple pseudo-Voigt
function !

My questions / requests:
- I have the gamma values in the IRF and the PCR file, but in the Edit
Pcr I am unable to get them ?

   - Instrumental resolution function for HRPD/ISIS L. Chapon 12/2003
   - ! To be used with function NPROF=9 in FullProf (Res=5)
   - !  Bank 1
   - ! Type of profile function: back-to-back expon * pseudo-Voigt
   - NPROF 9
   - ! Tof-min(us) step Tof-max(us)
   - TOFRG 15000. 1. 115000.0
   - ! Dtt1 Dtt2 Zero
   - D2TOF 48288.88670 -4.66859 -3.015
   - ! TOF-TWOTH of the bank
   - TWOTH 168.33
   - ! Sig-2 Sig-1 Sig-0
   - SIGMA 0.736 120.766 0.000
   - ! Gam-2 Gam-1 Gam-0
   - GAMMA 0.000 4.095 0.000
   - ! alph0 beta0 alph1 beta1
   - ALFBE 0.00 0.024506 0.152657 0.012394
   - END



   Sig-2 Sig-1 Sig-0 Xt Yt Z1 Z0 Size-Model
   ! 0.736 318.676 -66.849 <- Instr. par. + shifts. Only shifts are
   refined
   0.000 197.910 -66.849 0.000 0.000 0.000 0.000 0
   0.00 71.00 81.00 0.00 0.00 0.00 0.00
   ! Gam-2 Gam-1 Gam-0 LStr LSiz
   ! -3.682 16.132 0.000 <- Instr. par. + shifts. Only shifts are
   refined
   -3.682 12.037 0.000 0.000 0.000
   0.00 0.00 0.00 0.00 0.00



- For HRPD there is an IRF file with NPROF =9, is it possible to use
NPROF =13 and if yes, does anyone have such IRF file ? or how create
such file ?
- For constant wavelength, we can use a special order for the refinement
variables /Scale/Flat Background/W/Eta…. Is there any same rules for TOF
refinement ?
- Does anyone have done such works with GSAS on the same data ?, in
order to compare the reliability factors.

Thanks in advance,


--
Dr. François Goutenoire
Maître de Conférences, IUT Le Mans
Laboratoire des Oxydes et Fluorures, UMR6010
Avenue Olivier Messiaen,
72085 Le Mans, Cedex 9







Re: powder diffractometers with high temperature attachment

2009-04-20 Thread Francois Goutenoire

Hi

We have for now 5 years an HTK12 (1200°C maximum) with a MPD + X’Cellerator.

This is really a nice ‘combinaison’, with new fast detectors 
(X’Cellerator, Vantec …..) you can have a nice counting statistic in few 
minutes (15-25 minutes).


Recently I have explore the WO3 phase transitions as a school case for 
second order phase transitions, from RT to 930°C in 22 Hours Step in 
temperature 25°C (37 temperatures scanned) measured from 12 to 90° (2 
theta).


It gives very large counting I Max 16 for the more symmetric 
compound at 930°C.


/I can send the data if asked./

I order to increase the intensity, we use larger slits (manual divergent 
slit 0.5°/1° and also larger Sollers Slit 0.04° instead of the usual 
0.02°).


The thermal linearity of the HTK12 is really good, test with some Y2O3 
from 20 to 1200°C during the testing phase, the homogeneity is also 
really good this is a furnace not a strip. Calibration of the 
temperature is not so evident for really precise value, but new in 
models the thermocouple is closer to the sample.


In our lab, for few years the furnace was used during single nights, 
mounting time (10 to 15 minutes).


If, you can tested your system, Y2O3 is really nice.



Leopoldo Suescun wrote:

Hi,
May I ask your help with this not specifically Rietveld-related question?

I'm helping a colleague buy a new powder diffractometer with high
temperature attachment but I myself have little experience with this
particular attachment.

I'd appreciate if anyone could comment on the three most popular Rigaku,
Panalytical and Bruker systems that offer these attachments. Mainly:
simplicity of operation/mounting, temperature stability, typical data
collection speeds (comparing Rietveld quality data in a typical range
20-120 with/without high-T chamber) and price/value relation.

He's on a hurry so comments are welcome and will be useful before Wednesday.
Thanks in advance for your kind help.

Leo


  



--
Dr. François Goutenoire
Maître de Conférences, IUT Le Mans
Laboratoire des Oxydes et Fluorures, UMR6010
Avenue Olivier Messiaen, 
72085 Le Mans, Cedex 9







Re: Virtual crystallographic Calculators V.2

2024-10-15 Thread François GOUTENOIRE

Dear Rietveld users,

A small Excel sheet + some explanations in french (sorry !)

I hope that I am giving the good answer

https://perso.univ-lemans.fr/~fgouten/Irradiation_Area

Best wishes, Francois


Le 15/10/2024 à 13:04, Nelson Duarte a écrit :

Dear Colleagues,
I`m trying to access a Virtual crystallographic Calculators V.2 at 
webpagge 
http://mill2.chem.ucl.ac.uk/ccp/web-mirrors/krumm/html/xray/vcc.html 
but are offline
Anyone knows a similar website for the calculation of the slit size, 
(Incident Slit and Irradiation Area) ?


Thanks in advance
Best regards
Nelson

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--

Francois Goutenoire Chef du Département Chimie IUT Le Mans
Avenue Olivier Messiaen, 72085 - LE MANS Cedex 09 iut.univ-lemans.fr 
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Membre de l'alliance d'universités européennes COLOURS

*****
Pr. Francois GOUTENOIRE
e-mail: francois.gouteno...@univ-lemans.fr
Chef du Département Chimie de l'IUT du Mans
Tel(IUT): 02.43.83.34.26
Tel (IMMM): 02.43.83.33.54
FAX: 02.43.83.35.06
Institut des Molécules et des Matériaux du Mans
IMMM - UMR CNRS 6283
Elaboration et Caractérisation des Composés Cristallisés (E3C)
Université du Maine - Avenue Olivier Messiaen
F-72085 Le Mans Cedex 9
FRANCE
*
Formation Rietveld CNRS
https://cnrsformation.cnrs.fr/diffraction-des-rayons-x-sur-materiaux-polycristallins?axe=135
Formation EDX CNRS
https://cnrsformation.cnrs.fr/fluorescence-x-edx?axe=135
Bibliographie
https://scholar.google.fr/citations?hl=fr&user=qC-lmN4J&view_op=list_works&authuser=1&sortby=title
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