On Son, 13 Feb 2000, you wrote:
> Mahlzeit
>
>
> Because of the miserable quality of the free CT-API drivers, I
> wrote a test program for CT-API drivers. This program includes
> now 37 tests. Each test executes one command. Without checking
> of sad/dad the two drivers, I can test, pass 21 respectively 5
> tests. With checking of sad/dad it would be about 0 and 0. I
> will test it an official Windows CT-API driver to see how good
> it is and more important if they did interpret CT-API/CT-BCS
> the same way I did. This will then be available with the hope
> to improve the quality of the drivers.
I'm very interested in such a test program, because I already thought about
writing one myself. Do you also test the implementation of the Interindustry
Command Set for synchronous cards (SELECT, READ BINARY, UPDATE BINARY etc.) ?
This would be very helpful, Andreas
--
Andreas Schwier Tel. +49 171 8334920
CardContact Software & System Consulting
http://www.cardcontact.de
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Linux Smart Card Developers - M.U.S.C.L.E.
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