With regards grazing incidence, it also depends on the diffracted beam optics, but it does hold, after correcting for instrumental effects.
have a look at one of my papers http://dx.doi.org/10.1107/S0021889810007673 On 18/07/2014 4:21 AM, Łukasz Kruszewski <lkruszew...@twarda.pan.pl> wrote: > Hi. > > The XRD profile (spectrum) does not only depend on the geometry type, but > also width of both slits (primary divergence and secondary anti-scatter), > symmetric (the same at the primary and secondary part) or non-symmetric > solers, the use of any additional optical elements (e.g., we use radial > soler instead of the secondary slit), type of detector (the "detector > slit" of the zero-dimensional detector does not have the same physical > meaning as the corresponding window of the position-sensitive detector). > You cannot hold the B-B geometry in the reflection mode when you go to > transmission mode - that is why the second one is used to observe > reflections that are not seen (or barely seen) in the previous mode. Peak > shape, including its width, would - in some cases - also be different, but > peak intensity would especially be affected (in many cases). > > I would use LaB6 and silicon standards (of NIST SRM) instead of > corrections to check the geometry. > > I'm not an expert in terms of grazing incidence, but I'm pretty sure that > is gives much different information, as this is more textural information. > > > Dear Rietvelders > > > > > > > > Does analysis done in Bragg Brentano geometry holds for other geometries > > and XRD techniques providing one have diffracted peaks? > > > > Are there corrections needed to apply between methods. > > > > Say Sheher formula. Dose it holds for peaks reflecting using in-plan > > grazing incident reflections experiment or it needs to be corrected? > > > > > > Thank you from advance > > > > Shay > > > > -- > > _________________________________________________ > > > > Dr. Shay Tirosh > > Institute for Nanotechnology & Advanced Materials > > Bar Ilan University > > Ramat Gan, 52900 > > Israel > > Phone: +972-(0)30-531-7320 > > Mobile: +972-(0)54-8834533 > > Email: stiro...@gmail.com > > _________________________________________________ > > > > > -- > Łukasz Kruszewski, Ph.D., adjunct > Polish Academy of Sciences > Institute of Geological Sciences > X-Ray Diffraction Laboratory (coordinator) > Twarda 51/55 str. > 00-818 Warsaw > Poland > > ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > Please do NOT attach files to the whole list <alan.he...@neutronoptics.com > > > Send commands to <lists...@ill.fr> eg: HELP as the subject with no body > text > The Rietveld_L list archive is on > http://www.mail-archive.com/rietveld_l@ill.fr/ > ++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++++ > > >
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