http://www.nature.com/articles/srep31625 on "Full Diffraction Profile
Analysis"
I like figure 1 and look forward to seeing the method applied to quantify
uncertainty by appropriately
modeling the heteroskedasticity and correlation of the error structure in
something other than silicon.
Alan
______________________________________________
* Dr Alan Hewat, NeutronOptics, Grenoble, FRANCE *
<alan.he...@neutronoptics.com> +33.476.98.41.68
http://www.NeutronOptics.com/hewat
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