Re: [External] Re: some uncertainties regarding the Rietveld refinement results in TOPAS

2024-11-08 Thread Matthew Rowles
I agree with everything Dave said.

I was a little terse in my response. Physically, altering a unit cell's
contents is going to alter its size and the intensities.


On Thu, 7 Nov 2024, 20:49 Bish, David L,  wrote:

> Matthew has given a nice summary for you, but I'd like to add one thing.
> Whenever the site occupancies change, the unit-cell parameters will/should
> change (unless the substituting ions have identical radii). You can
> actually use the refined unit-cell parameters to estimate compositions in
> many cases. You should always refine the uc parameters (with the exception
> of a certified standard), and if your materials' compositions change, you
> can expect the uc parameters to vary. Even if they change by only a small
> amount, they can have a significant effect on the fit. I would not fix the
> uc parameters in a refinement unless you are working with materials of a
> known, fixed composition, e.g., synthetic, pure materials. Having said
> this, if the substitutions are very minor, e.g., ppm level, you will likely
> not see any effect. But, as you said, reflection positions and thus uc
> parameters vary even for the same materials listed in the PDF and the COD.
>
> Also, keep in mind that the extent of the effect of site occupancy
> variations on intensities will depend on the scattering factors of the
> substituting ions. Si-Al substitutions, for example, in minerals such as
> feldspars will have a negligible effect on intensities but a larger effect
> on uc parameters. On the other hand, Mg-Fe substitution in the olivine
> minerals will affect both intensities and uc parameters, and you can use
> either or both of these to estimate composition.
>
> Best of luck with your refinements.
>
> Dave
> --
> *From:* rietveld_l-requ...@ill.fr  on behalf
> of Matthew Rowles 
> *Sent:* Wednesday, November 6, 2024 11:03 PM
> *To:* Łukasz Kruszewski 
> *Cc:* Rietveld 
> *Subject:* [External] Re: some uncertainties regarding the Rietveld
> refinement results in TOPAS
>
>
> This message was sent from a non-IU address. Please exercise caution when
> clicking links or opening attachments from external sources.
>
> Great questions!
>
> > does the Absorption correction also influences microabsorption?
>
> No. The absorption correction in TOPAS is only a peak-shape correction to
> account for the transparency of the specimen. There is no real way to
> correct for microabsorption beyond grinding to a fine particle size,
> changing your wavelength, or moving to neutrons.
>
>
> > Is it worthy to use the parameter known as "Sample Thickness",
> associated with the Absorption Correction in TOPAS?
>
> Generally, no. You only need to worry about it if the penetration depth of
> your incident beam is larger than the thickness of the specimen. If that is
> the case, then "Sample Thickness" and "Scale Intensity" is necessary to
> correct for the change in peak shape due to the finite depth, and the
> change in diffracting volume.
>
>
> >Is there any difference, to be expected, in the calculated unit cell
> parameters, between approximating a phase using (1) a chemically pure
> STRUCTURE model, and (2) a STRUCTURE with Occupancy information updated
> with the known content of impurities?
>
> Altering site occupancies should only affect peak intensities, and so unit
> cell parameters should only be a second-order effect. (disregarding the
> physicality of various unit cell contents vs dimension pairings)
>
>
> > Is the negative intensity in the difference curve...
>
> It is showing that there is some mismatch between your model and the data.
> The intensities could be off because the peaks positions are wrong, the
> peak-shape is wrong, the atomic displacement parameters are wrong (don't
> refine these from normal QPA data), the LP factor correction is wrong, the
> site occupancies are wrong, the atomic scattering factors are wrong. Could
> also be that you have forgotten to refine a parameter that you should be.
>
>
> > We have been working using few computers with, supposedly the very same
> version of the software
>
> That does seem concerning. There can be differences between different
> versions of TOPAS. You would also need to verify that all the scattering
> factors, wavelengths, MACs, and space group files are the same for all
> installations, and that nothing has been incorrectly edited. Also that
> TOPAS.inc hasn't been touched.
>
>
> Hope this helps.
>
>
> Matthew
>
>
>
>
>
>
>
>
>
>
> On Wed, 6 Nov 2024 at 19:12, Łukasz Kruszewski 
> wrote:
>
> Dear Rietvelders,
>
> after some years of being a happy user of TOPAS & Rietveld method (after
> working-out a good approach, thanks to a great help from users of this
> mailing list for which I am really thanful, and having it checked by
> attendance in Reynolds Cup) I was recently confronted with few questions
> I couldn't answer. I thus have a kind request of a help here:
>
> - does the Absorption correction also influences microabsorpti

Re: some uncertainties regarding the Rietveld refinement results in TOPAS

2024-11-08 Thread Matthew Rowles
Hi Daniel

The peak shape variation comes from exponential absorption of the incident
and directed X-rays due to their interaction below the specimen's surface.
In the case of a finite thickness sample, this exponential gets truncated.
I'm pretty sure I talk about this in Rowles & Buckley.

Intensity is the main thing. Peak shape is going to be dominated by
crystallite size/strain, but in its absence, youll see cut off in the peak
trails due to finite thickness.

Matthew



On Thu, 7 Nov 2024, 16:39 Daniel Chateigner, 
wrote:

> Dear All,
>
> Just to be sure on two of the Q&As:
> Le 07/11/2024 à 05:03, Matthew Rowles a écrit :
>
> Great questions!
>
>
> > Is it worthy to use the parameter known as "Sample Thickness",
> associated with the Absorption Correction in TOPAS?
>
> Generally, no. You only need to worry about it if the penetration depth of
> your incident beam is larger than the thickness (t) of the specimen. If
> that is the case, then "Sample Thickness" and "Scale Intensity" is
> necessary to correct for the change in peak shape due to the finite depth,
> and the change in diffracting volume.
>
> - Seems from your answer Matthew, that diffracting volume changes (Vd)
> through the scan in BB geometry gives rise to some peak shape variations (I
> assume here that "shape" includes "width"). I agree that the diffracting
> volume changes with theta, and with the sample thickness, but these two
> effects should not contribute the same on the peak shape:
>
> -- For a given sample thickness, the diffracting volume varies with Theta,
> but to me the main contribution to the peak shape is due to the irradiated
> surface (beam track on the sample surface). Since deeper dVd will be more
> absorbed than the ones closer to the surface. You can picture this
> measuring a 2Theta scan at fixed incident angle, up to 2Theta=90°, the peak
> width increases notably with 2Theta because of this.
>
> -- For the same theta on the diffraction diagram, varying the sample
> thickness will probably not modify this much the shape of the peaks, but
> intensities. For the same reasons on dVd. For instance, if measuring 2
> samples with a 100 nm and 200 nm thickness respectively, the peak shape
> variation will probably not be visible using lab instruments, while the
> intensities will differ significantly.
>
> - I do not like much the term "penetration depth" (p), since the depth
> reached by x-rays is always infinite. For instance, if as usual p is
> defined as 1/mu (mu = absorption coefficient of the sample, the one we
> never fully know exactly), using a Theta-2Theta scan in BB on a t=infinity
> sample, the measured diffracted intensity is larger than the one coming
> from p only. And, on a thin specimen, both absorption and Vd are varying
> during the scans, each of them bringing a contribution to the intensity. On
> the contrary, for t=infinite specimen, they compensate each-other and their
> contribution is the same on the diffracted intensity throughout the diagram
> (but the intensity does not come from the same irradiated volume). I was
> then wondering if Topas was simply corrected from volume variations or also
> including the absorption variations in the case of "thin enough" samples ?
>
>
>
>
> > Is the negative intensity in the difference curve...
>
> It is showing that there is some mismatch between your model and the data.
> The intensities could be off because the peaks positions are wrong, the
> peak-shape is wrong, the atomic displacement parameters are wrong (don't
> refine these from normal QPA data), the LP factor correction is wrong, the
> site occupancies are wrong, the atomic scattering factors are wrong. Could
> also be that you have forgotten to refine a parameter that you should be.
>
> What about preferred orientations ? Anisotropic crystallite shapes and
> microstrains ? Improperly defined film thickness can give rise to
> variations of the ADPs also.
>
>
> My 2€cts !
>
> Daniel
>
>
>
>
>
>
>
>
>
>
>
> On Wed, 6 Nov 2024 at 19:12, Łukasz Kruszewski 
> wrote:
>
>> Dear Rietvelders,
>>
>> after some years of being a happy user of TOPAS & Rietveld method (after
>> working-out a good approach, thanks to a great help from users of this
>> mailing list for which I am really thanful, and having it checked by
>> attendance in Reynolds Cup) I was recently confronted with few questions
>> I couldn't answer. I thus have a kind request of a help here:
>>
>> - does the Absorption correction also influences microabsorption? This
>> question arose due to somewhat lowered expected wt.% of pyrite (19
>> instead of 25), FeS2, even though all the used parameters (Absorption,
>> CrySize, Strain - for all the sample components) were checked and proven
>> to give value > error, i.e., being physically meaningful for the
>> refinement model. I was wondering how this supposed non-precision for
>> pyrite could be addressed...
>>
>> - Is it worthy to use the parameter known as "Sample Thickness",
>> associated with the Absor